Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film
In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities (5.3 J/cm , 10.6 J/cm , and 15.9 J/cm ) an...
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| Veröffentlicht in: | Applied optics (2004) 2019-08, Vol.58 (22), p.6112-6117 |
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| container_title | Applied optics (2004) |
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| creator | Xu, Yixiang Lu, Yuangang Zuo, Yujie Xu, Feng Zuo, Dunwen |
| description | In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities (5.3 J/cm
, 10.6 J/cm
, and 15.9 J/cm
) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index (-5.48×10
m
/W) and third-order nonlinear susceptibility (1.97×10
esu) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime. |
| doi_str_mv | 10.1364/AO.58.006112 |
| format | Article |
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, 10.6 J/cm
, and 15.9 J/cm
) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index (-5.48×10
m
/W) and third-order nonlinear susceptibility (1.97×10
esu) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime.</description><identifier>ISSN: 1559-128X</identifier><identifier>EISSN: 2155-3165</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/AO.58.006112</identifier><identifier>PMID: 31503935</identifier><language>eng</language><publisher>United States: Optical Society of America</publisher><subject>Absorptivity ; Aluminum ; Photonics ; Refractivity ; Semiconductor materials ; Thin films ; Zinc oxide ; Zinc oxides</subject><ispartof>Applied optics (2004), 2019-08, Vol.58 (22), p.6112-6117</ispartof><rights>Copyright Optical Society of America Aug 1, 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-f4016233942d02afcb8f73599941e42ef29258e55ec4ed9187afb7703e59946d3</citedby><cites>FETCH-LOGICAL-c319t-f4016233942d02afcb8f73599941e42ef29258e55ec4ed9187afb7703e59946d3</cites><orcidid>0000-0002-8460-2396 ; 0000-0001-5977-0809</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,3244,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/31503935$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Xu, Yixiang</creatorcontrib><creatorcontrib>Lu, Yuangang</creatorcontrib><creatorcontrib>Zuo, Yujie</creatorcontrib><creatorcontrib>Xu, Feng</creatorcontrib><creatorcontrib>Zuo, Dunwen</creatorcontrib><title>Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film</title><title>Applied optics (2004)</title><addtitle>Appl Opt</addtitle><description>In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities (5.3 J/cm
, 10.6 J/cm
, and 15.9 J/cm
) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index (-5.48×10
m
/W) and third-order nonlinear susceptibility (1.97×10
esu) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime.</description><subject>Absorptivity</subject><subject>Aluminum</subject><subject>Photonics</subject><subject>Refractivity</subject><subject>Semiconductor materials</subject><subject>Thin films</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><issn>1559-128X</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNpd0EtLxDAQwPEgiq6Pm2cJePFg1zyb5rgsvkDYi4J4KWk7wUibrEkL6qc3uurBUybwYxj-CB1TMqe8FBeL1VxWc0JKStkWmjEqZcFpKbfRLI-6oKx63EP7Kb0QwqXQahftcSoJ11zOUPNUpNZ4PIBJU4QB_JhwsNgH3zsPJuIINpp2dMFj4ztsmhTi-vtrQ8Smnwbnp6Howho6_OF8i8Ob6wCPzy4T1w-HaMeaPsHRz3uAHq4u75c3xd3q-na5uCtaTvVYWEFoyTjXgnWEGds2lVVcaq0FBcHAMs1kBVJCK6DTtFLGNkoRDtmIsuMH6Gyzdx3D6wRprAeXWuh74yFMqWasqhQTiqhMT__RlzBFn6_LSgmeu7Iyq_ONamNIKXeo19ENJr7XlNRf7evFqpZVvWmf-cnP0qkZoPvDv7H5JwjWfj0</recordid><startdate>20190801</startdate><enddate>20190801</enddate><creator>Xu, Yixiang</creator><creator>Lu, Yuangang</creator><creator>Zuo, Yujie</creator><creator>Xu, Feng</creator><creator>Zuo, Dunwen</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-8460-2396</orcidid><orcidid>https://orcid.org/0000-0001-5977-0809</orcidid></search><sort><creationdate>20190801</creationdate><title>Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film</title><author>Xu, Yixiang ; Lu, Yuangang ; Zuo, Yujie ; Xu, Feng ; Zuo, Dunwen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-f4016233942d02afcb8f73599941e42ef29258e55ec4ed9187afb7703e59946d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Absorptivity</topic><topic>Aluminum</topic><topic>Photonics</topic><topic>Refractivity</topic><topic>Semiconductor materials</topic><topic>Thin films</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xu, Yixiang</creatorcontrib><creatorcontrib>Lu, Yuangang</creatorcontrib><creatorcontrib>Zuo, Yujie</creatorcontrib><creatorcontrib>Xu, Feng</creatorcontrib><creatorcontrib>Zuo, Dunwen</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xu, Yixiang</au><au>Lu, Yuangang</au><au>Zuo, Yujie</au><au>Xu, Feng</au><au>Zuo, Dunwen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>2019-08-01</date><risdate>2019</risdate><volume>58</volume><issue>22</issue><spage>6112</spage><epage>6117</epage><pages>6112-6117</pages><issn>1559-128X</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>In this paper, we investigate third-order nonlinearities in aluminum-doped zinc oxide (AZO) thin film by the Z-scan method at a wavelength of 1064 nm. We carried out experiments under different pulse widths (26 ns, 62 ns, and 101 ns) and energy densities (5.3 J/cm
, 10.6 J/cm
, and 15.9 J/cm
) and obtained the nonlinear absorption coefficient, nonlinear refractive index, and third-order nonlinear susceptibility of AZO thin film. The Z-scan results show that AZO thin film exhibits a larger nonlinear refractive index (-5.48×10
m
/W) and third-order nonlinear susceptibility (1.97×10
esu) than those of some other semiconductor materials at the wavelength of 1064 nm. This suggests that AZO thin film may be a very promising nonlinear medium for nonlinear photonics applications in the tens of nanoseconds regime.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>31503935</pmid><doi>10.1364/AO.58.006112</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-8460-2396</orcidid><orcidid>https://orcid.org/0000-0001-5977-0809</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1559-128X |
| ispartof | Applied optics (2004), 2019-08, Vol.58 (22), p.6112-6117 |
| issn | 1559-128X 2155-3165 1539-4522 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_2288724707 |
| source | Alma/SFX Local Collection; Optica Publishing Group Journals |
| subjects | Absorptivity Aluminum Photonics Refractivity Semiconductor materials Thin films Zinc oxide Zinc oxides |
| title | Z-scan measurements of nonlinear refraction and absorption for aluminum-doped zinc oxide thin film |
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