Surface Recombination in Ultra-Fast Carrier Dynamics of Perovskite Oxide La0.7Sr0.3MnO3 Thin Films

Aspects of the optoelectronic performance of thin-film ferromagnetic materials are evaluated for application in ultrafast devices. Dynamics of photocarriers and their associated spin polarization are measured using transient reflectivity (TR) measurements in cross linear and circular polarization configurations for La0.7Sr0.3MnO3 films with a range of thicknesses. Three spin-related recombination mechanisms have been observed for thicker films (thickness of d ≥ 20 nm) at different time regimes (τ), which are attributed to the electron–phonon recombination (τ < 1 ps), phonon-assisted spin–lattice recombination (τ ∼ 100 ps), and thermal diffusion and radiative recombination (τ > 1 ns). Density functional theory (DFT+U) based first-principles calculations provide information about the nature of the optical transitions and their probabilities for the majority and the minority spin channels. These transitions are partly responsible for the aforementioned recombination mechanisms, identified through the comparison of linear and circular TR measurements. The same sets of measurements for thinner films (4.4 nm ≤ d < 20 nm) revealed an additional relaxation dynamic (τ ∼ 10 ps), which is attributed to the enhanced surface recombination of charge carriers. Our DFT+U calculations further corroborate this observation, indicating an increase in the surface density of states with decreasing film thickness which results in higher amplitude and smaller time constant for surface recombination as the film thickness decreases.