Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis

Electron microprobe trace element analysis is a significant challenge. Due to the low net intensity of peak measurements, the accuracy and precision of such analyses relies critically on background measurements, and on the accuracy of any pertinent peak interference corrections. A linear regression...

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Veröffentlicht in:	Microscopy and microanalysis 2019-02, Vol.25 (1), p.30-46
Hauptverfasser:	Allaz, Julien M., Williams, Michael L., Jercinovic, Michael J., Goemann, Karsten, Donovan, John
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy Automation Curvature Efficiency Electron microprobe Electron probe Electron probe microanalysis Electron probes Interference Interpolation Ionization Lead Mass spectrometry Mass spectroscopy Materials Science Applications Monazite Phosphates Polynomials Radiometric dating Rare earth elements Reference materials Regression analysis Scanning Scheelite Secondary ion mass spectrometry Silicates Spectroscopy Test procedures Thorium Trace elements Wavelength X-rays
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