Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems

Insulator-based dielectrophoresis (iDEP) is a microfluidic technique used for particle analysis in a wide array of applications. Significant efforts are dedicated to improve iDEP systems by reducing voltage requirements. This study assesses how the performance of an iDEP system, in terms of particle...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Analytical chemistry (Washington) 2018-04, Vol.90 (7), p.4310-4315
Hauptverfasser: Perez-Gonzalez, Victor H, Gallo-Villanueva, Roberto C, Cardenas-Benitez, Braulio, Martinez-Chapa, Sergio O, Lapizco-Encinas, Blanca H
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 4315
container_issue 7
container_start_page 4310
container_title Analytical chemistry (Washington)
container_volume 90
creator Perez-Gonzalez, Victor H
Gallo-Villanueva, Roberto C
Cardenas-Benitez, Braulio
Martinez-Chapa, Sergio O
Lapizco-Encinas, Blanca H
description Insulator-based dielectrophoresis (iDEP) is a microfluidic technique used for particle analysis in a wide array of applications. Significant efforts are dedicated to improve iDEP systems by reducing voltage requirements. This study assesses how the performance of an iDEP system, in terms of particle trapping, depends on the number of insulating obstacles longitudinally present in the microchannel. In analogy with Kirchhoff’s loop rule, iDEP systems were analyzed as a series combination of electrical resistances, where the equivalent resistance of the post array is composed by a number of individual resistors (columns of insulating posts). It was predicted by the COMSOL model, and later confirmed by experimental results, that reducing the number of columns of insulating posts significantly affects the electric field distribution, decreasing the required voltage to dielectrophoretically trap particles within the post array. As an application, it was demonstrated that decreasing the number of columns in the post array allows for the dielectrophoretic trapping of nanometer-scale particles at voltages well below those reported in previous similar iDEP systems. These findings illustrate how the iDEP channel configuration can be customized for specific applications.
doi_str_mv 10.1021/acs.analchem.8b00139
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2013104152</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2104171129</sourcerecordid><originalsourceid>FETCH-LOGICAL-a328t-2fa57d78dedb1c13cf54f1b65a3048a325fccb2e607ca954bde1ab64a76dc2643</originalsourceid><addsrcrecordid>eNp9kUtPwzAQhC0EoqXwDxCKxIVLytp59ljKU6oEooVrtHE2baokDnZy6L_HUR8HDpwsrb-Z1c4wds1hzEHwe5RmjDWWck3VOE4BuDc5YUMeCHDDOBanbAgAnisigAG7MGZjEQ48PGcDMQlELAQMWbooqqYkZ9o0WqFcO61yPinrZFGvnA_UbSHt71Jj0_STb1W2uCKnqJ232nQltkq7D2gocx4LKkm2WjVrpcnqnMXWtFSZS3aWY2noav-O2Nfz03L26s7fX95m07mLnohbV-QYRFkUZ5SlXHJP5oGf8zQM0AM_tkyQS5kKCiGSOAn8NCOOaehjFGZShL43Ync7X3vJT0emTarCSCpLrEl1JhE2IQ6-Dciit3_Qjeq0DdNSPRJxLiaW8neU1MoYTXnS6KJCvU04JH0Hie0gOXSQ7Duwspu9eZdWlB1Fh9AtADuglx8X_-v5C6xrls0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2104171129</pqid></control><display><type>article</type><title>Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems</title><source>ACS Publications</source><creator>Perez-Gonzalez, Victor H ; Gallo-Villanueva, Roberto C ; Cardenas-Benitez, Braulio ; Martinez-Chapa, Sergio O ; Lapizco-Encinas, Blanca H</creator><creatorcontrib>Perez-Gonzalez, Victor H ; Gallo-Villanueva, Roberto C ; Cardenas-Benitez, Braulio ; Martinez-Chapa, Sergio O ; Lapizco-Encinas, Blanca H</creatorcontrib><description>Insulator-based dielectrophoresis (iDEP) is a microfluidic technique used for particle analysis in a wide array of applications. Significant efforts are dedicated to improve iDEP systems by reducing voltage requirements. This study assesses how the performance of an iDEP system, in terms of particle trapping, depends on the number of insulating obstacles longitudinally present in the microchannel. In analogy with Kirchhoff’s loop rule, iDEP systems were analyzed as a series combination of electrical resistances, where the equivalent resistance of the post array is composed by a number of individual resistors (columns of insulating posts). It was predicted by the COMSOL model, and later confirmed by experimental results, that reducing the number of columns of insulating posts significantly affects the electric field distribution, decreasing the required voltage to dielectrophoretically trap particles within the post array. As an application, it was demonstrated that decreasing the number of columns in the post array allows for the dielectrophoretic trapping of nanometer-scale particles at voltages well below those reported in previous similar iDEP systems. These findings illustrate how the iDEP channel configuration can be customized for specific applications.