Automatic system for electron tomography data collection in the ultra-high voltage electron microscope

•An automatic system for collection of tilt series for electron tomography based on the ultra-HVEM in Osaka University was developed. This system track the field of view and do focus in each tilt angle.•The developed system can full automatically collect the tilt series with smaller time consumption...

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Veröffentlicht in:Micron (Oxford, England : 1993) England : 1993), 2017-12, Vol.103, p.29-33
Hauptverfasser: Cao, Meng, Nishi, Ryuji, Wang, Fang
Format: Artikel
Sprache:eng
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