A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes

Extraordinary electronic and photonic features render black phosphorus (BP) an important material for the development of novel electronics and optoelectronics. Despite recent progress in the preparation of thinly layered BP flakes, scalable synthesis of large‐size, pristine BP flakes remains a major...

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Veröffentlicht in:Angewandte Chemie International Edition 2018-04, Vol.57 (17), p.4677-4681
Hauptverfasser: Yang, Sheng, Zhang, Ke, Ricciardulli, Antonio Gaetano, Zhang, Panpan, Liao, Zhongquan, Lohe, Martin R., Zschech, Ehrenfried, Blom, Paul W. M., Pisula, Wojciech, Müllen, Klaus, Feng, Xinliang
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container_end_page 4681
container_issue 17
container_start_page 4677
container_title Angewandte Chemie International Edition
container_volume 57
creator Yang, Sheng
Zhang, Ke
Ricciardulli, Antonio Gaetano
Zhang, Panpan
Liao, Zhongquan
Lohe, Martin R.
Zschech, Ehrenfried
Blom, Paul W. M.
Pisula, Wojciech
Müllen, Klaus
Feng, Xinliang
description Extraordinary electronic and photonic features render black phosphorus (BP) an important material for the development of novel electronics and optoelectronics. Despite recent progress in the preparation of thinly layered BP flakes, scalable synthesis of large‐size, pristine BP flakes remains a major challenge. An electrochemical delamination strategy is demonstrated that involves intercalation of diverse cations in non‐aqueous electrolytes, thereby peeling off bulk BP crystals into defect‐free flakes comprising only a few layers. The interplay between tetra‐n‐butylammonium cations and bisulfate anions promotes a high exfoliation yield up to 78 % and large BP flakes up to 20.6 μm. Bottom‐gate and bottom‐contact field‐effect transistors, comprising single BP flakes only a few layers thick, exhibit a high hole mobility of 252±18 cm2 V−1 s−1 and a remarkable on/off ratio of (1.2±0.15)×105 at 143 K under vacuum. This efficient and scalable delamination method holds great promise for development of BP‐based composites and optoelectronic devices. Defect‐free black phosphorus (BP) flakes were prepared on a macroscopic scale by a simple and scalable exfoliation method. Delaminated and mechanically exfoliated BP flakes present comparable electronic properties. This efficient and scalable method holds promise for development of BP‐based composites and optoelectronic devices.
doi_str_mv 10.1002/anie.201801265
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2007978518</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2007978518</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4105-91dec525c147b6d3fdc21a3948594dc8e721e4f983ed990814fb6e9b12bcbc193</originalsourceid><addsrcrecordid>eNqF0LtuFDEUBmALgcgFWkpkiYZmFl_HdrmELIm0XCRCPXg8Z7JOvOPFnhGaLo_AM_IkeLUhSDRU5xTf-XX0I_SCkgUlhL2xg4cFI1QTymr5CB1TyWjFleKPyy44r5SW9Aid5HxTvNakfoqOmBFKKMmP0bclfgfBbv1gRx8H_GVMdoTrGfcx4auNH8KM13aGBF2BPbjx193PVQLAF_56U_YPsfXBjzN-G6y7xZ83Me82MU0Zr4K9hfwMPeltyPD8fp6ir6vzq7OLav3p_eXZcl05QYmsDO3ASSYdFaqtO953jlHLjdDSiM5pUIyC6I3m0BlDNBV9W4NpKWtd66jhp-j1IXeX4vcJ8thsfXYQgh0gTrlhhCiz70IX-uofehOnNJTvimKS17JWdVGLg3Ip5pygb3bJb22aG0qafffNvvvmofty8PI-dmq30D3wP2UXYA7ghw8w_yeuWX68PP8b_hsFYpGQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2025365676</pqid></control><display><type>article</type><title>A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes</title><source>Wiley Online Library All Journals</source><creator>Yang, Sheng ; Zhang, Ke ; Ricciardulli, Antonio Gaetano ; Zhang, Panpan ; Liao, Zhongquan ; Lohe, Martin R. ; Zschech, Ehrenfried ; Blom, Paul W. M. ; Pisula, Wojciech ; Müllen, Klaus ; Feng, Xinliang</creator><creatorcontrib>Yang, Sheng ; Zhang, Ke ; Ricciardulli, Antonio Gaetano ; Zhang, Panpan ; Liao, Zhongquan ; Lohe, Martin R. ; Zschech, Ehrenfried ; Blom, Paul W. M. ; Pisula, Wojciech ; Müllen, Klaus ; Feng, Xinliang</creatorcontrib><description>Extraordinary electronic and photonic features render