Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”

Printed electrolyte‐gated oxide electronics is an emerging electronic technology in the low voltage regime (≤1 V). Whereas in the past mainly dielectrics have been used for gating the transistors, many recent approaches employ the advantages of solution processable, solid polymer electrolytes, or io...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Weinheim) 2019-06, Vol.31 (26), p.e1806483-n/a
Hauptverfasser: Cadilha Marques, Gabriel, Weller, Dennis, Erozan, Ahmet Turan, Feng, Xiaowei, Tahoori, Mehdi, Aghassi‐Hagmann, Jasmin
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page n/a
container_issue 26
container_start_page e1806483
container_title Advanced materials (Weinheim)
container_volume 31
creator Cadilha Marques, Gabriel
Weller, Dennis
Erozan, Ahmet Turan
Feng, Xiaowei
Tahoori, Mehdi
Aghassi‐Hagmann, Jasmin
description Printed electrolyte‐gated oxide electronics is an emerging electronic technology in the low voltage regime (≤1 V). Whereas in the past mainly dielectrics have been used for gating the transistors, many recent approaches employ the advantages of solution processable, solid polymer electrolytes, or ion gels that provide high gate capacitances produced by a Helmholtz double layer, allowing for low‐voltage operation. Herein, with special focus on work performed at KIT recent advances in building electronic circuits based on indium oxide, n‐type electrolyte‐gated field‐effect transistors (EGFETs) are reviewed. When integrated into ring oscillator circuits a digital performance ranging from 250 Hz at 1 V up to 1 kHz is achieved. Sequential circuits such as memory cells are also demonstrated. More complex circuits are feasible but remain challenging also because of the high variability of the printed devices. However, the device inherent variability can be even exploited in security circuits such as physically unclonable functions (PUFs), which output a reliable and unique, device specific, digital response signal. As an overall advantage of the technology all the presented circuits can operate at very low supply voltages (0.6 V), which is crucial for low‐power printed electronics applications. Electrolyte‐gated field‐effect transistors (EGFETs) based on an indium oxide channel enable high‐performance applications with low‐voltage requirements in the printed electronics domain. Circuits consisting of EGFETs are able to already operate at supply voltages ≈0.6 V. Besides logic gates, EGFETs are used in memory as well as security circuits.
doi_str_mv 10.1002/adma.201806483
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2194585565</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2194585565</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4613-187a0442d764bddccad395b742139ca76a5aeae45947c34784ddb0ba8ddbbb2a3</originalsourceid><addsrcrecordid>eNqFkEtOwzAQhi0EgvLYskSR2LBJsR07sZdVH4AEKkKwYmE59hQFJXWxE6C7HoEDwOV6ElKVh8SG1Whmvvk1-hA6JLhLMKan2la6SzEROGUi2UAdwimJGZZ8E3WwTHgs28UO2g3hEWMsU5xuo50EC0kEJR10f-3dg4cQohuYOV9HbhotF-8j76ro2hfTGmw0LMHU3pXzGpaLtzO9ml1Brcu2G78WFqIBPBcGQlS7qF940xR1WC4-9tHWRJcBDr7qHrobDW_75_Hl-Oyi37uMDUtJEhORacwYtVnKcmuN0TaRPM8YJYk0Oks116CBcckyk7BMMGtznGvRljynOtlDJ-vcmXdPDYRaVUUwUJZ6Cq4JihLJuOA85S16_Ad9dI2ftt8pSlkqsaCCtVR3TRnvQvAwUTNfVNrPFcFqpV2ttKsf7e3B0Vdsk1dgf_Bvzy0g18BLUcL8nzjVG1z1fsM_AU50kmY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2246908284</pqid></control><display><type>article</type><title>Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Cadilha Marques, Gabriel ; Weller, Dennis ; Erozan, Ahmet Turan ; Feng, Xiaowei ; Tahoori, Mehdi ; Aghassi‐Hagmann, Jasmin</creator><creatorcontrib>Cadilha Marques, Gabriel ; Weller, Dennis ; Erozan, Ahmet Turan ; Feng, Xiaowei ; Tahoori, Mehdi ; Aghassi‐Hagmann, Jasmin</creatorcontrib><description>Printed electrolyte‐gated oxide electronics is an emerging electronic technology in the low voltage regime (≤1 V). Whereas in the past mainly dielectrics have