Thermal stability of the layered modification of Cu0.5ZrTe2 in the temperature range 25–900 °C

The thermal stability of the layered modification of the Cu0.5ZrTe2 polycrystalline intercalation compound, synthesized at room temperature, has been studied in the temperature range 25–900 °C. A change in the occupation of the octahedral and tetrahedral coordinated sites in the interlayer space of...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Acta crystallographica. Section C, Crystal structure communications Crystal structure communications, 2018-09, Vol.74 (9), p.1020-1025
Hauptverfasser:	Shkvarina, E. G., Titov, A. A., Shkvarin, A. S., Plaisier, J. R., Gigli, L., Titov, A. N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Copper copper intercalation Crystal structure Diffraction Entropy GSAS Intercalation Intercalation compounds Interlayers layered modification polycrystalline compound powder diffraction synchrotron tellurium Temperature Thermal stability time resolved Zirconium
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!