Applicability of non-linear imaging in high-resolution transmission electron microscopy
According to transmission cross-coefficient theory, the information limit of non-linear imaging in high-resolution transmission electron microscopy is, under certain conditions, far beyond that of linear imaging, which suggests the possibility of using high-frequency information for structural deter...
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Veröffentlicht in: | Journal of electron microscopy 2017-12, Vol.66 (6), p.406-413 |
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container_title | Journal of electron microscopy |
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creator | Chang, Yunjie Li, Shouqing Wang, Yumei Ge, Binghui |
description | According to transmission cross-coefficient theory, the information limit of non-linear imaging in high-resolution transmission electron microscopy is, under certain conditions, far beyond that of linear imaging, which suggests the possibility of using high-frequency information for structural determination. In this article, we studied the information beyond the linear information limit by means of multislice method simulation, with AlN as an example, and more structural information was obtained by using part of the high-frequency information. |
doi_str_mv | 10.1093/jmicro/dfx031 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1949696470</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1949696470</sourcerecordid><originalsourceid>FETCH-LOGICAL-c321t-ef7664a9d58757a326e8d8aea3f0b04bbac49769deb7c8fa29e79cdbfe65fa9c3</originalsourceid><addsrcrecordid>eNpdkM9LwzAUx4MobswdvUrBi5e6lzRtmuMY_oKBF8VjSdNky-iSmrTg_nszOz34Lu89-PD4vg9C1xjuMfBssdsb6d2i0V-Q4TM0JZBDmjPA52gKQEgKjNIJmoewg1hljoEWl2hCSs4JoXiKPpZd1xopatOa_pA4nVhn09ZYJXxi9mJj7CYxNtmazTb1Krh26I2zSe-FDXsTwnFRrZK9j8NPnCBdd7hCF1q0Qc1PfYbeHx_eVs_p-vXpZbVcpzIjuE-VZkVBBW_ykuVMZKRQZVMKJTINNdC6FpJyVvBG1UyWWhCuGJdNrVWRa8FlNkN3493Ou89Bhb6KoaRqW2GVG0KFOeUFLyiDiN7-Q3du8Dami1TJKAbIy0ilI3X8JHilq85HD_5QYaiO0qtRejVKj_zN6epQ71XzR_8qzr4Bn1SBKA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1987410058</pqid></control><display><type>article</type><title>Applicability of non-linear imaging in high-resolution transmission electron microscopy</title><source>Alma/SFX Local Collection</source><source>Oxford Journals</source><creator>Chang, Yunjie ; Li, Shouqing ; Wang, Yumei ; Ge, Binghui</creator><creatorcontrib>Chang, Yunjie ; Li, Shouqing ; Wang, Yumei ; Ge, Binghui</creatorcontrib><description>According to transmission cross-coefficient theory, the information limit of non-linear imaging in high-resolution transmission electron microscopy is, under certain conditions, far beyond that of linear imaging, which suggests the possibility of using high-frequency information for structural determination. In this article, we studied the information beyond the linear information limit by means of multislice method simulation, with AlN as an example, and more structural information was obtained by using part of the high-frequency information.</description><identifier>ISSN: 0022-0744</identifier><identifier>EISSN: 2050-5701</identifier><identifier>EISSN: 1477-9986</identifier><identifier>DOI: 10.1093/jmicro/dfx031</identifier><identifier>PMID: 28992241</identifier><language>eng</language><publisher>England: Oxford Publishing Limited (England)</publisher><subject>Electron microscopy ; High resolution ; High resolution electron microscopy ; Image resolution ; Information ; Simulation ; Transmission electron microscopy</subject><ispartof>Journal of electron microscopy, 2017-12, Vol.66 (6), p.406-413</ispartof><rights>The Author 2017. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.</rights><rights>Copyright Oxford Publishing Limited(England) Dec 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c321t-ef7664a9d58757a326e8d8aea3f0b04bbac49769deb7c8fa29e79cdbfe65fa9c3</citedby><cites>FETCH-LOGICAL-c321t-ef7664a9d58757a326e8d8aea3f0b04bbac49769deb7c8fa29e79cdbfe65fa9c3</cites><orcidid>0000-0002-6470-6278</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/28992241$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Chang, Yunjie</creatorcontrib><creatorcontrib>Li, Shouqing</creatorcontrib><creatorcontrib>Wang, Yumei</creatorcontrib><creatorcontrib>Ge, Binghui</creatorcontrib><title>Applicability of non-linear imaging in high-resolution transmission electron microscopy</title><title>Journal of electron microscopy</title><addtitle>Microscopy (Oxf)</addtitle><description>According to transmission cross-coefficient theory, the information limit of non-linear imaging in high-resolution transmission electron microscopy is, under certain conditions, far beyond that of linear imaging, which suggests the possibility of using high-frequency information for structural determination. In this article, we studied the information beyond the linear information limit by means of multislice method simulation, with AlN as an example, and more structural information was obtained by using part of the high-frequency information.