black phosphorus (BP) an important material for the development of novel electronics and optoelectronics. Despite recent progress in the preparation of thinly layered BP flakes, scalable synthesis of large‐size, pristine BP flakes remains a major challenge. An electrochemical delamination strategy is demonstrated that involves intercalation of diverse cations in non‐aqueous electrolytes, thereby peeling off bulk BP crystals into defect‐free flakes comprising only a few layers. The interplay between tetra‐n‐butylammonium cations and bisulfate anions promotes a high exfoliation yield up to 78 % and large BP flakes up to 20.6 μm. Bottom‐gate and bottom‐contact field‐effect transistors, comprising single BP flakes only a few layers thick, exhibit a high hole mobility of 252±18 cm2 V−1 s−1 and a remarkable on/off ratio of (1.2±0.15)×105 at 143 K under vacuum. This efficient and scalable delamination method holds great promise for development of BP‐based composites and optoelectronic devices. Defect‐free black phosphorus (BP) flakes were prepared on a macroscopic scale by a simple and scalable exfoliation method. Delaminated and mechanically exfoliated BP flakes present comparable electronic properties. This efficient and scalable method holds promise for development of BP‐based composites and optoelectronic devices.</description><edition>International ed. in English</edition><identifier>ISSN: 1433-7851</identifier><identifier>EISSN: 1521-3773</identifier><identifier>DOI: 10.1002/anie.201801265</identifier><identifier>PMID: 29474753</identifier><language>eng</language><publisher>Germany: Wiley Subscription Services, Inc</publisher><subject>Anions ; Aqueous electrolytes ; black phosphorus ; Cations ; Crystals ; Delamination ; Electrochemistry ; exfoliation ; field-effect transistors ; Flakes ; Flakes (defects) ; Hole mobility ; Mobility ; Optoelectronic devices ; Phosphorus ; Photonics ; Semiconductor devices ; Transistors ; two-dimensional flakes ; Vacuum</subject><ispartof>Angewandte Chemie International Edition, 2018-04, Vol.57 (17), p.4677-4681</ispartof><rights>2018 Wiley‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><rights>2018 Wiley-VCH Verlag GmbH &amp; Co. KGaA, Weinheim.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4105-91dec525c147b6d3fdc21a3948594dc8e721e4f983ed990814fb6e9b12bcbc193</citedby><cites>FETCH-LOGICAL-c4105-91dec525c147b6d3fdc21a3948594dc8e721e4f983ed990814fb6e9b12bcbc193</cites><orcidid>0000-0003-3885-2703 ; 0000-0002-3306-9229</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fanie.201801265$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fanie.201801265$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27923,27924,45573,45574</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/29474753$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Yang, Sheng</creatorcontrib><creatorcontrib>Zhang, Ke</creatorcontrib><creatorcontrib>Ricciardulli, Antonio Gaetano</creatorcontrib><creatorcontrib>Zhang, Panpan</creatorcontrib><creatorcontrib>Liao, Zhongquan</creatorcontrib><creatorcontrib>Lohe, Martin R.</creatorcontrib><creatorcontrib>Zschech, Ehrenfried</creatorcontrib><creatorcontrib>Blom, Paul W. M.</creatorcontrib><creatorcontrib>Pisula, Wojciech</creatorcontrib><creatorcontrib>Müllen, Klaus</creatorcontrib><creatorcontrib>Feng, Xinliang</creatorcontrib><title>A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes</title><title>Angewandte Chemie International Edition</title><addtitle>Angew Chem Int Ed Engl</addtitle><description>Extraordinary electronic and photonic features render black phosphorus (BP) an important material for the development of novel electronics and optoelectronics. Despite recent progress in the preparation of thinly layered BP flakes, scalable synthesis of large‐size, pristine BP flakes remains a major challenge. An electrochemical delamination strategy is demonstrated that involves intercalation of diverse cations in non‐aqueous electrolytes, thereby peeling off bulk BP crystals into defect‐free flakes comprising