Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2

As an intensively studied electrode material for secondary batteries, TiS2 is known to exhibit high electrical conductivity without extrinsic doping. However, the origin of this high conductivity, either being a semimetal or a heavily self-doped semiconductor, has been debated for several decades. H...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:The journal of physical chemistry letters 2019-11, Vol.10 (22), p.6996-7001
Hauptverfasser: Wang, Han, Qiu, Zhizhan, Xia, Weiyi, Ming, Chen, Han, Yuyan, Cao, Liang, Lu, Jiong, Zhang, Peihong, Zhang, Shengbai, Xu, Hai, Sun, Yi-Yang
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 7001
container_issue 22
container_start_page 6996
container_title The journal of physical chemistry letters
container_volume 10
creator Wang, Han
Qiu, Zhizhan
Xia, Weiyi
Ming, Chen
Han, Yuyan
Cao, Liang
Lu, Jiong
Zhang, Peihong
Zhang, Shengbai
Xu, Hai
Sun, Yi-Yang
description As an intensively studied electrode material for secondary batteries, TiS2 is known to exhibit high electrical conductivity without extrinsic doping. However, the origin of this high conductivity, either being a semimetal or a heavily self-doped semiconductor, has been debated for several decades. Here, combining quasi-particle GW calculations, density functional theory (DFT) study on intrinsic defects, and scanning tunneling microscopy/spectroscopy (STM/STS) measurements, we conclude that stoichiometric TiS2 is a semiconductor with an indirect band gap of about 0.5 eV. The high conductivity of TiS2 is therefore caused by heavy self-doping. Our DFT results suggest that the dominant donor defect that is responsible for the self-doping under thermal equilibrium is Ti interstitial, which is corroborated by our STM/STS measurements.
doi_str_mv 10.1021/acs.jpclett.9b02710
format Article
fullrecord <record><control><sourceid>proquest_acs_j</sourceid><recordid>TN_cdi_proquest_miscellaneous_2309470601</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2309470601</sourcerecordid><originalsourceid>FETCH-LOGICAL-a228t-b0399fa6f29dceca7aa4747e971eee777d41f710bdf7fa6813350bfce8bf81543</originalsourceid><addsrcrecordid>eNpNkDFPwzAQhS0EEqXwC1g8sqS1nbS22VBVaKUKhgaJzXKcM3WVxiV2kPj3uKQD0707vXe6-xC6p2RCCaNTbcJkfzQNxDiRFWGckgs0orIQGadidvlPX6ObEPaEzCURfIQ-tnBwB4i6wb7Dp8b4tu5N9N0jLneAX3XsO8De4pX73OF1GzvXBmfwsgGTtEnJxRBx3y7-YNfi0m3ZLbqyuglwd65j9P68LBerbPP2sl48bTLNmIhZRXIprZ5bJmsDRnOtC15wkJwCAOe8LqhN71S15ckmaJ7PSGUNiMoKOivyMXoY9h47_9VDiOrggoGm0S34PiiWE1lwMic0WaeDNeFSe993bTpMUaJODNXfcGCozgzzX2KcaN4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2309470601</pqid></control><display><type>article</type><title>Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2</title><source>ACS Publications</source><creator>Wang, Han ; Qiu, Zhizhan ; Xia, Weiyi ; Ming, Chen ; Han, Yuyan ; Cao, Liang ; Lu, Jiong ; Zhang, Peihong ; Zhang, Shengbai ; Xu, Hai ; Sun, Yi-Yang</creator><creatorcontrib>Wang, Han ; Qiu, Zhizhan ; Xia, Weiyi ; Ming, Chen ; Han, Yuyan ; Cao, Liang ; Lu, Jiong ; Zhang, Peihong ; Zhang, Shengbai ; Xu, Hai ; Sun, Yi-Yang</creatorcontrib><description>As an intensively studied electrode material for secondary batteries, TiS2 is known to exhibit high electrical conductivity without extrinsic doping. However, the origin of this high conductivity, either being a semimetal or a heavily self-doped semiconductor, has been debated for several decades. Here, combining quasi-particle GW calculations, density functional theory (DFT) study on intrinsic defects, and scanning tunneling microscopy/spectroscopy (STM/STS) measurements, we conclude that stoichiometric TiS2 is a semiconductor with an indirect band gap of about 0.5 eV. The high conductivity of TiS2 is therefore caused by heavy self-doping. Our DFT results suggest that the dominant donor defect that is responsible for the self-doping under thermal equilibrium is Ti interstitial, which is corroborated by our STM/STS measurements.