Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes
Au/PPy/n-Si (MPS) type Schottky barrier diodes (SBDs) were produced and their current–voltage ( I–V) characteristics were measured in the positive and negative bias regions at 300 K. The basic electronic quantities such as reverse-saturation current ( I o ), ideality factor ( n ), zero-bias barrier...
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description | Au/PPy/n-Si (MPS) type Schottky barrier diodes (SBDs) were produced and their current–voltage (
I–V)
characteristics were measured in the positive and negative bias regions at 300 K. The basic electronic quantities such as reverse-saturation current (
I
o
), ideality factor (
n
), zero-bias barrier height (
Ф
B0
), series (
R
s
)
and shunt resistances (
R
sh
) were obtained by using
I–V
data in total darkness and illumination (100 W/m
2
). The values of these parameters were found as 7.79 × 10
−9
A, 5.41, 0.75 eV, 1 kΩ and 130 MΩ in dark) and 4 × 10
−9
A, 4.89, 0.77 eV, 0.9 kΩ and 1.02 MΩ under illumination), respectively. Also the energy density distribution behaviors of surface states (
N
ss
) have been acquired by calculation of effective barrier height (
Ф
e
) and ideality factor
n (V)
depending on voltage in total darkness and illumination. The values of
N
ss
show an exponentially increase from the mid-gap of Si to the lower part of conduction band (
E
c
) for two conditions. The possible current conduction mechanisms were determined by plotting of the double logarithmic
I–V
plots in the positive voltage zone and the value of current was found proportional to voltage (
I∼V
m
). The high values of
n
and
R
s
were ascribed to the certain density distribution of
N
ss
localized at semiconductor/PPy interface, surface conditions, barrier inequality, the thickness of PPy interlayer and its roughness. The open-circuit voltage of the photodiode was found as 0.36 V under 100 W/m
2
illumination level. This is evidence that the fabricated sample is very sensitive to illumination. Therefore, it can be put into practice in optoelectronic industries as a photodiode or solar cells. |
doi_str_mv | 10.1007/s10854-016-6326-z |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1904225825</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1904225825</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-b88e345af38d6b71bcc7829dfb1a7473cf889a3e1c90c05a1ad82d55a35137373</originalsourceid><addsrcrecordid>eNp1kUtLxDAUhYMoOD5-gLuAG13EyaNp0qWIL1AcUMFdSNNbjdamJq0w_nozjAsRTBa5kO8czuUgdMDoCaNUzROjWhaEspKUgpfkawPNmFSCFJo_baIZraQiheR8G-2k9EopLQuhZ2i47j8hjf7Zjj70OLR4eAljIL5vJgcNhrYFN-L8BV0eone2w0MMA8TRQ1oJTqf5YrGc9-Te46Pbxf0xHpcD4OSy0fi2xLWN0UPEjQ8NpD201douwf7Pu4seL84fzq7Izd3l9dnpDXGiqEZSaw2ikLYVuilrxWrnlOZV09bMqkIJ12pdWQHMVdRRaZltNG-ktEIyofLdRUdr3xz2Y8ormnefHHSd7SFMybCKFpxLzWVGD_-gr2GKfU5nmM5HKa6rTLE15WJIKUJrhujfbVwaRs2qA7PuwOQOzKoD85U1fK1Jme2fIf5y_lf0DfgUikQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1888877289</pqid></control><display><type>article</type><title>Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes</title><source>SpringerNature Journals</source><creator>Ersöz, Gülçin ; Yücedağ, İbrahim ; Bayrakdar, Sümeyye ; Altındal, Şemsettin ; Gümüş, Ahmet</creator><creatorcontrib>Ersöz, Gülçin ; Yücedağ, İbrahim ; Bayrakdar, Sümeyye ; Altındal, Şemsettin ; Gümüş, Ahmet</creatorcontrib><description>Au/PPy/n-Si (MPS) type Schottky barrier diodes (SBDs) were produced and their current–voltage (
I–V)
characteristics were measured in the positive and negative bias regions at 300 K. The basic electronic quantities such as reverse-saturation current (
I
o
), ideality factor (
n
), zero-bias barrier height (
Ф
B0
), series (
R
s
)
and shunt resistances (
R
sh
) were obtained by using
I–V
data in total darkness and illumination (100 W/m
2
). The values of these parameters were found as 7.79 × 10
−9
A, 5.41, 0.75 eV, 1 kΩ and 130 MΩ in dark) and 4 × 10
−9
A, 4.89, 0.77 eV, 0.9 kΩ and 1.02 MΩ under illumination), respectively. Also the energy density distribution behaviors of surface states (
N
ss
) have been acquired by calculation of effective barrier height (
Ф
e
) and ideality factor
n (V)
depending on voltage in total darkness and illumination. The values of
N
ss
