Thickness-Dependent Phonon Renormalization and Enhanced Raman Scattering in Ultrathin Silicon Nanomembranes

We report on the thickness-dependent Raman spectroscopy of ultrathin silicon (Si) nanomembranes (NMs), whose thicknesses range from 2 to 18 nm, using several excitation energies. We observe that the Raman intensity depends on the thickness and the excitation energy due to the combined effects of int...

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Veröffentlicht in:	Nano letters 2017-12, Vol.17 (12), p.7744-7750
Hauptverfasser:	Lee, Seonwoo, Kim, Kangwon, Dhakal, Krishna P, Kim, Hyunmin, Yun, Won Seok, Lee, JaeDong, Cheong, Hyeonsik, Ahn, Jong-Hyun
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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