Time-resolved retardance and optic-axis angle measurement system for characterization of flexoelectro-optic liquid crystal and other birefringent devices

A new polarimeter is presented which gives time-resolved measurements of both the optic-axis angle and the linear phase retardation for modulated birefringent optical devices. It is suitable for characterizing dynamic waveplate devices based on liquid crystal and other materials. It is fully automat...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Optics express 2018-03, Vol.26 (5), p.6126-6142
Hauptverfasser:	Fells, Julian A J, Elston, Steve J, Booth, Martin J, Morris, Stephen M
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!