The optical properties of thin films of tantalum pentoxide and zirconium dioxide

The indices of refraction and absorption of thin films of tantalum pentoxide and zirconium dioxide have been determined in the wavelength range 250–2000 nm. These were obtained from the spectrophotometrically measured reflectance and transmittance of the films at normal incidence, using the method d...

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Veröffentlicht in:	Thin Solid Films, v. 30, no. 2, pp. 361-369 v. 30, no. 2, pp. 361-369, 1975-01, Vol.30 (2), p.361-369
Hauptverfasser:	Khawaja, E.E., Tomlin, S.G.
Format:	Artikel
Sprache:	eng
Schlagworte:	360204 > Materials > Ceramics, Cermets & Refractories > Physical Properties ABSORPTION AMORPHOUS STATE LIGHT TRANSMISSION N50130 > Metals, Ceramics, & Other Materials > Ceramics & Cermets > Properties, Structure & Phase Studies PHOTONS POLYCRYSTALS REFLECTIVITY REFRACTION ROUGHNESS SURFACE PROPERTIES TANTALUM OXIDES > OPTICAL PROPERTIES VALENCE VISIBLE RADIATION ZIRCONIUM > OPTICAL PROPERTIES
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