</description><identifier>ISSN: 0003-2700</identifier><identifier>EISSN: 1520-6882</identifier><identifier>DOI: 10.1021/acs.analchem.8b00139</identifier><identifier>PMID: 29528220</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><subject>Arrays ; Chemistry ; Dielectrophoresis ; Distribution ; Electric fields ; Electric potential ; Electric power distribution ; Electric resistance ; Microchannels ; Resistors ; Trapping</subject><ispartof>Analytical chemistry (Washington), 2018-04, Vol.90 (7), p.4310-4315</ispartof><rights>Copyright American Chemical Society Apr 3, 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a328t-2fa57d78dedb1c13cf54f1b65a3048a325fccb2e607ca954bde1ab64a76dc2643</citedby><cites>FETCH-LOGICAL-a328t-2fa57d78dedb1c13cf54f1b65a3048a325fccb2e607ca954bde1ab64a76dc2643</cites><orcidid>0000-0001-6283-8210</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acs.analchem.8b00139$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acs.analchem.8b00139$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,776,780,2752,27053,27901,27902,56713,56763</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/29528220$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Perez-Gonzalez, Victor H</creatorcontrib><creatorcontrib>Gallo-Villanueva, Roberto C</creatorcontrib><creatorcontrib>Cardenas-Benitez, Braulio</creatorcontrib><creatorcontrib>Martinez-Chapa, Sergio O</creatorcontrib><creatorcontrib>Lapizco-Encinas, Blanca H</creatorcontrib><title>Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems</title><title>Analytical chemistry (Washington)</title><addtitle>Anal. Chem</addtitle><description>Insulator-based dielectrophoresis (iDEP) is a microfluidic technique used for particle analysis in a wide array of applications. Significant efforts are dedicated to improve iDEP systems by reducing voltage requirements. This study assesses how the performance of an iDEP system, in terms of particle trapping, depends on the number of insulating obstacles longitudinally present in the microchannel. In analogy with Kirchhoff’s loop rule, iDEP systems were analyzed as a series combination of electrical resistances, where the equivalent resistance of the post array is composed by a number of individual resistors (columns of insulating posts). It was predicted by the COMSOL model, and later confirmed by experimental results, that reducing the number of columns of insulating posts significantly affects the electric field distribution, decreasing the required voltage to dielectrophoretically trap particles within the post array. As an application, it was demonstrated that decreasing the number of columns in the post array allows for the dielectrophoretic trapping of nanometer-scale particles at voltages well below those reported in previous similar iDEP systems. These findings illustrate how the iDEP channel configuration can be customized for specific applications.</description><subject>Arrays</subject><subject>Chemistry</subject><subject>Dielectrophoresis</subject><subject>Distribution</subject><subject>Electric fields</subject><subject>Electric potential</subject><subject>Electric power distribution</subject><subject>Electric resistance</subject><subject>Microchannels</subject><subject>Resistors</subject><subject>Trapping</subject><issn>0003-2700</issn><issn>1520-6882</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp9kUtPwzAQhC0EoqXwDxCKxIVLytp59ljKU6oEooVrtHE2baokDnZy6L_HUR8HDpwsrb-Z1c4wds1hzEHwe5RmjDWWck3VOE4BuDc5YUMeCHDDOBanbAgAnisigAG7MGZjEQ48PGcDMQlELAQMWbooqqYkZ9o0WqFcO61yPinrZFGvnA_UbSHt71Jj0_STb1W2uCKnqJ232nQltkq7D2gocx4LKkm2WjVrpcnqnMXWtFSZS3aWY2noav-O2Nfz03L26s7fX95m07mLnohbV-QYRFkUZ5SlXHJP5oGf8zQM0AM_tkyQS5kKCiGSOAn8NCOOaehjFGZShL43Ync7X3vJT0emTarCSCpLrEl1JhE2IQ6-Dciit3_Qjeq0DdNSPRJxLiaW8neU1MoYTXnS6KJCvU04JH0Hie0gOXSQ7Duwspu9eZdWlB1Fh9AtADuglx8X_-v5C6xrls0</recordid><startdate>20180403</startdate><enddate>20180403</enddate><creator>Perez-Gonzalez, Victor H</creator><creator>Gallo-Villanueva, Roberto C</creator><creator>Cardenas-Benitez, Braulio</creator><creator>Martinez-Chapa, Sergio O</creator><creator>Lapizco-Encinas, Blanca H</creator><general>American Chemical