Graphene specimen support technique for low voltage STEM imaging

The scanning transmission electron microscopy (STEM) mode of today's field emission scanning electron microscopes enables sub-nanometer resolution imaging. Graphene is a single-atom thick, electrically conductive material, making it an excellent specimen support for the low voltage STEM imaging...

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Veröffentlicht in:	Journal of electron microscopy 2017-08, Vol.66 (4), p.261-271
Hauptverfasser:	Yamashita, Masao, Leyden, Matthew Ryan, Adaniya, Hidehito, Cheung, Martin Philip, Hirai, Teruhisa, Qi, Yabing, Shintake, Tsumoru
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic properties Atomic structure Biological properties Biological samples Carbon Electron microscopy Electron spin Electrons Field emission microscopy Fine structure Graphene Hydrophobicity Imaging Low voltage Methylamine Microscopes Scanning electron microscopy Scanning transmission electron microscopy Sedimentation Spectrum analysis Stains Transmission electron microscopy Ultrastructure Vanadate Viruses Voltage
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