2D GeP: An Unexploited Low‐Symmetry Semiconductor with Strong In‐Plane Anisotropy
Germanium phosphide (GeP), a new member of the Group IV–Group V compounds, is introduced into the fast growing 2D family with experimental and theoretical demonstration of strong anisotropic physical properties. The indirect band gap of GeP can be drastically tuned from 1.68 eV for monolayer to 0.51...
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Veröffentlicht in: | Advanced materials (Weinheim) 2018-04, Vol.30 (14), p.e1706771-n/a |
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description | Germanium phosphide (GeP), a new member of the Group IV–Group V compounds, is introduced into the fast growing 2D family with experimental and theoretical demonstration of strong anisotropic physical properties. The indirect band gap of GeP can be drastically tuned from 1.68 eV for monolayer to 0.51 eV for bulk, with highly anisotropic dispersions of band structures. Thin GeP shows strong anisotropy of phonon vibrations. Moreover, photodetectors based on GeP flakes show highly anisotropic behavior with anisotropic factors of 1.52 and 1.83 for conductance and photoresponsivity, respectively. This work lays the foundation and ignites future research interests in Group IV–Group V compound 2D materials.
A new in‐plane anisotropic 2D material GeP with a tunable bandgap is introduced. Angle‐resolved polarized Raman investigations indicate that the GeP flake has a strong anisotropic Raman response. Moreover, a remarkable in‐plane anisotropic conductance with the anisotropic factor of 1.52 and an in‐plane anisotropic photoresponsivity with an anisotropic factor of 1.83 are realized in GeP flakes. |
doi_str_mv | 10.1002/adma.201706771 |
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A new in‐plane anisotropic 2D material GeP with a tunable bandgap is introduced. Angle‐resolved polarized Raman investigations indicate that the GeP flake has a strong anisotropic Raman response. Moreover, a remarkable in‐plane anisotropic conductance with the anisotropic factor of 1.52 and an in‐plane anisotropic photoresponsivity with an anisotropic factor of 1.83 are realized in GeP flakes.</description><identifier>ISSN: 0935-9648</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.201706771</identifier><identifier>PMID: 29479747</identifier><language>eng</language><publisher>Germany: Wiley Subscription Services, Inc</publisher><subject>2D materials ; Anisotropy ; Flakes ; GeP ; in‐plane anisotropy ; low‐symmetry ; Phosphides ; photodetectors ; Physical properties ; Resistance</subject><ispartof>Advanced materials (Weinheim), 2018-04, Vol.30 (14), p.e1706771-n/a</ispartof><rights>2018 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3731-2f890a09ead0dfda9a9a4a5f4c7c0eb7ec09b7b3ed401bf95dcdee3091208a793</citedby><cites>FETCH-LOGICAL-c3731-2f890a09ead0dfda9a9a4a5f4c7c0eb7ec09b7b3ed401bf95dcdee3091208a793</cites><orcidid>0000-0003-0985-4806</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadma.201706771$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadma.201706771$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>315,781,785,1418,27928,27929,45578,45579</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/29479747$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Li, Liang</creatorcontrib><creatorcontrib>Wang, Weike</creatorcontrib><creatorcontrib>Gong, Penglai</creatorcontrib><creatorcontrib>Zhu, Xiangde</creatorcontrib><creatorcontrib>Deng, Bei</creatorcontrib><creatorcontrib>Shi, Xingqiang</creatorcontrib><creatorcontrib>Gao, Guoying</creatorcontrib><creatorcontrib>Li, Huiqiao</creatorcontrib><creatorcontrib>Zhai, Tianyou</creatorcontrib><title>2D GeP: An Unexploited Low‐Symmetry Semiconductor with Strong In‐Plane Anisotropy</title><title>Advanced materials (Weinheim)</title><addtitle>Adv Mater</addtitle><description>Germanium phosphide (GeP), a new member of the Group IV–Group V compounds, is introduced into the fast growing 2D family with experimental and theoretical demonstration of strong anisotropic physical properties. The indirect band gap of GeP can be drastically tuned from 1.68 eV for monolayer to 0.51 eV for bulk, with highly anisotropic dispersions of band structures. Thin GeP shows strong anisotropy of phonon vibrations. Moreover, photodetectors based on GeP flakes show highly anisotropic behavior with anisotropic factors of 1.52 and 1.83 for conductance and photoresponsivity, respectively. This work lays the foundation and ignites future research interests in Group IV–Group V compound 2D materials.