Society</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7TM</scope><scope>7U5</scope><scope>7U7</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0001-6283-8210</orcidid></search><sort><creationdate>20180403</creationdate><title>Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems</title><author>Perez-Gonzalez, Victor H ; Gallo-Villanueva, Roberto C ; Cardenas-Benitez, Braulio ; Martinez-Chapa, Sergio O ; Lapizco-Encinas, Blanca H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a328t-2fa57d78dedb1c13cf54f1b65a3048a325fccb2e607ca954bde1ab64a76dc2643</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Arrays</topic><topic>Chemistry</topic><topic>Dielectrophoresis</topic><topic>Distribution</topic><topic>Electric fields</topic><topic>Electric potential</topic><topic>Electric power distribution</topic><topic>Electric resistance</topic><topic>Microchannels</topic><topic>Resistors</topic><topic>Trapping</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Perez-Gonzalez, Victor H</creatorcontrib><creatorcontrib>Gallo-Villanueva, Roberto C</creatorcontrib><creatorcontrib>Cardenas-Benitez, Braulio</creatorcontrib><creatorcontrib>Martinez-Chapa, Sergio O</creatorcontrib><creatorcontrib>Lapizco-Encinas, Blanca H</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Nucleic Acids Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Toxicology Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>MEDLINE - Academic</collection><jtitle>Analytical chemistry (Washington)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Perez-Gonzalez, Victor H</au><au>Gallo-Villanueva, Roberto C</au><au>Cardenas-Benitez, Braulio</au><au>Martinez-Chapa, Sergio O</au><au>Lapizco-Encinas, Blanca H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems</atitle><jtitle>Analytical chemistry (Washington)</jtitle><addtitle>Anal. Chem</addtitle><date>2018-04-03</date><risdate>2018</risdate><volume>90</volume><issue>7</issue><spage>4310</spage><epage>4315</epage><pages>4310-4315</pages><issn>0003-2700</issn><eissn>1520-6882</eissn><abstract>Insulator-based dielectrophoresis (iDEP) is a microfluidic technique used for particle analysis in a wide array of applications. Significant efforts are dedicated to improve iDEP systems by reducing voltage requirements. This study assesses how the performance of an iDEP system, in terms of particle trapping, depends on the number of insulating obstacles longitudinally present in the microchannel. In analogy with Kirchhoff’s loop rule, iDEP systems were analyzed as a series combination of electrical resistances, where the equivalent resistance of the post array is composed by a number of individual resistors (columns of insulating posts). It was predicted by the COMSOL model, and later confirmed by experimental results, that reducing the number of columns of insulating posts significantly affects the electric field distribution, decreasing the required voltage to dielectrophoretically trap particles within the post array. As an application, it was demonstrated that decreasing the number of columns in the post array allows for the dielectrophoretic trapping of nanometer-scale particles at voltages well below those reported in previous similar iDEP systems. These findings illustrate how the iDEP channel configuration can be customized for specific applications.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>29528220</pmid><doi>10.1021/acs.analchem.8b00139</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-6283-8210</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0003-2700
ispartof Analytical chemistry (Washington), 2018-04, Vol.90 (7), p.4310-4315
issn 0003-2700
1520-6882
language eng
recordid cdi_proquest_miscellaneous_2013104152
source ACS Publications
subjects Arrays
Chemistry
Dielectrophoresis
Distribution
Electric fields
Electric potential
Electric power distribution
Electric resistance
Microchannels
Resistors
Trapping
title Simple Approach to Reducing Particle Trapping Voltage in Insulator-Based Dielectrophoretic Systems
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T17%3A19%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Simple%20Approach%20to%20Reducing%20Particle%20Trapping%20Voltage%20in%20Insulator-Based%20Dielectrophoretic%20Systems&rft.jtitle=Analytical%20chemistry%20(Washington)&rft.au=Perez-Gonzalez,%20Victor%20H&rft.date=2018-04-03&rft.volume=90&rft.issue=7&rft.spage=4310&rft.epage=4315&rft.pages=4310-4315&rft.issn=0003-2700&rft.eissn=1520-6882&rft_id=info:doi/10.1021/acs.analchem.8b00139&rft_dat=%3Cproquest_cross%3E2104171129%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2104171129&rft_id=info:pmid/29528220&rfr_iscdi=true