Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

The recent literature is reviewed. 927 refs.

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Veröffentlicht in:	Analytical chemistry (Washington) 1982-04, Vol.54 (5), p.293-322
Hauptverfasser:	Turner, Noel H, Colton, Richard J
Format:	Artikel
Sprache:	eng
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container_end_page	322
container_issue	5
container_start_page	293
container_title	Analytical chemistry (Washington)
container_volume	54
creator	Turner, Noel H Colton, Richard J
description	The recent literature is reviewed. 927 refs.
doi_str_mv	10.1021/ac00242a027
format	Article
fullrecord	<record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_23022544</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>23022544</sourcerecordid><originalsourceid>FETCH-LOGICAL-a349t-4c02f1efabb577a874818f5c1bf0ea6c9c7cdc4a202be90ad513d452b5357d53</originalsourceid><addsrcrecordid>eNp10E1Lw0AQBuBFFKzVk38gJz1odHaT7abearGtICq0eF0mm42m5sudBJp_b7QqHvQ0A_MwzLyMHXO44CD4JRoAEQoEoXbYgEsB_iiKxC4bAEDgCwWwzw6I1gCcAx8NWLNsXYrGelhi3lFGV97Gd9h59UvVVDa3pnFV6VH92ZCp6u7cm7TP1nn_DLFMPLKmKhN0nZf18wKJvlFhG9cdsr0Uc7JHX3XIVrOb1XTh3z3Mb6eTOx-DcNz4oQGRcptiHEulMFJhxKNUGh6nYHFkxkaZxIQoQMR2DJhIHiShFLEMpEpkMGQn27W1q95aS40uMjI2z7G0VUtaBCCEDMMenm2h6b8gZ1Ndu6zoz9cc9Eew-lewvfa3OqPGbn4oulc9UoGSevW41PMZXy6exvf6uvenW4-G9LpqXZ80_bn5HY6Cicw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23022544</pqid></control><display><type>article</type><title>Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry</title><source>American Chemical Society Journals</source><creator>Turner, Noel H ; Colton, Richard J</creator><creatorcontrib>Turner, Noel H ; Colton, Richard J</creatorcontrib><description>The recent literature is reviewed. 927 refs.</description><identifier>ISSN: 0003-2700</identifier><identifier>EISSN: 1520-6882</identifier><identifier>DOI: 10.1021/ac00242a027</identifier><language>eng</language><publisher>American Chemical Society</publisher><ispartof>Analytical chemistry (Washington), 1982-04, Vol.54 (5), p.293-322</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a349t-4c02f1efabb577a874818f5c1bf0ea6c9c7cdc4a202be90ad513d452b5357d53</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/ac00242a027$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/ac00242a027$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids></links><search><creatorcontrib>Turner, Noel H</creatorcontrib><creatorcontrib>Colton, Richard J</creatorcontrib><title>Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry</title><title>Analytical chemistry (Washington)</title><addtitle>Anal. Chem</addtitle><description>The recent literature is reviewed. 927 refs.</description><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1982</creationdate><recordtype>article</recordtype><recordid>eNp10E1Lw0AQBuBFFKzVk38gJz1odHaT7abearGtICq0eF0mm42m5sudBJp_b7QqHvQ0A_MwzLyMHXO44CD4JRoAEQoEoXbYgEsB_iiKxC4bAEDgCwWwzw6I1gCcAx8NWLNsXYrGelhi3lFGV97Gd9h59UvVVDa3pnFV6VH92ZCp6u7cm7TP1nn_DLFMPLKmKhN0nZf18wKJvlFhG9cdsr0Uc7JHX3XIVrOb1XTh3z3Mb6eTOx-DcNz4oQGRcptiHEulMFJhxKNUGh6nYHFkxkaZxIQoQMR2DJhIHiShFLEMpEpkMGQn27W1q95aS40uMjI2z7G0VUtaBCCEDMMenm2h6b8gZ1Ndu6zoz9cc9Eew-lewvfa3OqPGbn4oulc9UoGSevW41PMZXy6exvf6uvenW4-G9LpqXZ80_bn5HY6Cicw</recordid><startdate>19820401</startdate><enddate>19820401</enddate><creator>Turner, Noel H</creator><creator>Colton, Richard J</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>19820401</creationdate><title>Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry</title><author>Turner, Noel H ; Colton, Richard J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a349t-4c02f1efabb577a874818f5c1bf0ea6c9c7cdc4a202be90ad513d452b5357d53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1982</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Turner, Noel H</creatorcontrib><creatorcontrib>Colton, Richard J</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Analytical chemistry (Washington)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Turner, Noel H</au><au>Colton, Richard J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry</atitle><jtitle>Analytical chemistry (Washington)</jtitle><addtitle>Anal. Chem</addtitle><date>1982-04-01</date><risdate>1982</risdate><volume>54</volume><issue>5</issue><spage>293</spage><epage>322</epage><pages>293-322</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><abstract>The recent literature is reviewed. 927 refs.</abstract><pub>American Chemical Society</pub><doi>10.1021/ac00242a027</doi><tpages>30</tpages></addata></record>
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issn	0003-2700 1520-6882
language	eng
recordid	cdi_proquest_miscellaneous_23022544
source	American Chemical Society Journals
title	Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T04%3A44%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20analysis:%20x-ray%20photoelectron%20spectroscopy,%20Auger%20electron%20spectroscopy,%20and%20secondary%20ion%20mass%20spectrometry&rft.jtitle=Analytical%20chemistry%20(Washington)&rft.au=Turner,%20Noel%20H&rft.date=1982-04-01&rft.volume=54&rft.issue=5&rft.spage=293&rft.epage=322&rft.pages=293-322&rft.issn=0003-2700&rft.eissn=1520-6882&rft_id=info:doi/10.1021/ac00242a027&rft_dat=%3Cproquest_cross%3E23022544%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=23022544&rft_id=info:pmid/&rfr_iscdi=true