Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was imp...

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Veröffentlicht in:Optics letters 2018-05, Vol.43 (9), p.2110-2113
Hauptverfasser: Graves, Logan R, Choi, Heejoo, Zhao, Wenchuan, Oh, Chang Jin, Su, Peng, Su, Tianquan, Kim, Dae Wook
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Data processing
Interferometry
Iterative methods
Reconstruction
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container_end_page 2113
container_issue 9
container_start_page 2110
container_title Optics letters
container_volume 43
creator Graves, Logan R
Choi, Heejoo
Zhao, Wenchuan
Oh, Chang Jin
Su, Peng
Su, Tianquan
Kim, Dae Wook
description We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.
doi_str_mv 10.1364/OL.43.002110
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subjects Data processing
Interferometry
Iterative methods
Reconstruction
title Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique
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