Extended shift-rotation method for absolute interferometric testing of a spherical surface with pixel-level spatial resolution

An improved shift-rotation method for the absolute testing of spherical surfaces is developed to obtain pixel-level spatial resolution and a low noise propagation ratio. The absolute testing process includes multiple rotational tests and two lateral shifting tests with large shifts. A wavefront reco...

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Veröffentlicht in:	Applied Optics 2017-06, Vol.56 (16), p.4886-4891
Hauptverfasser:	Liu, Yu, Miao, Liang, Zhang, Wenlong, Jin, Chunshui, Zhang, Haitao
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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