show an exponentially increase from the mid-gap of Si to the lower part of conduction band (
E
c
) for two conditions. The possible current conduction mechanisms were determined by plotting of the double logarithmic
I–V
plots in the positive voltage zone and the value of current was found proportional to voltage (
I∼V
m
). The high values of
n
and
R
s
were ascribed to the certain density distribution of
N
ss
localized at semiconductor/PPy interface, surface conditions, barrier inequality, the thickness of PPy interlayer and its roughness. The open-circuit voltage of the photodiode was found as 0.36 V under 100 W/m
2
illumination level. This is evidence that the fabricated sample is very sensitive to illumination. Therefore, it can be put into practice in optoelectronic industries as a photodiode or solar cells.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-016-6326-z</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Barriers ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Darkness ; Diodes ; Electric potential ; Electronics ; Illumination ; Materials Science ; Optical and Electronic Materials ; Volt-ampere characteristics ; Voltage</subject><ispartof>Journal of materials science. Materials in electronics, 2017-05, Vol.28 (9), p.6413-6420</ispartof><rights>Springer Science+Business Media New York 2017</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, 2017.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-b88e345af38d6b71bcc7829dfb1a7473cf889a3e1c90c05a1ad82d55a35137373</citedby><cites>FETCH-LOGICAL-c349t-b88e345af38d6b71bcc7829dfb1a7473cf889a3e1c90c05a1ad82d55a35137373</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-016-6326-z$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-016-6326-z$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Ersöz, Gülçin</creatorcontrib><creatorcontrib>Yücedağ, İbrahim</creatorcontrib><creatorcontrib>Bayrakdar, Sümeyye</creatorcontrib><creatorcontrib>Altındal, Şemsettin</creatorcontrib><creatorcontrib>Gümüş, Ahmet</creatorcontrib><title>Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Au/PPy/n-Si (MPS) type Schottky barrier diodes (SBDs) were produced and their current–voltage (
I–V)
characteristics were measured in the positive and negative bias regions at 300 K. The basic electronic quantities such as reverse-saturation current (
I
o
), ideality factor (
n
), zero-bias barrier height (
Ф
B0
), series (
R
s
)
and shunt resistances (
R
sh
) were obtained by using
I–V
data in total darkness and illumination (100 W/m
2
). The values of these parameters were found as 7.79 × 10
−9
A, 5.41, 0.75 eV, 1 kΩ and 130 MΩ in dark) and 4 × 10
−9
A, 4.89, 0.77 eV, 0.9 kΩ and 1.02 MΩ under illumination), respectively. Also the energy density distribution behaviors of surface states (
N
ss
) have been acquired by calculation of effective barrier height (
Ф
e
) and ideality factor
n (V)
depending on voltage in total darkness and illumination. The values of
N
ss
show an exponentially increase from the mid-gap of Si to the lower part of conduction band (
E
c
) for two conditions. The possible current conduction mechanisms were determined by plotting of the double logarithmic
I–V
plots in the positive voltage zone and the value of current was found proportional to voltage (
I∼V
m
). The high values of
n
and
R
s
were ascribed to the certain density distribution of
N
ss
localized at semiconductor/PPy interface, surface conditions, barrier inequality, the thickness of PPy interlayer and its roughness. The open-circuit voltage of the photodiode was found as 0.36 V under 100 W/m
2
illumination level. This is evidence that the fabricated sample is very sensitive to illumination. Therefore, it can be put into practice in optoelectronic industries as a photodiode or solar cells.