Compositional changes adjacent to grain boundaries during electrical degradation of a ZnO varistor

Compositional changes adjacent to grain boundaries in heavily degraded samples of a ZnO varistor containing the additives Bi and Co have been observed with the scanning transmission electron microscope. A marked asymmetry in the distribution of Bi and Co with respect to the physical location of the...

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Veröffentlicht in:	J. Appl. Phys.; (United States) 1982-03, Vol.53 (3), p.1765-1768
Hauptverfasser:	Chiang, Yet-Ming, Kingery, W. D., Levinson, Lionel M.
Format:	Artikel
Sprache:	eng
Schlagworte:	360602 - Other Materials- Structure & Phase Studies ALLOYS BISMUTH ADDITIONS BISMUTH ALLOYS CATIONS CHALCOGENIDES CHARGED PARTICLES COBALT ADDITIONS COBALT ALLOYS CRYSTAL STRUCTURE CURRENTS DIRECT CURRENT DISTRIBUTION ELECTRIC CURRENTS ELECTRIC FIELDS ELECTRICAL EQUIPMENT ELECTRON MICROSCOPY GRAIN BOUNDARIES IONS MATERIALS SCIENCE MICROSCOPY MICROSTRUCTURE OXIDES OXYGEN COMPOUNDS QUANTITY RATIO RESISTORS SCANNING ELECTRON MICROSCOPY SEMICONDUCTOR DEVICES SEMICONDUCTOR RESISTORS SPATIAL DISTRIBUTION TRANSMISSION ELECTRON MICROSCOPY ZINC COMPOUNDS ZINC OXIDES
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