Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer

Rare earth (RE) ions doped in Si-based materials, compatible with Si technology, are promising compounds with regards to optical communication and energy conversion. In this article, we show the emission properties of Nd-doped Si-rich Si oxynitride (Nd-SRSON) films, and their dependence on the dangl...

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Veröffentlicht in:	Nanotechnology 2019-01, Vol.30 (4), p.045702-045702
Hauptverfasser:	Liang, C-H, An, Y-T, Jin, W, Meng, D-C, Wang, D-P, Chen, C-A, Liu, K-Z, Kleyn, A W, Labbé, C, Cardin, J, Gourbilleau, F
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemical Sciences Computational Physics Condensed Matter Electromagnetism Engineering Sciences Material chemistry Materials Materials Science Micro and nanotechnologies Microelectronics neodymium non-resonant excitation Optics photoluminescence Photonic Physics rare earth Si-rich Si oxynitride thin film
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