been used for gating the transistors, many recent approaches employ the advantages of solution processable, solid polymer electrolytes, or ion gels that provide high gate capacitances produced by a Helmholtz double layer, allowing for low‐voltage operation. Herein, with special focus on work performed at KIT recent advances in building electronic circuits based on indium oxide, n‐type electrolyte‐gated field‐effect transistors (EGFETs) are reviewed. When integrated into ring oscillator circuits a digital performance ranging from 250 Hz at 1 V up to 1 kHz is achieved. Sequential circuits such as memory cells are also demonstrated. More complex circuits are feasible but remain challenging also because of the high variability of the printed devices. However, the device inherent variability can be even exploited in security circuits such as physically unclonable functions (PUFs), which output a reliable and unique, device specific, digital response signal. As an overall advantage of the technology all the presented circuits can operate at very low supply voltages (0.6 V), which is crucial for low‐power printed electronics applications. Electrolyte‐gated field‐effect transistors (EGFETs) based on an indium oxide channel enable high‐performance applications with low‐voltage requirements in the printed electronics domain. Circuits consisting of EGFETs are able to already operate at supply voltages ≈0.6 V. Besides logic gates, EGFETs are used in memory as well as security circuits.</description><identifier>ISSN: 0935-9648</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.201806483</identifier><identifier>PMID: 30891821</identifier><language>eng</language><publisher>Germany: Wiley Subscription Services, Inc</publisher><subject>Circuit reliability ; Circuits ; Computer memory ; Digital technology ; electrolyte gating ; Electrolytes ; Electrolytic cells ; Electronic circuits ; Electronics ; Gels ; Indium oxides ; Low voltage ; Materials science ; memory circuits ; Molten salt electrolytes ; oxide electronics ; printed electronics ; ring oscillators ; Semiconductor devices ; Solid electrolytes ; Transistors</subject><ispartof>Advanced materials (Weinheim), 2019-06, Vol.31 (26), p.e1806483-n/a</ispartof><rights>2019 The Authors. Published by WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><rights>2019 The Authors. Published by WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim.</rights><rights>2019 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4613-187a0442d764bddccad395b742139ca76a5aeae45947c34784ddb0ba8ddbbb2a3</citedby><cites>FETCH-LOGICAL-c4613-187a0442d764bddccad395b742139ca76a5aeae45947c34784ddb0ba8ddbbb2a3</cites><orcidid>0000-0003-0348-041X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadma.201806483$$EPDF$$P50$$Gwiley$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadma.201806483$$EHTML$$P50$$Gwiley$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/30891821$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Cadilha Marques, Gabriel</creatorcontrib><creatorcontrib>Weller, Dennis</creatorcontrib><creatorcontrib>Erozan, Ahmet Turan</creatorcontrib><creatorcontrib>Feng, Xiaowei</creatorcontrib><creatorcontrib>Tahoori, Mehdi</creatorcontrib><creatorcontrib>Aghassi‐Hagmann, Jasmin</creatorcontrib><title>Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”</title><title>Advanced materials (Weinheim)</title><addtitle>Adv Mater</addtitle><description>Printed electrolyte‐gated oxide electronics is an emerging electronic technology in the low voltage regime (≤1 V). Whereas in the past mainly dielectrics have been used for gating the transistors, many recent approaches employ the advantages of solution processable, solid polymer electrolytes, or ion gels that provide high gate capacitances produced by a Helmholtz double layer, allowing for low‐voltage operation. Herein, with special focus on work performed at KIT recent advances in building electronic circuits based on indium oxide, n‐type