PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES

In general, the profile measuring machine uses the displacement sensor attached on movable mechanism in order to measure the object. It could measure the object profile by the amount of movement of the displacement sensor and output of the displacement sensor. When measuring the object, metrological...

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Veröffentlicht in:Proceedings in Manufacturing Systems 2016-06, Vol.11 (2), p.77-77
Hauptverfasser: Furutani, Ryoshu, Sugihara, Akira, Ozaki, Miyu
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Sugihara, Akira
Ozaki, Miyu
description In general, the profile measuring machine uses the displacement sensor attached on movable mechanism in order to measure the object. It could measure the object profile by the amount of movement of the displacement sensor and output of the displacement sensor. When measuring the object, metrological frame is important as a reference. If the metrological frame has some profile errors, the output of the displacement sensor includes the profile error of the metrological frame. We proposed a new method to distinguish the profile error of the metrological frame from the output of the displacement sensor. The proposed method requires two linear stages and the displacement sensor. Two linear stages are set and aligned in parallel; displacement sensor and object are mounted on each stage. The output of the displacement sensor can be obtained by the combination of the position of the two linear stages. The object profile and profile error of the movable mechanism are determined by calculation using only the output of the displacement sensor. The validity of the new method was confirmed by the simulation and experiment. It was confirmed to be possible to construct metrological frame less than 1 µm.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_1904211636</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>4113196511</sourcerecordid><originalsourceid>FETCH-LOGICAL-p616-6f5b0043eb19e1fe11ae1208e83d75bd79710d929adb0b65b83b8fec0bc296e13</originalsourceid><addsrcrecordid>eNpdjstqg0AYRqW00JDmHQa66UaYi85lKfLHCOOFcUKW4ugIDTZJY33_SttVV99ZHA7fQ7ChLGKhiAR9XBlzESrK5HOwm-czxpgqGnMpN0Fdm2qfa0AFJM3RQAGlRafcHqqjRQb2YKBMAYExlUFpVdSJycsM2VOFVky0Bo10XkJiUGOTDJqX4Gnsptnv_nYb2D3Y9BDqKsvTRIc3TnjIx9hhHDHviPJk9IR0nlAsvWSDiN0glCB4UFR1g8OOx04yJ0ffY9dTxT1h2-DtN3u7Xz8XP3-1H-9z76epu_jrMrdE4YgSwhlf1dd_6vm63C_ruZZITEX8Y30DHRxSqg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1802751636</pqid></control><display><type>article</type><title>PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Furutani, Ryoshu ; Sugihara, Akira ; Ozaki, Miyu</creator><creatorcontrib>Furutani, Ryoshu ; Sugihara, Akira ; Ozaki, Miyu</creatorcontrib><description>In general, the profile measuring machine uses the displacement sensor attached on movable mechanism in order to measure the object. It could measure the object profile by the amount of movement of the displacement sensor and output of the displacement sensor. When measuring the object, metrological frame is important as a reference. If the metrological frame has some profile errors, the output of the displacement sensor includes the profile error of the metrological frame. We proposed a new method to distinguish the profile error of the metrological frame from the output of the displacement sensor. The proposed method requires two linear stages and the displacement sensor. Two linear stages are set and aligned in parallel; displacement sensor and object are mounted on each stage. The output of the displacement sensor can be obtained by the combination of the position of the two linear stages. The object profile and profile error of the movable mechanism are determined by calculation using only the output of the displacement sensor. The validity of the new method was confirmed by the simulation and experiment. It was confirmed to be possible to construct metrological frame less than 1 µm.</description><identifier>ISSN: 2067-9238</identifier><identifier>EISSN: 2343-7472</identifier><language>eng</language><publisher>Bucharest: University "Politehnica" of Bucharest, Machine and Manufacturing Systems Department and Association ICMAS</publisher><subject>Displacement ; Error analysis ; Error detection ; Frames ; Linear equations ; Manufacturing ; Mathematical analysis ; Measurement techniques ; Metrology ; Process engineering ; Sensors ; Simulation ; Studies</subject><ispartof>Proceedings in Manufacturing Systems, 2016-06, Vol.11 (2), p.77-77</ispartof><rights>Copyright University "Politehnica" of Bucharest, Machine and Manufacturing Systems Department and Association ICMAS 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Furutani, Ryoshu</creatorcontrib><creatorcontrib>Sugihara, Akira</creatorcontrib><creatorcontrib>Ozaki, Miyu</creatorcontrib><title>PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES</title><title>Proceedings in Manufacturing Systems</title><description>In general, the profile measuring machine uses the displacement sensor attached on movable mechanism in order to measure the object. It could measure the object profile by the amount of movement of the displacement sensor and output of the displacement sensor. When measuring the object, metrological frame is important as a reference. If the metrological frame has some profile errors, the output of the displacement sensor includes the profile error of the metrological frame. We proposed a new method to distinguish the profile error of the metrological frame from the output of the displacement sensor. The proposed method requires two linear stages and the displacement sensor. Two linear stages are set and aligned in parallel; displacement sensor and object are mounted on each stage. The output of the displacement sensor can be obtained by the combination of the position of the two linear stages. The object profile and profile error of the movable mechanism are determined by calculation using only the output of the displacement sensor. The validity of the new method was confirmed by the simulation and experiment. It was confirmed to be possible to construct metrological frame less than 1 µm.