only a few layers. The interplay between tetra‐n‐butylammonium cations and bisulfate anions promotes a high exfoliation yield up to 78 % and large BP flakes up to 20.6 μm. Bottom‐gate and bottom‐contact field‐effect transistors, comprising single BP flakes only a few layers thick, exhibit a high hole mobility of 252±18 cm2 V−1 s−1 and a remarkable on/off ratio of (1.2±0.15)×105 at 143 K under vacuum. This efficient and scalable delamination method holds great promise for development of BP‐based composites and optoelectronic devices. Defect‐free black phosphorus (BP) flakes were prepared on a macroscopic scale by a simple and scalable exfoliation method. Delaminated and mechanically exfoliated BP flakes present comparable electronic properties. This efficient and scalable method holds promise for development of BP‐based composites and optoelectronic devices.</description><subject>Anions</subject><subject>Aqueous electrolytes</subject><subject>black phosphorus</subject><subject>Cations</subject><subject>Crystals</subject><subject>Delamination</subject><subject>Electrochemistry</subject><subject>exfoliation</subject><subject>field-effect transistors</subject><subject>Flakes</subject><subject>Flakes (defects)</subject><subject>Hole mobility</subject><subject>Mobility</subject><subject>Optoelectronic devices</subject><subject>Phosphorus</subject><subject>Photonics</subject><subject>Semiconductor devices</subject><subject>Transistors</subject><subject>two-dimensional flakes</subject><subject>Vacuum</subject><issn>1433-7851</issn><issn>1521-3773</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqF0LtuFDEUBmALgcgFWkpkiYZmFl_HdrmELIm0XCRCPXg8Z7JOvOPFnhGaLo_AM_IkeLUhSDRU5xTf-XX0I_SCkgUlhL2xg4cFI1QTymr5CB1TyWjFleKPyy44r5SW9Aid5HxTvNakfoqOmBFKKMmP0bclfgfBbv1gRx8H_GVMdoTrGfcx4auNH8KM13aGBF2BPbjx193PVQLAF_56U_YPsfXBjzN-G6y7xZ83Me82MU0Zr4K9hfwMPeltyPD8fp6ir6vzq7OLav3p_eXZcl05QYmsDO3ASSYdFaqtO953jlHLjdDSiM5pUIyC6I3m0BlDNBV9W4NpKWtd66jhp-j1IXeX4vcJ8thsfXYQgh0gTrlhhCiz70IX-uofehOnNJTvimKS17JWdVGLg3Ip5pygb3bJb22aG0qafffNvvvmofty8PI-dmq30D3wP2UXYA7ghw8w_yeuWX68PP8b_hsFYpGQ</recordid><startdate>20180416</startdate><enddate>20180416</enddate><creator>Yang, Sheng</creator><creator>Zhang, Ke</creator><creator>Ricciardulli, Antonio Gaetano</creator><creator>Zhang, Panpan</creator><creator>Liao, Zhongquan</creator><creator>Lohe, Martin R.</creator><creator>Zschech, Ehrenfried</creator><creator>Blom, Paul W. M.</creator><creator>Pisula, Wojciech</creator><creator>Müllen, Klaus</creator><creator>Feng, Xinliang</creator><general>Wiley Subscription Services, Inc</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7TM</scope><scope>K9.</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-3885-2703</orcidid><orcidid>https://orcid.org/0000-0002-3306-9229</orcidid></search><sort><creationdate>20180416</creationdate><title>A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes</title><author>Yang, Sheng ; Zhang, Ke ; Ricciardulli, Antonio Gaetano ; Zhang, Panpan ; Liao, Zhongquan ; Lohe, Martin R. ; Zschech, Ehrenfried ; Blom, Paul W. M. ; Pisula, Wojciech ; Müllen, Klaus ; Feng, Xinliang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4105-91dec525c147b6d3fdc21a3948594dc8e721e4f983ed990814fb6e9b12bcbc193</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Anions</topic><topic>Aqueous electrolytes</topic><topic>black phosphorus</topic><topic>Cations</topic><topic>Crystals</topic><topic>Delamination</topic><topic>Electrochemistry</topic><topic>exfoliation</topic><topic>field-effect transistors</topic><topic>Flakes</topic><topic>Flakes (defects)</topic><topic>Hole mobility</topic><topic>Mobility</topic><topic>Optoelectronic devices</topic><topic>Phosphorus</topic><topic>Photonics</topic><topic>Semiconductor devices</topic><topic>Transistors</topic><topic>two-dimensional flakes</topic><topic>Vacuum</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, Sheng</creatorcontrib><creatorcontrib>Zhang, Ke</creatorcontrib><creatorcontrib>Ricciardulli, Antonio Gaetano</creatorcontrib><creatorcontrib>Zhang, Panpan</creatorcontrib><creatorcontrib>Liao, Zhongquan</creatorcontrib><creatorcontrib>Lohe, Martin R.