electrolyte‐gated field‐effect transistors (EGFETs) are reviewed. When integrated into ring oscillator circuits a digital performance ranging from 250 Hz at 1 V up to 1 kHz is achieved. Sequential circuits such as memory cells are also demonstrated. More complex circuits are feasible but remain challenging also because of the high variability of the printed devices. However, the device inherent variability can be even exploited in security circuits such as physically unclonable functions (PUFs), which output a reliable and unique, device specific, digital response signal. As an overall advantage of the technology all the presented circuits can operate at very low supply voltages (0.6 V), which is crucial for low‐power printed electronics applications. Electrolyte‐gated field‐effect transistors (EGFETs) based on an indium oxide channel enable high‐performance applications with low‐voltage requirements in the printed electronics domain. Circuits consisting of EGFETs are able to already operate at supply voltages ≈0.6 V. Besides logic gates, EGFETs are used in memory as well as security circuits.</description><subject>Circuit reliability</subject><subject>Circuits</subject><subject>Computer memory</subject><subject>Digital technology</subject><subject>electrolyte gating</subject><subject>Electrolytes</subject><subject>Electrolytic cells</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Gels</subject><subject>Indium oxides</subject><subject>Low voltage</subject><subject>Materials science</subject><subject>memory circuits</subject><subject>Molten salt electrolytes</subject><subject>oxide electronics</subject><subject>printed electronics</subject><subject>ring oscillators</subject><subject>Semiconductor devices</subject><subject>Solid electrolytes</subject><subject>Transistors</subject><issn>0935-9648</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><recordid>eNqFkEtOwzAQhi0EgvLYskSR2LBJsR07sZdVH4AEKkKwYmE59hQFJXWxE6C7HoEDwOV6ElKVh8SG1Whmvvk1-hA6JLhLMKan2la6SzEROGUi2UAdwimJGZZ8E3WwTHgs28UO2g3hEWMsU5xuo50EC0kEJR10f-3dg4cQohuYOV9HbhotF-8j76ro2hfTGmw0LMHU3pXzGpaLtzO9ml1Brcu2G78WFqIBPBcGQlS7qF940xR1WC4-9tHWRJcBDr7qHrobDW_75_Hl-Oyi37uMDUtJEhORacwYtVnKcmuN0TaRPM8YJYk0Oks116CBcckyk7BMMGtznGvRljynOtlDJ-vcmXdPDYRaVUUwUJZ6Cq4JihLJuOA85S16_Ad9dI2ftt8pSlkqsaCCtVR3TRnvQvAwUTNfVNrPFcFqpV2ttKsf7e3B0Vdsk1dgf_Bvzy0g18BLUcL8nzjVG1z1fsM_AU50kmY</recordid><startdate>20190601</startdate><enddate>20190601</enddate><creator>Cadilha Marques, Gabriel</creator><creator>Weller, Dennis</creator><creator>Erozan, Ahmet Turan</creator><creator>Feng, Xiaowei</creator><creator>Tahoori, Mehdi</creator><creator>Aghassi‐Hagmann, Jasmin</creator><general>Wiley Subscription Services, Inc</general><scope>24P</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-0348-041X</orcidid></search><sort><creationdate>20190601</creationdate><title>Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”</title><author>Cadilha Marques, Gabriel ; Weller, Dennis ; Erozan, Ahmet Turan ; Feng, Xiaowei ; Tahoori, Mehdi ; Aghassi‐Hagmann, Jasmin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4613-187a0442d764bddccad395b742139ca76a5aeae45947c34784ddb0ba8ddbbb2a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Circuit reliability</topic><topic>Circuits</topic><topic>Computer memory</topic><topic>Digital technology</topic><topic>electrolyte gating</topic><topic>Electrolytes</topic><topic>Electrolytic cells</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Gels</topic><topic>Indium oxides</topic><topic>Low voltage</topic><topic>Materials science</topic><topic>memory circuits</topic><topic>Molten salt electrolytes</topic><topic>oxide electronics</topic><topic>printed electronics</topic><topic>ring oscillators</topic><topic>Semiconductor devices</topic><topic>Solid electrolytes</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cadilha Marques, Gabriel</creatorcontrib><creatorcontrib>Weller, Dennis</creatorcontrib><creatorcontrib>Erozan, Ahmet