Adhesion of neural cells on silicon wafer with nano-topographic surface

The adherence and subsequent viability of central neural cells (substantia nigra) on silicon wafers with different surface roughness conditions were investigated. Various roughness conditions of the silicon wafer were achieved by etching at different times. The topography was evaluated by AFM. Prima...

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Veröffentlicht in:Applied surface science 2002-02, Vol.187 (3), p.313-318
Hauptverfasser: Fan, Y.W, Cui, F.Z, Chen, L.N, Zhai, Y, Xu, Q.Y, Lee, I-S
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Sprache:eng
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