Photoluminescence Upconversion by Defects in Hexagonal Boron Nitride

Hexagonal boron nitride (h-BN) was recently reported to display single photon emission from ultraviolet to near-infrared range due to the existence of defects. Single photon emission has potential applications in quantum information processing and optoelectronics. These findings trigger increasing r...

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Veröffentlicht in:Nano letters 2018-11, Vol.18 (11), p.6898-6905
Hauptverfasser: Wang, Qixing, Zhang, Qi, Zhao, Xiaoxu, Luo, Xin, Wong, Calvin Pei Yu, Wang, Junyong, Wan, Dongyang, Venkatesan, T, Pennycook, Stephen J, Loh, Kian Ping, Eda, Goki, Wee, Andrew T. S
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container_end_page 6905
container_issue 11
container_start_page 6898
container_title Nano letters
container_volume 18
creator Wang, Qixing
Zhang, Qi
Zhao, Xiaoxu
Luo, Xin
Wong, Calvin Pei Yu
Wang, Junyong
Wan, Dongyang
Venkatesan, T
Pennycook, Stephen J
Loh, Kian Ping
Eda, Goki
Wee, Andrew T. S
description Hexagonal boron nitride (h-BN) was recently reported to display single photon emission from ultraviolet to near-infrared range due to the existence of defects. Single photon emission has potential applications in quantum information processing and optoelectronics. These findings trigger increasing research interests in h-BN defects, such as revealing the nature of the defects. Here, we report another intriguing defect property in h-BN, namely photoluminescence (PL) upconversion (anti-Stokes process). The energy gain by the PL upconversion is about 162 meV. The anomalous PL upconversion is attributed to optical phonon absorption in the one-photon excitation process, based on excitation power, excitation wavelength, and temperature-dependence investigations. Possible constitutions of the defects are discussed from the results of scanning transmission electron microscopy (STEM) studies and theoretical calculations. These findings show that defects in h-BN exhibit strong defect-phonon coupling. The results from STEM and theoretical calculations are beneficial for understanding the constitution of the h-BN defects.
doi_str_mv 10.1021/acs.nanolett.8b02804
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