Turan</creatorcontrib><creatorcontrib>Feng, Xiaowei</creatorcontrib><creatorcontrib>Tahoori, Mehdi</creatorcontrib><creatorcontrib>Aghassi‐Hagmann, Jasmin</creatorcontrib><collection>Wiley Online Library Open Access</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>MEDLINE - Academic</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cadilha Marques, Gabriel</au><au>Weller, Dennis</au><au>Erozan, Ahmet Turan</au><au>Feng, Xiaowei</au><au>Tahoori, Mehdi</au><au>Aghassi‐Hagmann, Jasmin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv Mater</addtitle><date>2019-06-01</date><risdate>2019</risdate><volume>31</volume><issue>26</issue><spage>e1806483</spage><epage>n/a</epage><pages>e1806483-n/a</pages><issn>0935-9648</issn><eissn>1521-4095</eissn><abstract>Printed electrolyte‐gated oxide electronics is an emerging electronic technology in the low voltage regime (≤1 V). Whereas in the past mainly dielectrics have been used for gating the transistors, many recent approaches employ the advantages of solution processable, solid polymer electrolytes, or ion gels that provide high gate capacitances produced by a Helmholtz double layer, allowing for low‐voltage operation. Herein, with special focus on work performed at KIT recent advances in building electronic circuits based on indium oxide, n‐type electrolyte‐gated field‐effect transistors (EGFETs) are reviewed. When integrated into ring oscillator circuits a digital performance ranging from 250 Hz at 1 V up to 1 kHz is achieved. Sequential circuits such as memory cells are also demonstrated. More complex circuits are feasible but remain challenging also because of the high variability of the printed devices. However, the device inherent variability can be even exploited in security circuits such as physically unclonable functions (PUFs), which output a reliable and unique, device specific, digital response signal. As an overall advantage of the technology all the presented circuits can operate at very low supply voltages (0.6 V), which is crucial for low‐power printed electronics applications. Electrolyte‐gated field‐effect transistors (EGFETs) based on an indium oxide channel enable high‐performance applications with low‐voltage requirements in the printed electronics domain. Circuits consisting of EGFETs are able to already operate at supply voltages ≈0.6 V. Besides logic gates, EGFETs are used in memory as well as security circuits.</abstract><cop>Germany</cop><pub>Wiley Subscription Services, Inc</pub><pmid>30891821</pmid><doi>10.1002/adma.201806483</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0003-0348-041X</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0935-9648
ispartof Advanced materials (Weinheim), 2019-06, Vol.31 (26), p.e1806483-n/a
issn 0935-9648
1521-4095
language eng
recordid cdi_proquest_miscellaneous_2194585565
source Wiley Online Library Journals Frontfile Complete
subjects Circuit reliability
Circuits
Computer memory
Digital technology
electrolyte gating
Electrolytes
Electrolytic cells
Electronic circuits
Electronics
Gels
Indium oxides
Low voltage
Materials science
memory circuits
Molten salt electrolytes
oxide electronics
printed electronics
ring oscillators
Semiconductor devices
Solid electrolytes
Transistors
title Progress Report on “From Printed Electrolyte‐Gated Metal‐Oxide Devices to Circuits”
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T00%3A03%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Progress%20Report%20on%20%E2%80%9CFrom%20Printed%20Electrolyte%E2%80%90Gated%20Metal%E2%80%90Oxide%20Devices%20to%20Circuits%E2%80%9D&rft.jtitle=Advanced%20materials%20(Weinheim)&rft.au=Cadilha%20Marques,%20Gabriel&rft.date=2019-06-01&rft.volume=31&rft.issue=26&rft.spage=e1806483&rft.epage=n/a&rft.pages=e1806483-n/a&rft.issn=0935-9648&rft.eissn=1521-4095&rft_id=info:doi/10.1002/adma.201806483&rft_dat=%3Cproquest_cross%3E2194585565%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2246908284&rft_id=info:pmid/30891821&rfr_iscdi=true