A new in‐plane anisotropic 2D material GeP with a tunable bandgap is introduced. Angle‐resolved polarized Raman investigations indicate that the GeP flake has a strong anisotropic Raman response. Moreover, a remarkable in‐plane anisotropic conductance with the anisotropic factor of 1.52 and an in‐plane anisotropic photoresponsivity with an anisotropic factor of 1.83 are realized in GeP flakes.</description><subject>2D materials</subject><subject>Anisotropy</subject><subject>Flakes</subject><subject>GeP</subject><subject>in‐plane anisotropy</subject><subject>low‐symmetry</subject><subject>Phosphides</subject><subject>photodetectors</subject><subject>Physical properties</subject><subject>Resistance</subject><issn>0935-9648</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqFkE1P3DAQhi1UBFvKtUcUqRcuWcYfidfcVtBSpEVFWvYcOfakBCXx1k60zY2fwG_kl-DVUpB6QXMYafTMo1cvIV8pTCkAO9O21VMGVEIuJd0jE5oxmgpQ2ScyAcWzVOVidkg-h_AAACqH_IAcMiWkkkJOyIpdJld4e57Mu2TV4d914-oebbJwm-fHp-XYttj7MVliWxvX2cH0ziebur9Plr133e_kuovcbaM7jIo6uHhdj1_IfqWbgMev-4isfny_u_iZLn5dXV_MF6nhktOUVTMFGhRqC7ayWsUROquEkQawlGhAlbLkaAXQslKZNRaRg6IMZloqfkROd961d38GDH3R1sFgs43jhlAwgBnPgTMZ0W__oQ9u8F1MFynGQTCRbanpjjLeheCxKta-brUfCwrFtvBiW3jxVnh8OHnVDmWL9g3_13AE1A7Y1A2OH-iK-eXN_F3-AqhsjmY</recordid><startdate>201804</startdate><enddate>201804</enddate><creator>Li, Liang</creator><creator>Wang, Weike</creator><creator>Gong, Penglai</creator><creator>Zhu, Xiangde</creator><creator>Deng, Bei</creator><creator>Shi, Xingqiang</creator><creator>Gao, Guoying</creator><creator>Li, Huiqiao</creator><creator>Zhai, Tianyou</creator><general>Wiley Subscription Services, Inc</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-0985-4806</orcidid></search><sort><creationdate>201804</creationdate><title>2D GeP: An Unexploited Low‐Symmetry Semiconductor with Strong In‐Plane Anisotropy</title><author>Li, Liang ; Wang, Weike ; Gong, Penglai ; Zhu, Xiangde ; Deng, Bei ; Shi, Xingqiang ; Gao, Guoying ; Li, Huiqiao ; Zhai, Tianyou</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3731-2f890a09ead0dfda9a9a4a5f4c7c0eb7ec09b7b3ed401bf95dcdee3091208a793</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>2D materials</topic><topic>Anisotropy</topic><topic>Flakes</topic><topic>GeP</topic><topic>in‐plane anisotropy</topic><topic>low‐symmetry</topic><topic>Phosphides</topic><topic>photodetectors</topic><topic>Physical properties</topic><topic>Resistance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Liang</creatorcontrib><creatorcontrib>Wang, Weike</creatorcontrib><creatorcontrib>Gong, Penglai</creatorcontrib><creatorcontrib>Zhu, Xiangde</creatorcontrib><creatorcontrib>Deng, Bei</creatorcontrib><creatorcontrib>Shi, Xingqiang</creatorcontrib><creatorcontrib>Gao, Guoying</creatorcontrib><creatorcontrib>Li, Huiqiao</creatorcontrib><creatorcontrib>Zhai, Tianyou</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>MEDLINE - Academic</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Liang</au><au>Wang, Weike</au><au>Gong, Penglai</au><au>Zhu, Xiangde</au><au>Deng, Bei</au><au>Shi, Xingqiang</au><au>Gao, Guoying</au><au>Li, Huiqiao</au><au>Zhai, Tianyou</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>2D GeP: An Unexploited Low‐Symmetry Semiconductor with Strong In‐Plane Anisotropy</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv Mater</addtitle><date>2018-04</date><risdate>2018</risdate><volume>30</volume><issue>14</issue><spage>e1706771</spage><epage>n/a</epage><pages>e1706771-n/a</pages><issn>0935-9648</issn><eissn>1521-4095</eissn><abstract>Germanium phosphide (GeP), a new member of the Group IV–Group V compounds, is introduced into the fast growing 2D family with experimental and theoretical demonstration of strong anisotropic physical properties. The indirect band gap of GeP can be drastically tuned from 1.68 eV for monolayer to 0.51 eV for bulk, with highly anisotropic dispersions of band structures. Thin GeP shows strong anisotropy of phonon vibrations. Moreover, photodetectors based on GeP flakes show highly anisotropic behavior with anisotropic factors of 1.52 and 1.83 for conductance and photoresponsivity, respectively. This work lays the foundation and ignites future research interests in Group IV–Group V compound 2D materials.
A new in‐plane anisotropic 2D material GeP with a tunable bandgap is introduced. Angle‐resolved polarized Raman investigations indicate that the GeP flake has a strong anisotropic Raman response. Moreover, a remarkable in‐plane anisotropic conductance with the anisotropic factor of 1.52 and an in‐plane anisotropic photoresponsivity with an anisotropic factor of 1.83 are realized in GeP flakes.</abstract><cop>Germany</cop><pub>Wiley Subscription Services, Inc</pub><pmid>29479747</pmid><doi>10.1002/adma.201706771</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0003-0985-4806</orcidid></addata></record> |
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subjects | 2D materials Anisotropy Flakes GeP in‐plane anisotropy low‐symmetry Phosphides photodetectors Physical properties Resistance |
title | 2D GeP: An Unexploited Low‐Symmetry Semiconductor with Strong In‐Plane Anisotropy |
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