An optical trapping system for particle probes in plasma diagnostics
We present one of the first experiments for optically trapping of single microparticles as probes for low temperature plasma diagnostics. Based on the dual laser beam, counter-propagating technique, SiO2 microparticles are optically trapped at very large distances in low-temperature, low-pressure rf...
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Veröffentlicht in: | Review of scientific instruments 2018-10, Vol.89 (10), p.103505-103505 |
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description | We present one of the first experiments for optically trapping of single microparticles as probes for low temperature plasma diagnostics. Based on the dual laser beam, counter-propagating technique, SiO2 microparticles are optically trapped at very large distances in low-temperature, low-pressure rf plasma. External forces on the particle are measured by means of the displacement of the probe particle in the trap. Measurements can be performed during plasma operation as well as without plasma. The paper focuses on the optical setup and the verification of the system and its principle. Three examples for the particle behavior in the trapping system are presented: First, we measured the neutral gas damping as a verification of the technique. Second, an experiment without a plasma studies the changing particle charge by UV light radiation, and third, by moving the probe particle in the vertical direction into the sheath or into the plasma bulk, respectively, the acting forces on the probe particle are measured. |
doi_str_mv | 10.1063/1.5051065 |
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Based on the dual laser beam, counter-propagating technique, SiO2 microparticles are optically trapped at very large distances in low-temperature, low-pressure rf plasma. External forces on the particle are measured by means of the displacement of the probe particle in the trap. Measurements can be performed during plasma operation as well as without plasma. The paper focuses on the optical setup and the verification of the system and its principle. Three examples for the particle behavior in the trapping system are presented: First, we measured the neutral gas damping as a verification of the technique. Second, an experiment without a plasma studies the changing particle charge by UV light radiation, and third, by moving the probe particle in the vertical direction into the sheath or into the plasma bulk, respectively, the acting forces on the probe particle are measured.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.5051065</identifier><identifier>PMID: 30399761</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>Damping ; External pressure ; Laser beams ; Microparticles ; Neutral gases ; Optical trapping ; Plasma diagnostics ; Scientific apparatus & instruments ; Sheaths ; Silicon dioxide ; Ultraviolet radiation</subject><ispartof>Review of scientific instruments, 2018-10, Vol.89 (10), p.103505-103505</ispartof><rights>Author(s)</rights><rights>2018 Author(s). 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Based on the dual laser beam, counter-propagating technique, SiO2 microparticles are optically trapped at very large distances in low-temperature, low-pressure rf plasma. External forces on the particle are measured by means of the displacement of the probe particle in the trap. Measurements can be performed during plasma operation as well as without plasma. The paper focuses on the optical setup and the verification of the system and its principle. Three examples for the particle behavior in the trapping system are presented: First, we measured the neutral gas damping as a verification of the technique. Second, an experiment without a plasma studies the changing particle charge by UV light radiation, and third, by moving the probe particle in the vertical direction into the sheath or into the plasma bulk, respectively, the acting forces on the probe particle are measured.</description><subject>Damping</subject><subject>External pressure</subject><subject>Laser beams</subject><subject>Microparticles</subject><subject>Neutral gases</subject><subject>Optical trapping</subject><subject>Plasma diagnostics</subject><subject>Scientific apparatus & instruments</subject><subject>Sheaths</subject><subject>Silicon dioxide</subject><subject>Ultraviolet radiation</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp90E9LwzAYBvAgipvTg19AAl5U6EyaJm2OY_6FgRc9l7dJOjLapibtYd_eSKcHD76XBN4fDy8PQpeULCkR7J4uOeHxx4_QnJJCJrlI2TGaE8KyRORZMUNnIexIHE7pKZoxwqTMBZ2jh1WHXT9YBQ0ePPS97bY47MNgWlw7j3vwcdkY3HtXmYBth_sGQgtYW9h2LsRtOEcnNTTBXBzeBfp4enxfvySbt-fX9WqTKJYVQyIrmvJacs2NqoXKM8bA6JpwICZjnGhVVYU0QnMOkioNFa2kYELqPEtBMbZAN1NuPOZzNGEoWxuUaRrojBtDmVJGCkJ5QSK9_kN3bvRdvC4qKuOIlEd1OynlXQje1GXvbQt-X1JSfldb0vJQbbRXh8Sxao3-lT9dRnA3gaDsAIN13T9pX6Oof9E</recordid><startdate>201810</startdate><enddate>201810</enddate><creator>Schneider, Viktor</creator><creator>Kersten, Holger</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-1798-7588</orcidid><orcidid>https://orcid.org/0000000317987588</orcidid></search><sort><creationdate>201810</creationdate><title>An optical trapping system for particle probes in plasma diagnostics</title><author>Schneider, Viktor ; Kersten, Holger</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c348t-9b125f95d5ecf6c7433aedf05a0e4350dcbb89e6d55a91cdab1b96369d742ac33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Damping</topic><topic>External pressure</topic><topic>Laser beams</topic><topic>Microparticles</topic><topic>Neutral gases</topic><topic>Optical trapping</topic><topic>Plasma diagnostics</topic><topic>Scientific apparatus & instruments</topic><topic>Sheaths</topic><topic>Silicon dioxide</topic><topic>Ultraviolet radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schneider, Viktor</creatorcontrib><creatorcontrib>Kersten, Holger</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schneider, Viktor</au><au>Kersten, Holger</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An optical trapping system for particle probes in plasma diagnostics</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2018-10</date><risdate>2018</risdate><volume>89</volume><issue>10</issue><spage>103505</spage><epage>103505</epage><pages>103505-103505</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>We present one of the first experiments for optically trapping of single microparticles as probes for low temperature plasma diagnostics. Based on the dual laser beam, counter-propagating technique, SiO2 microparticles are optically trapped at very large distances in low-temperature, low-pressure rf plasma. External forces on the particle are measured by means of the displacement of the probe particle in the trap. Measurements can be performed during plasma operation as well as without plasma. The paper focuses on the optical setup and the verification of the system and its principle. Three examples for the particle behavior in the trapping system are presented: First, we measured the neutral gas damping as a verification of the technique. 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subjects | Damping External pressure Laser beams Microparticles Neutral gases Optical trapping Plasma diagnostics Scientific apparatus & instruments Sheaths Silicon dioxide Ultraviolet radiation |
title | An optical trapping system for particle probes in plasma diagnostics |
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