</description><subject>Electron microscopy</subject><subject>High resolution</subject><subject>High resolution electron microscopy</subject><subject>Image resolution</subject><subject>Information</subject><subject>Simulation</subject><subject>Transmission electron microscopy</subject><issn>0022-0744</issn><issn>2050-5701</issn><issn>1477-9986</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNpdkM9LwzAUx4MobswdvUrBi5e6lzRtmuMY_oKBF8VjSdNky-iSmrTg_nszOz34Lu89-PD4vg9C1xjuMfBssdsb6d2i0V-Q4TM0JZBDmjPA52gKQEgKjNIJmoewg1hljoEWl2hCSs4JoXiKPpZd1xopatOa_pA4nVhn09ZYJXxi9mJj7CYxNtmazTb1Krh26I2zSe-FDXsTwnFRrZK9j8NPnCBdd7hCF1q0Qc1PfYbeHx_eVs_p-vXpZbVcpzIjuE-VZkVBBW_ykuVMZKRQZVMKJTINNdC6FpJyVvBG1UyWWhCuGJdNrVWRa8FlNkN3493Ou89Bhb6KoaRqW2GVG0KFOeUFLyiDiN7-Q3du8Dami1TJKAbIy0ilI3X8JHilq85HD_5QYaiO0qtRejVKj_zN6epQ71XzR_8qzr4Bn1SBKA</recordid><startdate>20171201</startdate><enddate>20171201</enddate><creator>Chang, Yunjie</creator><creator>Li, Shouqing</creator><creator>Wang, Yumei</creator><creator>Ge, Binghui</creator><general>Oxford Publishing Limited (England)</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>JG9</scope><scope>JQ2</scope><scope>K9.</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>NAPCQ</scope><scope>P64</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0002-6470-6278</orcidid></search><sort><creationdate>20171201</creationdate><title>Applicability of non-linear imaging in high-resolution transmission electron microscopy</title><author>Chang, Yunjie ; Li, Shouqing ; Wang, Yumei ; Ge, Binghui</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c321t-ef7664a9d58757a326e8d8aea3f0b04bbac49769deb7c8fa29e79cdbfe65fa9c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Electron microscopy</topic><topic>High resolution</topic><topic>High resolution electron microscopy</topic><topic>Image resolution</topic><topic>Information</topic><topic>Simulation</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chang, Yunjie</creatorcontrib><creatorcontrib>Li, Shouqing</creatorcontrib><creatorcontrib>Wang, Yumei</creatorcontrib><creatorcontrib>Ge, Binghui</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Nursing & Allied Health Premium</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of electron microscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chang, Yunjie</au><au>Li, Shouqing</au><au>Wang, Yumei</au><au>Ge, Binghui</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Applicability of non-linear imaging in high-resolution transmission electron microscopy</atitle><jtitle>Journal of electron microscopy</jtitle><addtitle>Microscopy (Oxf)</addtitle><date>2017-12-01</date><risdate>2017</risdate><volume>66</volume><issue>6</issue><spage>406</spage><epage>413</epage><pages>406-413</pages><issn>0022-0744</issn><eissn>2050-5701</eissn><eissn>1477-9986</eissn><abstract>According to transmission cross-coefficient theory, the information limit of non-linear imaging in high-resolution transmission electron microscopy is, under certain conditions, far beyond that of linear imaging, which suggests the possibility of using high-frequency information for structural determination. In this article, we studied the information beyond the linear information limit by means of multislice method simulation, with AlN as an example, and more structural information was obtained by using part of the high-frequency information.</abstract><cop>England</cop><pub>Oxford Publishing Limited (England)</pub><pmid>28992241</pmid><doi>10.1093/jmicro/dfx031</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-6470-6278</orcidid></addata></record> |
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subjects | Electron microscopy High resolution High resolution electron microscopy Image resolution Information Simulation Transmission electron microscopy |
title | Applicability of non-linear imaging in high-resolution transmission electron microscopy |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T10%3A32%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Applicability%20of%20non-linear%20imaging%20in%20high-resolution%20transmission%20electron%20microscopy&rft.jtitle=Journal%20of%20electron%20microscopy&rft.au=Chang,%20Yunjie&rft.date=2017-12-01&rft.volume=66&rft.issue=6&rft.spage=406&rft.epage=413&rft.pages=406-413&rft.issn=0022-0744&rft.eissn=2050-5701&rft_id=info:doi/10.1093/jmicro/dfx031&rft_dat=%3Cproquest_cross%3E1949696470%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1987410058&rft_id=info:pmid/28992241&rfr_iscdi=true |