Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment

The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved...

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Veröffentlicht in:Microscopy research and technique 2019-07, Vol.82 (7), p.1157-1164
Hauptverfasser: Üreyen Kaya, Bulem, Erik, Cevat Emre, Kiraz, Gülsen
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description The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p > .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p  .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p 
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Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p &gt; .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p &lt; .05). In both new and used instruments, PTUR and WOG have no difference in terms of Ra and RMS values. (p &gt; .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p &lt; .05). The use of PTUR and WOG instruments for removal of root canal filling in severely curved root canals affected the surface topography of the files. The NiTi composition of the WOG instruments was unaffected by the retreatment process. The new WaveOne Gold Primary files manufactured with a new thermal treatment called Gold treatment showed more topographic irregularities than ProTaper Universal Retreatment files. Surface roughness of both reciprocating and continuous rotary nickel‐titanium instruments was increased following root canal retreatment. 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Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p &gt; .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p &lt; .05). In both new and used instruments, PTUR and WOG have no difference in terms of Ra and RMS values. (p &gt; .05). 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consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p &gt; .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p &lt; .05). In both new and used instruments, PTUR and WOG have no difference in terms of Ra and RMS values. (p &gt; .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p &lt; .05). The use of PTUR and WOG instruments for removal of root canal filling in severely curved root canals affected the surface topography of the files. The NiTi composition of the WOG instruments was unaffected by the retreatment process. The new WaveOne Gold Primary files manufactured with a new thermal treatment called Gold treatment showed more topographic irregularities than ProTaper Universal Retreatment files. Surface roughness of both reciprocating and continuous rotary nickel‐titanium instruments was increased following root canal retreatment. The NiTi composition of the gold file was unaffected by the retreatment process.</abstract><cop>Hoboken, USA</cop><pub>John Wiley &amp; Sons, Inc</pub><pmid>30916441</pmid><doi>10.1002/jemt.23264</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-8295-4347</orcidid><orcidid>https://orcid.org/0000-0003-2706-1914</orcidid></addata></record>
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subjects Atomic force microscopy
Composition
Dental roots
Dentistry
Endodontics
energy dispersive X‐ray spectrophotometry
Gold
Intermetallic compounds
Mandible
Microscopy
Nickel
Nickel compounds
Nickel titanides
nickel‐titanium instruments
root canal retreatment
Root canals
Spectrophotometry
Surface roughness
Teeth
Titanium
Titanium compounds
Variance analysis
title Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment
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