Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment
The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved...
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description | The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p > .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p |
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The new WaveOne Gold Primary files manufactured with a new thermal treatment called Gold treatment showed more topographic irregularities than ProTaper Universal Retreatment files.
Surface roughness of both reciprocating and continuous rotary nickel‐titanium instruments was increased following root canal retreatment.
The NiTi composition of the gold file was unaffected by the retreatment process.</description><identifier>ISSN: 1059-910X</identifier><identifier>EISSN: 1097-0029</identifier><identifier>DOI: 10.1002/jemt.23264</identifier><identifier>PMID: 30916441</identifier><language>eng</language><publisher>Hoboken, USA: John Wiley & Sons, Inc</publisher><subject>Atomic force microscopy ; Composition ; Dental roots ; Dentistry ; Endodontics ; energy dispersive X‐ray spectrophotometry ; Gold ; Intermetallic compounds ; Mandible ; Microscopy ; Nickel ; Nickel compounds ; Nickel titanides ; nickel‐titanium instruments ; root canal retreatment ; Root canals ; Spectrophotometry ; Surface roughness ; Teeth ; Titanium ; Titanium compounds ; Variance analysis</subject><ispartof>Microscopy research and technique, 2019-07, Vol.82 (7), p.1157-1164</ispartof><rights>2019 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3574-893988e389ca73f8604d497776654ad778342d5c47a19baff12f845f38d51ebe3</citedby><cites>FETCH-LOGICAL-c3574-893988e389ca73f8604d497776654ad778342d5c47a19baff12f845f38d51ebe3</cites><orcidid>0000-0002-8295-4347 ; 0000-0003-2706-1914</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fjemt.23264$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fjemt.23264$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/30916441$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Üreyen Kaya, Bulem</creatorcontrib><creatorcontrib>Erik, Cevat Emre</creatorcontrib><creatorcontrib>Kiraz, Gülsen</creatorcontrib><title>Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment</title><title>Microscopy research and technique</title><addtitle>Microsc Res Tech</addtitle><description>The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p > .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p < .05). In both new and used instruments, PTUR and WOG have no difference in terms of Ra and RMS values. (p > .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p < .05). The use of PTUR and WOG instruments for removal of root canal filling in severely curved root canals affected the surface topography of the files. The NiTi composition of the WOG instruments was unaffected by the retreatment process.
The new WaveOne Gold Primary files manufactured with a new thermal treatment called Gold treatment showed more topographic irregularities than ProTaper Universal Retreatment files.
Surface roughness of both reciprocating and continuous rotary nickel‐titanium instruments was increased following root canal retreatment.
The NiTi composition of the gold file was unaffected by the retreatment process.</description><subject>Atomic force microscopy</subject><subject>Composition</subject><subject>Dental roots</subject><subject>Dentistry</subject><subject>Endodontics</subject><subject>energy dispersive X‐ray spectrophotometry</subject><subject>Gold</subject><subject>Intermetallic compounds</subject><subject>Mandible</subject><subject>Microscopy</subject><subject>Nickel</subject><subject>Nickel compounds</subject><subject>Nickel titanides</subject><subject>nickel‐titanium instruments</subject><subject>root canal retreatment</subject><subject>Root canals</subject><subject>Spectrophotometry</subject><subject>Surface roughness</subject><subject>Teeth</subject><subject>Titanium</subject><subject>Titanium compounds</subject><subject>Variance analysis</subject><issn>1059-910X</issn><issn>1097-0029</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp9kUFu1TAQhi1ERUthwwGQJTYIKcWO7dheVlVpQa3YFKm7yM8ZFz-SONgOVXYcoafhQJykTl9hwYKVR9Y3n2bmR-gVJUeUkPr9FoZ8VLO64U_QASVaVuVXP11roStNyfU-ep7SlhBKBeXP0D4jmjac0wP06ziHwVvsQrSASxVDsmFasBk7DCPEmwV3Pk0Qk_8B-Pr3z7toFlw-bI5h-hpKO-S48qZfkk84OBzB-ikGa7Ifbx5MNoylnsOccAzZFH709hv0RZd9NqOfB-zHlOM8wJhTGafvw-3aHUPI2K72os0RTF6JF2jPmT7By8f3EH35cHp1cl5dfD77eHJ8UVkmJK-UZlopYEpbI5lTDeEd11LKphHcdFIqxutOWC4N1RvjHK2d4sIx1QkKG2CH6O3OW9b5PkPK7eCThb43I5Rl2ppqJYRqtCjom3_QbZhjmbtQNa8ppVyQQr3bUeuhUwTXTtEP5SAtJe2aZrum2T6kWeDXj8p5M0D3F_0TXwHoDrj1PSz_UbWfTi-vdtJ7_zixxg</recordid><startdate>201907</startdate><enddate>201907</enddate><creator>Üreyen Kaya, Bulem</creator><creator>Erik, Cevat Emre</creator><creator>Kiraz, Gülsen</creator><general>John Wiley & Sons, Inc</general><general>Wiley Subscription Services, Inc</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QP</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7SS</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U7</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>JG9</scope><scope>JQ2</scope><scope>K9.