Probing nanoscale forces with the atomic force microscope

Probing nanoscale forces with the atomic force microscope

Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.

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Bibliographische Detailangaben
Veröffentlicht in:R & D : reading for the R & D community 1995-08, Vol.37 (9), p.63
Hauptverfasser: Prater, Craig, Maivald, Peter, Kjoller, Kevin, Heaton, Monteith
Format: Artikel
Sprache:eng
Schlagworte:
Measuring instruments
Microscopes
Microscopy
R&D
Research & development
Scientific imaging
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Beschreibung
Zusammenfassung:Atomic force microscopy allows one to measure forces on the probe tip as it approaches and retracts from a surface. AFM is being used to study a variety of polymers, organic films, metals, thin films, semiconductors and insulators. many biological processes can also be measured.
ISSN:0746-9179