</description><subject>Displacement</subject><subject>Error analysis</subject><subject>Error detection</subject><subject>Frames</subject><subject>Linear equations</subject><subject>Manufacturing</subject><subject>Mathematical analysis</subject><subject>Measurement techniques</subject><subject>Metrology</subject><subject>Process engineering</subject><subject>Sensors</subject><subject>Simulation</subject><subject>Studies</subject><issn>2067-9238</issn><issn>2343-7472</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNpdjstqg0AYRqW00JDmHQa66UaYi85lKfLHCOOFcUKW4ugIDTZJY33_SttVV99ZHA7fQ7ChLGKhiAR9XBlzESrK5HOwm-czxpgqGnMpN0Fdm2qfa0AFJM3RQAGlRafcHqqjRQb2YKBMAYExlUFpVdSJycsM2VOFVky0Bo10XkJiUGOTDJqX4Gnsptnv_nYb2D3Y9BDqKsvTRIc3TnjIx9hhHDHviPJk9IR0nlAsvWSDiN0glCB4UFR1g8OOx04yJ0ffY9dTxT1h2-DtN3u7Xz8XP3-1H-9z76epu_jrMrdE4YgSwhlf1dd_6vm63C_ruZZITEX8Y30DHRxSqg</recordid><startdate>20160601</startdate><enddate>20160601</enddate><creator>Furutani, Ryoshu</creator><creator>Sugihara, Akira</creator><creator>Ozaki, Miyu</creator><general>University "Politehnica" of Bucharest, Machine and Manufacturing Systems Department and Association ICMAS</general><scope>3V.</scope><scope>7TB</scope><scope>7WY</scope><scope>7WZ</scope><scope>7X5</scope><scope>7XB</scope><scope>87Z</scope><scope>8A3</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>BYOGL</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>K60</scope><scope>K6~</scope><scope>L.-</scope><scope>L6V</scope><scope>M0C</scope><scope>M2O</scope><scope>M7S</scope><scope>MBDVC</scope><scope>PADUT</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>20160601</creationdate><title>PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES</title><author>Furutani, Ryoshu ; Sugihara, Akira ; Ozaki, Miyu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p616-6f5b0043eb19e1fe11ae1208e83d75bd79710d929adb0b65b83b8fec0bc296e13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Displacement</topic><topic>Error analysis</topic><topic>Error detection</topic><topic>Frames</topic><topic>Linear equations</topic><topic>Manufacturing</topic><topic>Mathematical analysis</topic><topic>Measurement techniques</topic><topic>Metrology</topic><topic>Process engineering</topic><topic>Sensors</topic><topic>Simulation</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Furutani, Ryoshu</creatorcontrib><creatorcontrib>Sugihara, Akira</creatorcontrib><creatorcontrib>Ozaki, Miyu</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>Entrepreneurship Database</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Entrepreneurship Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>East Europe, Central Europe Database</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Global</collection><collection>Research Library</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Research Library China</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Proceedings in Manufacturing Systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Furutani, Ryoshu</au><au>Sugihara, Akira</au><au>Ozaki, Miyu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES</atitle><jtitle>Proceedings in Manufacturing Systems</jtitle><date>2016-06-01</date><risdate>2016</risdate><volume>11</volume><issue>2</issue><spage>77</spage><epage>77</epage><pages>77-77</pages><issn>2067-9238</issn><eissn>2343-7472</eissn><abstract>In general, the profile measuring machine uses the displacement sensor attached on movable mechanism in order to measure the object. It could measure the object profile by the amount of movement of the displacement sensor and output of the displacement sensor. When measuring the object, metrological frame is important as a reference. If the metrological frame has some profile errors, the output of the displacement sensor includes the profile error of the metrological frame. We proposed a new method to distinguish the profile error of the metrological frame from the output of the displacement sensor. The proposed method requires two linear stages and the displacement sensor. Two linear stages are set and aligned in parallel; displacement sensor and object are mounted on each stage. The output of the displacement sensor can be obtained by the combination of the position of the two linear stages. The object profile and profile error of the movable mechanism are determined by calculation using only the output of the displacement sensor. The validity of the new method was confirmed by the simulation and experiment. It was confirmed to be possible to construct metrological frame less than 1 µm.</abstract><cop>Bucharest</cop><pub>University "Politehnica" of Bucharest, Machine and Manufacturing Systems Department and Association ICMAS</pub><tpages>1</tpages></addata></record>
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source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals
subjects Displacement
Error analysis
Error detection
Frames
Linear equations
Manufacturing
Mathematical analysis
Measurement techniques
Metrology
Process engineering
Sensors
Simulation
Studies
title PROFILE MEASUREMENT WITHOUT REFERENCE ERROR COMPARING TWO PARALLEL LINEAR STAGES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T07%3A34%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=PROFILE%20MEASUREMENT%20WITHOUT%20REFERENCE%20ERROR%20COMPARING%20TWO%20PARALLEL%20LINEAR%20STAGES&rft.jtitle=Proceedings%20in%20Manufacturing%20Systems&rft.au=Furutani,%20Ryoshu&rft.date=2016-06-01&rft.volume=11&rft.issue=2&rft.spage=77&rft.epage=77&rft.pages=77-77&rft.issn=2067-9238&rft.eissn=2343-7472&rft_id=info:doi/&rft_dat=%3Cproquest%3E4113196511%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1802751636&rft_id=info:pmid/&rfr_iscdi=true