</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>RC3</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-8295-4347</orcidid><orcidid>https://orcid.org/0000-0003-2706-1914</orcidid></search><sort><creationdate>201907</creationdate><title>Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment</title><author>Üreyen Kaya, Bulem ; Erik, Cevat Emre ; Kiraz, Gülsen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3574-893988e389ca73f8604d497776654ad778342d5c47a19baff12f845f38d51ebe3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Atomic force microscopy</topic><topic>Composition</topic><topic>Dental roots</topic><topic>Dentistry</topic><topic>Endodontics</topic><topic>energy dispersive X‐ray spectrophotometry</topic><topic>Gold</topic><topic>Intermetallic compounds</topic><topic>Mandible</topic><topic>Microscopy</topic><topic>Nickel</topic><topic>Nickel compounds</topic><topic>Nickel titanides</topic><topic>nickel‐titanium instruments</topic><topic>root canal retreatment</topic><topic>Root canals</topic><topic>Spectrophotometry</topic><topic>Surface roughness</topic><topic>Teeth</topic><topic>Titanium</topic><topic>Titanium compounds</topic><topic>Variance analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Üreyen Kaya, Bulem</creatorcontrib><creatorcontrib>Erik, Cevat Emre</creatorcontrib><creatorcontrib>Kiraz, Gülsen</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Calcium & Calcified Tissue Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Entomology Abstracts (Full archive)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Toxicology Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>Genetics Abstracts</collection><collection>MEDLINE - Academic</collection><jtitle>Microscopy research and technique</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Üreyen Kaya, Bulem</au><au>Erik, Cevat Emre</au><au>Kiraz, Gülsen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment</atitle><jtitle>Microscopy research and technique</jtitle><addtitle>Microsc Res Tech</addtitle><date>2019-07</date><risdate>2019</risdate><volume>82</volume><issue>7</issue><spage>1157</spage><epage>1164</epage><pages>1157-1164</pages><issn>1059-910X</issn><eissn>1097-0029</eissn><abstract>The aim was to examine the effect of retreatment process on the surface roughness and nickel titanium (NiTi) composition of ProTaper Universal Retreatment (PTUR; consists of 3 files; D1, D2, D3) and WaveOne Gold (WOG) (primary) instruments. Twenty extracted mandibular molar teeth with severe curved (30–40°) mesial roots were selected and divided into two groups (n = 10) based on the instrument used for the removal of the root canal filling. Before and after using the instruments in two canals, they were subjected to atomic force microscopy (AFM) and energy dispersive X‐ray spectrophotometry (EDX) analysis. The EDX analysis data and roughness average (Ra) and root mean square (RMS) values were analyzed statistically using a one‐way analysis of variance and post hoc Tukey's test at the 5% significant level. There was no significant difference between the new and used D1 and D2 PTUR and WOG instruments in terms of the Ni composition (p > .05). The Ti contents of the used D2 and D3 PTUR instruments were lower those of the new instruments (p < .05). In both new and used instruments, PTUR and WOG have no difference in terms of Ra and RMS values. (p > .05). The Ra and RMS values of the PTUR and WOG systems significantly increased after removal of the root canal filling (p < .05). The use of PTUR and WOG instruments for removal of root canal filling in severely curved root canals affected the surface topography of the files. The NiTi composition of the WOG instruments was unaffected by the retreatment process.
The new WaveOne Gold Primary files manufactured with a new thermal treatment called Gold treatment showed more topographic irregularities than ProTaper Universal Retreatment files.
Surface roughness of both reciprocating and continuous rotary nickel‐titanium instruments was increased following root canal retreatment.
The NiTi composition of the gold file was unaffected by the retreatment process.</abstract><cop>Hoboken, USA</cop><pub>John Wiley & Sons, Inc</pub><pmid>30916441</pmid><doi>10.1002/jemt.23264</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-8295-4347</orcidid><orcidid>https://orcid.org/0000-0003-2706-1914</orcidid></addata></record> |
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subjects | Atomic force microscopy Composition Dental roots Dentistry Endodontics energy dispersive X‐ray spectrophotometry Gold Intermetallic compounds Mandible Microscopy Nickel Nickel compounds Nickel titanides nickel‐titanium instruments root canal retreatment Root canals Spectrophotometry Surface roughness Teeth Titanium Titanium compounds Variance analysis |
title | Atomic force microscopy and energy dispersive X‐ray spectrophotometry analysis of reciprocating and continuous rotary nickel‐titanium instruments following root canal retreatment |
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