</description><subject>Barriers</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Darkness</subject><subject>Diodes</subject><subject>Electric potential</subject><subject>Electronics</subject><subject>Illumination</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Volt-ampere characteristics</subject><subject>Voltage</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp1kUtLxDAUhYMoOD5-gLuAG13EyaNp0qWIL1AcUMFdSNNbjdamJq0w_nozjAsRTBa5kO8czuUgdMDoCaNUzROjWhaEspKUgpfkawPNmFSCFJo_baIZraQiheR8G-2k9EopLQuhZ2i47j8hjf7Zjj70OLR4eAljIL5vJgcNhrYFN-L8BV0eone2w0MMA8TRQ1oJTqf5YrGc9-Te46Pbxf0xHpcD4OSy0fi2xLWN0UPEjQ8NpD201douwf7Pu4seL84fzq7Izd3l9dnpDXGiqEZSaw2ikLYVuilrxWrnlOZV09bMqkIJ12pdWQHMVdRRaZltNG-ktEIyofLdRUdr3xz2Y8ormnefHHSd7SFMybCKFpxLzWVGD_-gr2GKfU5nmM5HKa6rTLE15WJIKUJrhujfbVwaRs2qA7PuwOQOzKoD85U1fK1Jme2fIf5y_lf0DfgUikQ</recordid><startdate>20170501</startdate><enddate>20170501</enddate><creator>Ersöz, Gülçin</creator><creator>Yücedağ, İbrahim</creator><creator>Bayrakdar, Sümeyye</creator><creator>Altındal, Şemsettin</creator><creator>Gümüş, Ahmet</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20170501</creationdate><title>Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes</title><author>Ersöz, Gülçin ; Yücedağ, İbrahim ; Bayrakdar, Sümeyye ; Altındal, Şemsettin ; Gümüş, Ahmet</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-b88e345af38d6b71bcc7829dfb1a7473cf889a3e1c90c05a1ad82d55a35137373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Barriers</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Darkness</topic><topic>Diodes</topic><topic>Electric potential</topic><topic>Electronics</topic><topic>Illumination</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Volt-ampere characteristics</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ersöz, Gülçin</creatorcontrib><creatorcontrib>Yücedağ, İbrahim</creatorcontrib><creatorcontrib>Bayrakdar, Sümeyye</creatorcontrib><creatorcontrib>Altındal, Şemsettin</creatorcontrib><creatorcontrib>Gümüş, Ahmet</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ersöz, Gülçin</au><au>Yücedağ, İbrahim</au><au>Bayrakdar, Sümeyye</au><au>Altındal, Şemsettin</au><au>Gümüş, Ahmet</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2017-05-01</date><risdate>2017</risdate><volume>28</volume><issue>9</issue><spage>6413</spage><epage>6420</epage><pages>6413-6420</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Au/PPy/n-Si (MPS) type Schottky barrier diodes (SBDs) were produced and their current–voltage (
I–V)
characteristics were measured in the positive and negative bias regions at 300 K. The basic electronic quantities such as reverse-saturation current (
I
o
), ideality factor (
n
), zero-bias barrier height (
Ф
B0
), series (
R
s
)
and shunt resistances (
R
sh
) were obtained by using
I–V
data in total darkness and illumination (100 W/m
2
). The values of these parameters were found as 7.79 × 10
−9
A, 5.41, 0.75 eV, 1 kΩ and 130 MΩ in dark) and 4 × 10
−9
A, 4.89, 0.77 eV, 0.9 kΩ and 1.02 MΩ under illumination), respectively. Also the energy density distribution behaviors of surface states (
N
ss
) have been acquired by calculation of effective barrier height (
Ф
e
) and ideality factor
n (V)
depending on voltage in total darkness and illumination. The values of
N
ss
show an exponentially increase from the mid-gap of Si to the lower part of conduction band (
E
c
) for two conditions. The possible current conduction mechanisms were determined by plotting of the double logarithmic
I–V
plots in the positive voltage zone and the value of current was found proportional to voltage (
I∼V
m
). The high values of
n
and
R
s
were ascribed to the certain density distribution of
N
ss
localized at semiconductor/PPy interface, surface conditions, barrier inequality, the thickness of PPy interlayer and its roughness. The open-circuit voltage of the photodiode was found as 0.36 V under 100 W/m
2
illumination level. This is evidence that the fabricated sample is very sensitive to illumination. Therefore, it can be put into practice in optoelectronic industries as a photodiode or solar cells.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-016-6326-z</doi><tpages>8</tpages></addata></record> |
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source | SpringerNature Journals |
subjects | Barriers Characterization and Evaluation of Materials Chemistry and Materials Science Darkness Diodes Electric potential Electronics Illumination Materials Science Optical and Electronic Materials Volt-ampere characteristics Voltage |
title | Investigation of photo-induced effect on electrical properties of Au/PPy/n-Si (MPS) type schottky barrier diodes |
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