</creatorcontrib><creatorcontrib>Zschech, Ehrenfried</creatorcontrib><creatorcontrib>Blom, Paul W. M.</creatorcontrib><creatorcontrib>Pisula, Wojciech</creatorcontrib><creatorcontrib>Müllen, Klaus</creatorcontrib><creatorcontrib>Feng, Xinliang</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Nucleic Acids Abstracts</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>MEDLINE - Academic</collection><jtitle>Angewandte Chemie International Edition</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yang, Sheng</au><au>Zhang, Ke</au><au>Ricciardulli, Antonio Gaetano</au><au>Zhang, Panpan</au><au>Liao, Zhongquan</au><au>Lohe, Martin R.</au><au>Zschech, Ehrenfried</au><au>Blom, Paul W. M.</au><au>Pisula, Wojciech</au><au>Müllen, Klaus</au><au>Feng, Xinliang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes</atitle><jtitle>Angewandte Chemie International Edition</jtitle><addtitle>Angew Chem Int Ed Engl</addtitle><date>2018-04-16</date><risdate>2018</risdate><volume>57</volume><issue>17</issue><spage>4677</spage><epage>4681</epage><pages>4677-4681</pages><issn>1433-7851</issn><eissn>1521-3773</eissn><abstract>Extraordinary electronic and photonic features render black phosphorus (BP) an important material for the development of novel electronics and optoelectronics. Despite recent progress in the preparation of thinly layered BP flakes, scalable synthesis of large‐size, pristine BP flakes remains a major challenge. An electrochemical delamination strategy is demonstrated that involves intercalation of diverse cations in non‐aqueous electrolytes, thereby peeling off bulk BP crystals into defect‐free flakes comprising only a few layers. The interplay between tetra‐n‐butylammonium cations and bisulfate anions promotes a high exfoliation yield up to 78 % and large BP flakes up to 20.6 μm. Bottom‐gate and bottom‐contact field‐effect transistors, comprising single BP flakes only a few layers thick, exhibit a high hole mobility of 252±18 cm2 V−1 s−1 and a remarkable on/off ratio of (1.2±0.15)×105 at 143 K under vacuum. This efficient and scalable delamination method holds great promise for development of BP‐based composites and optoelectronic devices. Defect‐free black phosphorus (BP) flakes were prepared on a macroscopic scale by a simple and scalable exfoliation method. Delaminated and mechanically exfoliated BP flakes present comparable electronic properties. This efficient and scalable method holds promise for development of BP‐based composites and optoelectronic devices.</abstract><cop>Germany</cop><pub>Wiley Subscription Services, Inc</pub><pmid>29474753</pmid><doi>10.1002/anie.201801265</doi><tpages>5</tpages><edition>International ed. in English</edition><orcidid>https://orcid.org/0000-0003-3885-2703</orcidid><orcidid>https://orcid.org/0000-0002-3306-9229</orcidid></addata></record>
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1521-3773
language eng
recordid cdi_proquest_miscellaneous_2007978518
source Wiley Online Library All Journals
subjects Anions
Aqueous electrolytes
black phosphorus
Cations
Crystals
Delamination
Electrochemistry
exfoliation
field-effect transistors
Flakes
Flakes (defects)
Hole mobility
Mobility
Optoelectronic devices
Phosphorus
Photonics
Semiconductor devices
Transistors
two-dimensional flakes
Vacuum
title A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T01%3A33%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Delamination%20Strategy%20for%20Thinly%20Layered%20Defect%E2%80%90Free%20High%E2%80%90Mobility%20Black%20Phosphorus%20Flakes&rft.jtitle=Angewandte%20Chemie%20International%20Edition&rft.au=Yang,%20Sheng&rft.date=2018-04-16&rft.volume=57&rft.issue=17&rft.spage=4677&rft.epage=4681&rft.pages=4677-4681&rft.issn=1433-7851&rft.eissn=1521-3773&rft_id=info:doi/10.1002/anie.201801265&rft_dat=%3Cproquest_cross%3E2007978518%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2025365676&rft_id=info:pmid/29474753&rfr_iscdi=true