A theoretical description of grain boundary electron scattering by an effective mean free path
A mathematical analysis based on the Mayadas-Shatzkes model indicates that we may define an “effective mean free path” in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films. Under this condition a Fuchs-Sondheimer function can be introduced to eva...
Gespeichert in:
Veröffentlicht in: | Thin solid films 1978-06, Vol.51 (3), p.311-317 |
---|---|
1. Verfasser: | |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 317 |
---|---|
container_issue | 3 |
container_start_page | 311 |
container_title | Thin solid films |
container_volume | 51 |
creator | Tellier, C.R. |
description | A mathematical analysis based on the Mayadas-Shatzkes model indicates that we may define an “effective mean free path” in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films. Under this condition a Fuchs-Sondheimer function can be introduced to evaluate the total film resistivity and its temperature coefficient in the presence of external surfaces. A possible extension to other theories derived from the Fuchs theory is mentioned. |
doi_str_mv | 10.1016/0040-6090(78)90293-6 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_23238228</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0040609078902936</els_id><sourcerecordid>23238228</sourcerecordid><originalsourceid>FETCH-LOGICAL-c401t-9289c7b983c7760ad4f0884eb2a03f963907a970e5ed76ba8def9c1f5117cd4e3</originalsourceid><addsrcrecordid>eNp9kMtKAzEUhoMoWKtv4CIr0cXoSTKdJBuhFG9QcKNbQyZz0kamMzVJC317p1Zcujoc_gv8HyGXDG4ZsOoOoISiAg3XUt1o4FoU1REZMSV1waVgx2T0ZzklZyl9AgDjXIzIx5TmJfYRc3C2pQ0mF8M6h76jvaeLaENH637TNTbuKLbochyk5GzOGEO3oPWO2o6i94MUtkhXOLw-ItK1zctzcuJtm_Di947J--PD2-y5mL8-vcym88KVwHKhudJO1loJJ2UFtik9KFVizS0IryuhQVotASfYyKq2qkGvHfMTxqRrShRjcnXoXcf-a4Mpm1VIDtvWdthvkuGCC8W5Gozlwehin1JEb9YxrIZxhoHZwzR7UmZPykhlfmCaaojdH2I4jNgGjCa5gJ3DJsRhuGn68H_BN-wdfEY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23238228</pqid></control><display><type>article</type><title>A theoretical description of grain boundary electron scattering by an effective mean free path</title><source>Elsevier ScienceDirect Journals</source><creator>Tellier, C.R.</creator><creatorcontrib>Tellier, C.R.</creatorcontrib><description>A mathematical analysis based on the Mayadas-Shatzkes model indicates that we may define an “effective mean free path” in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films. Under this condition a Fuchs-Sondheimer function can be introduced to evaluate the total film resistivity and its temperature coefficient in the presence of external surfaces. A possible extension to other theories derived from the Fuchs theory is mentioned.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/0040-6090(78)90293-6</identifier><language>eng</language><publisher>Elsevier B.V</publisher><ispartof>Thin solid films, 1978-06, Vol.51 (3), p.311-317</ispartof><rights>1978</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c401t-9289c7b983c7760ad4f0884eb2a03f963907a970e5ed76ba8def9c1f5117cd4e3</citedby><cites>FETCH-LOGICAL-c401t-9289c7b983c7760ad4f0884eb2a03f963907a970e5ed76ba8def9c1f5117cd4e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/0040-6090(78)90293-6$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,778,782,3539,27907,27908,45978</link.rule.ids></links><search><creatorcontrib>Tellier, C.R.</creatorcontrib><title>A theoretical description of grain boundary electron scattering by an effective mean free path</title><title>Thin solid films</title><description>A mathematical analysis based on the Mayadas-Shatzkes model indicates that we may define an “effective mean free path” in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films. Under this condition a Fuchs-Sondheimer function can be introduced to evaluate the total film resistivity and its temperature coefficient in the presence of external surfaces. A possible extension to other theories derived from the Fuchs theory is mentioned.</description><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1978</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKAzEUhoMoWKtv4CIr0cXoSTKdJBuhFG9QcKNbQyZz0kamMzVJC317p1Zcujoc_gv8HyGXDG4ZsOoOoISiAg3XUt1o4FoU1REZMSV1waVgx2T0ZzklZyl9AgDjXIzIx5TmJfYRc3C2pQ0mF8M6h76jvaeLaENH637TNTbuKLbochyk5GzOGEO3oPWO2o6i94MUtkhXOLw-ItK1zctzcuJtm_Di947J--PD2-y5mL8-vcym88KVwHKhudJO1loJJ2UFtik9KFVizS0IryuhQVotASfYyKq2qkGvHfMTxqRrShRjcnXoXcf-a4Mpm1VIDtvWdthvkuGCC8W5Gozlwehin1JEb9YxrIZxhoHZwzR7UmZPykhlfmCaaojdH2I4jNgGjCa5gJ3DJsRhuGn68H_BN-wdfEY</recordid><startdate>19780615</startdate><enddate>19780615</enddate><creator>Tellier, C.R.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19780615</creationdate><title>A theoretical description of grain boundary electron scattering by an effective mean free path</title><author>Tellier, C.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c401t-9289c7b983c7760ad4f0884eb2a03f963907a970e5ed76ba8def9c1f5117cd4e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1978</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tellier, C.R.</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tellier, C.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A theoretical description of grain boundary electron scattering by an effective mean free path</atitle><jtitle>Thin solid films</jtitle><date>1978-06-15</date><risdate>1978</risdate><volume>51</volume><issue>3</issue><spage>311</spage><epage>317</epage><pages>311-317</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><abstract>A mathematical analysis based on the Mayadas-Shatzkes model indicates that we may define an “effective mean free path” in order to describe electronic conduction in both thin polycrystalline and monocrystalline metallic films. Under this condition a Fuchs-Sondheimer function can be introduced to evaluate the total film resistivity and its temperature coefficient in the presence of external surfaces. A possible extension to other theories derived from the Fuchs theory is mentioned.</abstract><pub>Elsevier B.V</pub><doi>10.1016/0040-6090(78)90293-6</doi><tpages>7</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0040-6090 |
ispartof | Thin solid films, 1978-06, Vol.51 (3), p.311-317 |
issn | 0040-6090 1879-2731 |
language | eng |
recordid | cdi_proquest_miscellaneous_23238228 |
source | Elsevier ScienceDirect Journals |
title | A theoretical description of grain boundary electron scattering by an effective mean free path |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T02%3A24%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20theoretical%20description%20of%20grain%20boundary%20electron%20scattering%20by%20an%20effective%20mean%20free%20path&rft.jtitle=Thin%20solid%20films&rft.au=Tellier,%20C.R.&rft.date=1978-06-15&rft.volume=51&rft.issue=3&rft.spage=311&rft.epage=317&rft.pages=311-317&rft.issn=0040-6090&rft.eissn=1879-2731&rft_id=info:doi/10.1016/0040-6090(78)90293-6&rft_dat=%3Cproquest_cross%3E23238228%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=23238228&rft_id=info:pmid/&rft_els_id=0040609078902936&rfr_iscdi=true |