Probing nanoscale forces with the atomic force microscope
Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.
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| Veröffentlicht in: | R & D : reading for the R & D community 1995-08, Vol.37 (9), p.63 |
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| container_issue | 9 |
| container_start_page | 63 |
| container_title | R & D : reading for the R & D community |
| container_volume | 37 |
| creator | Prater, Craig Maivald, Peter Kjoller, Kevin Heaton, Monteith |
| description | Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured. |
| format | Article |
| fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_205333520</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>6842238</sourcerecordid><originalsourceid>FETCH-LOGICAL-p117t-b44e4e0b368a247ba7d4ebc5eed80e6667ff7b697bb89388d4752da7f61bad6e3</originalsourceid><addsrcrecordid>eNotjMtqwzAQRbVooWnaf9CuK4OskTXSsoT0AYFmkayDHqPGxbEcS6G_30C6uofD4d6xhUClG9uifWCPpfwIIQEBF8xu5-z78ZuPbswluIF4ynOgwn_7euT1SNzVfOrDTfMrzdcuT_TE7pMbCj3_75Lt39a71Uez-Xr_XL1umqltsTZeKVIkPGjjpELvMCryoSOKRpDWGlNCry16bywYExV2MjpMuvUuaoIle7n9TnM-X6jUw6kvgYbBjZQv5SBFBwCdFPAHfBJEow</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>205333520</pqid></control><display><type>article</type><title>Probing nanoscale forces with the atomic force microscope</title><source>EBSCOhost Business Source Complete</source><creator>Prater, Craig ; Maivald, Peter ; Kjoller, Kevin ; Heaton, Monteith</creator><creatorcontrib>Prater, Craig ; Maivald, Peter ; Kjoller, Kevin ; Heaton, Monteith</creatorcontrib><description>Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.</description><identifier>ISSN: 0746-9179</identifier><identifier>CODEN: REDEEA</identifier><language>eng</language><publisher>Highlands Ranch: WTWH Media LLC</publisher><subject>Measuring instruments ; Microscopes ; Microscopy ; R&D ; Research & development ; Scientific imaging</subject><ispartof>R & D : reading for the R & D community, 1995-08, Vol.37 (9), p.63</ispartof><rights>Copyright Reed Business Information, a division of Reed Elsevier, Inc. Aug 1995</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>780,784</link.rule.ids></links><search><creatorcontrib>Prater, Craig</creatorcontrib><creatorcontrib>Maivald, Peter</creatorcontrib><creatorcontrib>Kjoller, Kevin</creatorcontrib><creatorcontrib>Heaton, Monteith</creatorcontrib><title>Probing nanoscale forces with the atomic force microscope</title><title>R & D : reading for the R & D community</title><description>Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.</description><subject>Measuring instruments</subject><subject>Microscopes</subject><subject>Microscopy</subject><subject>R&D</subject><subject>Research & development</subject><subject>Scientific imaging</subject><issn>0746-9179</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1995</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNotjMtqwzAQRbVooWnaf9CuK4OskTXSsoT0AYFmkayDHqPGxbEcS6G_30C6uofD4d6xhUClG9uifWCPpfwIIQEBF8xu5-z78ZuPbswluIF4ynOgwn_7euT1SNzVfOrDTfMrzdcuT_TE7pMbCj3_75Lt39a71Uez-Xr_XL1umqltsTZeKVIkPGjjpELvMCryoSOKRpDWGlNCry16bywYExV2MjpMuvUuaoIle7n9TnM-X6jUw6kvgYbBjZQv5SBFBwCdFPAHfBJEow</recordid><startdate>19950801</startdate><enddate>19950801</enddate><creator>Prater, Craig</creator><creator>Maivald, Peter</creator><creator>Kjoller, Kevin</creator><creator>Heaton, Monteith</creator><general>WTWH Media LLC</general><scope/></search><sort><creationdate>19950801</creationdate><title>Probing nanoscale forces with the atomic force microscope</title><author>Prater, Craig ; Maivald, Peter ; Kjoller, Kevin ; Heaton, Monteith</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p117t-b44e4e0b368a247ba7d4ebc5eed80e6667ff7b697bb89388d4752da7f61bad6e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Measuring instruments</topic><topic>Microscopes</topic><topic>Microscopy</topic><topic>R&D</topic><topic>Research & development</topic><topic>Scientific imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Prater, Craig</creatorcontrib><creatorcontrib>Maivald, Peter</creatorcontrib><creatorcontrib>Kjoller, Kevin</creatorcontrib><creatorcontrib>Heaton, Monteith</creatorcontrib><jtitle>R & D : reading for the R & D community</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prater, Craig</au><au>Maivald, Peter</au><au>Kjoller, Kevin</au><au>Heaton, Monteith</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Probing nanoscale forces with the atomic force microscope</atitle><jtitle>R & D : reading for the R & D community</jtitle><date>1995-08-01</date><risdate>1995</risdate><volume>37</volume><issue>9</issue><spage>63</spage><pages>63-</pages><issn>0746-9179</issn><coden>REDEEA</coden><abstract>Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.</abstract><cop>Highlands Ranch</cop><pub>WTWH Media LLC</pub></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0746-9179 |
| ispartof | R & D : reading for the R & D community, 1995-08, Vol.37 (9), p.63 |
| issn | 0746-9179 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_205333520 |
| source | EBSCOhost Business Source Complete |
| subjects | Measuring instruments Microscopes Microscopy R&D Research & development Scientific imaging |
| title | Probing nanoscale forces with the atomic force microscope |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T10%3A24%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Probing%20nanoscale%20forces%20with%20the%20atomic%20force%20microscope&rft.jtitle=R%20&%20D%20:%20reading%20for%20the%20R%20&%20D%20community&rft.au=Prater,%20Craig&rft.date=1995-08-01&rft.volume=37&rft.issue=9&rft.spage=63&rft.pages=63-&rft.issn=0746-9179&rft.coden=REDEEA&rft_id=info:doi/&rft_dat=%3Cproquest%3E6842238%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=205333520&rft_id=info:pmid/&rfr_iscdi=true |