Semiconductor radiation detectors
Semiconductors were used to detect a wavelength region extending from the visible portion of the spectrum out to the thermal infrared. Detection processes were reviewed with a description of the operation of photoconductive, photovoltaic, and photoemissive devices. The detectors discussed include (1...
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| Veröffentlicht in: | Microelectronics and reliability 1974-01, Vol.13 (5), p.425-432 |
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| container_end_page | 432 |
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| container_issue | 5 |
| container_start_page | 425 |
| container_title | Microelectronics and reliability |
| container_volume | 13 |
| creator | Holeman, B.R. |
| description | Semiconductors were used to detect a wavelength region extending from the visible portion of the spectrum out to the thermal infrared. Detection processes were reviewed with a description of the operation of photoconductive, photovoltaic, and photoemissive devices. The detectors discussed include (1) visible and near infrared detectors with emphasis on silicon devices and on semiconductor photocathodes, (2) detectors for the thermal infrared with reference to lead sulphide, indium antimonide, cadmium-mercury telluride, and lead-tin telluride, and (3) a photon drag detector for broad band high power monitoring. |
| doi_str_mv | 10.1016/0026-2714(74)90468-5 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_22245290</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0026271474904685</els_id><sourcerecordid>22245290</sourcerecordid><originalsourceid>FETCH-LOGICAL-c335t-fec0d46238438ebfb4a88cabf1143241c228986ff422954b03a7356ddd5f73143</originalsourceid><addsrcrecordid>eNp9kEtLAzEUhYMoWKv_wEXdiC5G87iZZDaCFF9QcKGCu5BJbiDSTmoyFfz3nbHi0tWFy3cOfIeQU0avGGX1NaW8rrhicKHgsqFQ60rukQnTilcNsPd9MvlDDslRKR-UUkUZm5CzF1xFlzq_cX3Ks2x9tH1M3cxjj-OrHJODYJcFT37vlLzd373OH6vF88PT_HZROSFkXwV01EPNhQahsQ0tWK2dbQNjIDgwx7ludB0CcN5IaKmwSsjaey-DEgMzJee73nVOnxssvVnF4nC5tB2mTTGcc5C8oQMIO9DlVErGYNY5rmz-NoyacQ8zyppR1igwP3sYOcRudjEcJL4iZlNcxM6hj3kwNT7F_wu2Fnplng</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>22245290</pqid></control><display><type>article</type><title>Semiconductor radiation detectors</title><source>Elsevier ScienceDirect Journals</source><creator>Holeman, B.R.</creator><creatorcontrib>Holeman, B.R.</creatorcontrib><description>Semiconductors were used to detect a wavelength region extending from the visible portion of the spectrum out to the thermal infrared. Detection processes were reviewed with a description of the operation of photoconductive, photovoltaic, and photoemissive devices. The detectors discussed include (1) visible and near infrared detectors with emphasis on silicon devices and on semiconductor photocathodes, (2) detectors for the thermal infrared with reference to lead sulphide, indium antimonide, cadmium-mercury telluride, and lead-tin telluride, and (3) a photon drag detector for broad band high power monitoring.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/0026-2714(74)90468-5</identifier><language>eng</language><publisher>Elsevier Ltd</publisher><ispartof>Microelectronics and reliability, 1974-01, Vol.13 (5), p.425-432</ispartof><rights>1974</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c335t-fec0d46238438ebfb4a88cabf1143241c228986ff422954b03a7356ddd5f73143</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0026271474904685$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Holeman, B.R.</creatorcontrib><title>Semiconductor radiation detectors</title><title>Microelectronics and reliability</title><description>Semiconductors were used to detect a wavelength region extending from the visible portion of the spectrum out to the thermal infrared. Detection processes were reviewed with a description of the operation of photoconductive, photovoltaic, and photoemissive devices. The detectors discussed include (1) visible and near infrared detectors with emphasis on silicon devices and on semiconductor photocathodes, (2) detectors for the thermal infrared with reference to lead sulphide, indium antimonide, cadmium-mercury telluride, and lead-tin telluride, and (3) a photon drag detector for broad band high power monitoring.</description><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1974</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLAzEUhYMoWKv_wEXdiC5G87iZZDaCFF9QcKGCu5BJbiDSTmoyFfz3nbHi0tWFy3cOfIeQU0avGGX1NaW8rrhicKHgsqFQ60rukQnTilcNsPd9MvlDDslRKR-UUkUZm5CzF1xFlzq_cX3Ks2x9tH1M3cxjj-OrHJODYJcFT37vlLzd373OH6vF88PT_HZROSFkXwV01EPNhQahsQ0tWK2dbQNjIDgwx7ludB0CcN5IaKmwSsjaey-DEgMzJee73nVOnxssvVnF4nC5tB2mTTGcc5C8oQMIO9DlVErGYNY5rmz-NoyacQ8zyppR1igwP3sYOcRudjEcJL4iZlNcxM6hj3kwNT7F_wu2Fnplng</recordid><startdate>19740101</startdate><enddate>19740101</enddate><creator>Holeman, B.R.</creator><general>Elsevier Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>19740101</creationdate><title>Semiconductor radiation detectors</title><author>Holeman, B.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c335t-fec0d46238438ebfb4a88cabf1143241c228986ff422954b03a7356ddd5f73143</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1974</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Holeman, B.R.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Holeman, B.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Semiconductor radiation detectors</atitle><jtitle>Microelectronics and reliability</jtitle><date>1974-01-01</date><risdate>1974</risdate><volume>13</volume><issue>5</issue><spage>425</spage><epage>432</epage><pages>425-432</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><abstract>Semiconductors were used to detect a wavelength region extending from the visible portion of the spectrum out to the thermal infrared. Detection processes were reviewed with a description of the operation of photoconductive, photovoltaic, and photoemissive devices. The detectors discussed include (1) visible and near infrared detectors with emphasis on silicon devices and on semiconductor photocathodes, (2) detectors for the thermal infrared with reference to lead sulphide, indium antimonide, cadmium-mercury telluride, and lead-tin telluride, and (3) a photon drag detector for broad band high power monitoring.</abstract><pub>Elsevier Ltd</pub><doi>10.1016/0026-2714(74)90468-5</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0026-2714 |
| ispartof | Microelectronics and reliability, 1974-01, Vol.13 (5), p.425-432 |
| issn | 0026-2714 1872-941X |
| language | eng |
| recordid | cdi_proquest_miscellaneous_22245290 |
| source | Elsevier ScienceDirect Journals |
| title | Semiconductor radiation detectors |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T16%3A59%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Semiconductor%20radiation%20detectors&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Holeman,%20B.R.&rft.date=1974-01-01&rft.volume=13&rft.issue=5&rft.spage=425&rft.epage=432&rft.pages=425-432&rft.issn=0026-2714&rft.eissn=1872-941X&rft_id=info:doi/10.1016/0026-2714(74)90468-5&rft_dat=%3Cproquest_cross%3E22245290%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=22245290&rft_id=info:pmid/&rft_els_id=0026271474904685&rfr_iscdi=true |