$Volume, index-of-refraction, and stress changes in electron-irradiated vitreous silica$

Volume, index-of-refraction, and stress changes in electron-irradiated vitreous silica

The volume, index-of-refraction, and stress changes induced in vitreous silica by irradiating with 18-keV electrons have been measured over the dose range from 2.5×1010 to 3×1012 rad. The volume and index measurements were performed using a new technique based on producing a spatial modulation of ir...

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Veröffentlicht in:	J. Appl. Phys.; (United States) 1977-01, Vol.48 (3), p.1131-1138
Hauptverfasser:	Dellin, T. A., Tichenor, D. A., Barsis, E. H.
Format:	Artikel
Sprache:	eng
Schlagworte:	360605 - Materials- Radiation Effects AMORPHOUS STATE BEAMS CHALCOGENIDES COMPACTING DOSE-RESPONSE RELATIONSHIPS ELECTRON BEAMS ENERGY RANGE IRRADIATION KEV RANGE KEV RANGE 10-100 LEPTON BEAMS MATERIALS SCIENCE MINERALS OPTICAL PROPERTIES OXIDES OXYGEN COMPOUNDS PARTICLE BEAMS PHYSICAL PROPERTIES PHYSICAL RADIATION EFFECTS RADIATION EFFECTS REFRACTIVITY SILICA SILICON COMPOUNDS SILICON OXIDES STRESS ANALYSIS STRESSES VOLUME
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