$Quantification of crystallinity using zero‐loss filtered electron diffraction$

Quantification of crystallinity using zero‐loss filtered electron diffraction

The quantity of the crystalline phases present in a nanomaterial is an important parameter that governs the correlation between its properties and microstructure. However, quantification of crystallinity in nanoscale‐level applications by conventional methods (Raman spectroscopy and X‐ray diffractio...

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Veröffentlicht in:	Microscopy research and technique 2019-01, Vol.82 (1), p.39-46
Hauptverfasser:	An, Byeong‐Seon, Kwon, Yena, Cha, Hyun‐Woo, Kang, Min‐Chul, Oh, Jin‐Su, Yang, Cheol‐Woong
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphous silicon Crystal structure Crystallinity Degree of crystallinity Diffraction Electron diffraction Electrons Energy transmission energy‐filtered transmission electron microscopy Extreme values Histograms Information processing Mathematical analysis Nanomaterials Nanotechnology devices Raman spectroscopy selected area electron diffraction Silicon Spatial resolution Transmission electron microscopy X-ray diffraction
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