Studies of Cu‐doped ZnS thin films prepared by sputtering technique

Radio frequency magnetron sputtering technique has been used to deposit Cu‐doped ZnS thin films on glass and n‐type Si(100) substrates at room temperature. Crystalline structure, surface morphology, and elemental oxidation states have been studied by X‐ray diffraction, field emission scanning electr...

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Veröffentlicht in:	Surface and interface analysis 2017-04, Vol.49 (4), p.284-290
Hauptverfasser:	Sreedhar, M., Neelakanta Reddy, I., Bera, Parthasarathi, Shyju, T. S., Anandan, C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorbance Cu/ZnS Diffraction Dopants microstructure optical properties Reflectance sputtering Thin films Transmittance X ray diffraction XPS Zinc sulfides
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