</description><identifier>ISSN: 1948-7185</identifier><identifier>EISSN: 1948-7185</identifier><identifier>DOI: 10.1021/acs.jpclett.9b02710</identifier><language>eng</language><publisher>American Chemical Society</publisher><ispartof>The journal of physical chemistry letters, 2019-11, Vol.10 (22), p.6996-7001</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0001-7453-7060 ; 0000-0002-3690-8235 ; 0000-0002-0356-2688</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.9b02710$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acs.jpclett.9b02710$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,776,780,27055,27903,27904,56716,56766</link.rule.ids></links><search><creatorcontrib>Wang, Han</creatorcontrib><creatorcontrib>Qiu, Zhizhan</creatorcontrib><creatorcontrib>Xia, Weiyi</creatorcontrib><creatorcontrib>Ming, Chen</creatorcontrib><creatorcontrib>Han, Yuyan</creatorcontrib><creatorcontrib>Cao, Liang</creatorcontrib><creatorcontrib>Lu, Jiong</creatorcontrib><creatorcontrib>Zhang, Peihong</creatorcontrib><creatorcontrib>Zhang, Shengbai</creatorcontrib><creatorcontrib>Xu, Hai</creatorcontrib><creatorcontrib>Sun, Yi-Yang</creatorcontrib><title>Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2</title><title>The journal of physical chemistry letters</title><addtitle>J. Phys. Chem. Lett</addtitle><description>As an intensively studied electrode material for secondary batteries, TiS2 is known to exhibit high electrical conductivity without extrinsic doping. However, the origin of this high conductivity, either being a semimetal or a heavily self-doped semiconductor, has been debated for several decades. Here, combining quasi-particle GW calculations, density functional theory (DFT) study on intrinsic defects, and scanning tunneling microscopy/spectroscopy (STM/STS) measurements, we conclude that stoichiometric TiS2 is a semiconductor with an indirect band gap of about 0.5 eV. The high conductivity of TiS2 is therefore caused by heavy self-doping. Our DFT results suggest that the dominant donor defect that is responsible for the self-doping under thermal equilibrium is Ti interstitial, which is corroborated by our STM/STS measurements.</description><issn>1948-7185</issn><issn>1948-7185</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNpNkDFPwzAQhS0EEqXwC1g8sqS1nbS22VBVaKUKhgaJzXKcM3WVxiV2kPj3uKQD0707vXe6-xC6p2RCCaNTbcJkfzQNxDiRFWGckgs0orIQGadidvlPX6ObEPaEzCURfIQ-tnBwB4i6wb7Dp8b4tu5N9N0jLneAX3XsO8De4pX73OF1GzvXBmfwsgGTtEnJxRBx3y7-YNfi0m3ZLbqyuglwd65j9P68LBerbPP2sl48bTLNmIhZRXIprZ5bJmsDRnOtC15wkJwCAOe8LqhN71S15ckmaJ7PSGUNiMoKOivyMXoY9h47_9VDiOrggoGm0S34PiiWE1lwMic0WaeDNeFSe993bTpMUaJODNXfcGCozgzzX2KcaN4</recordid><startdate>20191121</startdate><enddate>20191121</enddate><creator>Wang, Han</creator><creator>Qiu, Zhizhan</creator><creator>Xia, Weiyi</creator><creator>Ming, Chen</creator><creator>Han, Yuyan</creator><creator>Cao, Liang</creator><creator>Lu, Jiong</creator><creator>Zhang, Peihong</creator><creator>Zhang, Shengbai</creator><creator>Xu, Hai</creator><creator>Sun, Yi-Yang</creator><general>American Chemical Society</general><scope>7X8</scope><orcidid>https://orcid.org/0000-0001-7453-7060</orcidid><orcidid>https://orcid.org/0000-0002-3690-8235</orcidid><orcidid>https://orcid.org/0000-0002-0356-2688</orcidid></search><sort><creationdate>20191121</creationdate><title>Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2</title><author>Wang, Han ; Qiu, Zhizhan ; Xia, Weiyi ; Ming, Chen ; Han, Yuyan ; Cao, Liang ; Lu, Jiong ; Zhang, Peihong ; Zhang, Shengbai ; Xu, Hai ; Sun, Yi-Yang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a228t-b0399fa6f29dceca7aa4747e971eee777d41f710bdf7fa6813350bfce8bf81543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Han</creatorcontrib><creatorcontrib>Qiu, Zhizhan</creatorcontrib><creatorcontrib>Xia, Weiyi</creatorcontrib><creatorcontrib>Ming, Chen</creatorcontrib><creatorcontrib>Han, Yuyan</creatorcontrib><creatorcontrib>Cao, Liang</creatorcontrib><creatorcontrib>Lu, Jiong</creatorcontrib><creatorcontrib>Zhang, Peihong</creatorcontrib><creatorcontrib>Zhang, Shengbai</creatorcontrib><creatorcontrib>Xu, Hai</creatorcontrib><creatorcontrib>Sun, Yi-Yang</creatorcontrib><collection>MEDLINE - Academic</collection><jtitle>The journal of physical chemistry letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Han</au><au>Qiu, Zhizhan</au><au>Xia, Weiyi</au><au>Ming, Chen</au><au>Han, Yuyan</au><au>Cao, Liang</au><au>Lu, Jiong</au><au>Zhang, Peihong</au><au>Zhang, Shengbai</au><au>Xu, Hai</au><au>Sun, Yi-Yang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2</atitle><jtitle>The journal of physical chemistry letters</jtitle><addtitle>J. Phys. Chem. Lett</addtitle><date>2019-11-21</date><risdate>2019</risdate><volume>10</volume><issue>22</issue><spage>6996</spage><epage>7001</epage><pages>6996-7001</pages><issn>1948-7185</issn><eissn>1948-7185</eissn><abstract>As an intensively studied electrode material for secondary batteries, TiS2 is known to exhibit high electrical conductivity without extrinsic doping. However, the origin of this high conductivity, either being a semimetal or a heavily self-doped semiconductor, has been debated for several decades. Here, combining quasi-particle GW calculations, density functional theory (DFT) study on intrinsic defects, and scanning tunneling microscopy/spectroscopy (STM/STS) measurements, we conclude that stoichiometric TiS2 is a semiconductor with an indirect band gap of about 0.5 eV. The high conductivity of TiS2 is therefore caused by heavy self-doping. Our DFT results suggest that the dominant donor defect that is responsible for the self-doping under thermal equilibrium is Ti interstitial, which is corroborated by our STM/STS measurements.</abstract><pub>American Chemical Society</pub><doi>10.1021/acs.jpclett.9b02710</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-7453-7060</orcidid><orcidid>https://orcid.org/0000-0002-3690-8235</orcidid><orcidid>https://orcid.org/0000-0002-0356-2688</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 1948-7185
ispartof The journal of physical chemistry letters, 2019-11, Vol.10 (22), p.6996-7001
issn 1948-7185
1948-7185
language eng
recordid cdi_proquest_miscellaneous_2309470601
source ACS Publications
title Semimetal or Semiconductor: The Nature of High Intrinsic Electrical Conductivity in TiS2
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T08%3A22%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_acs_j&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Semimetal%20or%20Semiconductor:%20The%20Nature%20of%20High%20Intrinsic%20Electrical%20Conductivity%20in%20TiS2&rft.jtitle=The%20journal%20of%20physical%20chemistry%20letters&rft.au=Wang,%20Han&rft.date=2019-11-21&rft.volume=10&rft.issue=22&rft.spage=6996&rft.epage=7001&rft.pages=6996-7001&rft.issn=1948-7185&rft.eissn=1948-7185&rft_id=info:doi/10.1021/acs.jpclett.9b02710&rft_dat=%3Cproquest_acs_j%3E2309470601%3C/proquest_acs_j%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2309470601&rft_id=info:pmid/&rfr_iscdi=true