Metrological Support for Opto-Electronic Coordinate Measurements
Issues related to metrological support for coordinate measurements and wide-range laser measurement systems (trackers, ground scanners, interferometers, robotic electronic tacheometers) are discussed.
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| Veröffentlicht in: | Measurement techniques 2017, Vol.59 (10), p.1073-1077 |
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| container_end_page | 1077 |
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| container_issue | 10 |
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| container_title | Measurement techniques |
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| creator | Golygin, N. Kh Lysenko, V. G. Khizhnyakov, V. A. |
| description | Issues related to metrological support for coordinate measurements and wide-range laser measurement systems (trackers, ground scanners, interferometers, robotic electronic tacheometers) are discussed. |
| doi_str_mv | 10.1007/s11018-017-1094-6 |
| format | Article |
| fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_1884125306</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A551030953</galeid><sourcerecordid>A551030953</sourcerecordid><originalsourceid>FETCH-LOGICAL-c475t-b34ca76edcbae746532a06dba49075351ae08421289aaa082e52726da0be8483</originalsourceid><addsrcrecordid>eNp1kcFq3DAQhkVpoNs0D5CboZf2oHQkWZZ8a1jSNpAQSHIXs_J4cfBariRD8_bR4h6aQtBhQPN9ww8_Y-cCLgSA-ZaEAGE5CMMFtDVv3rGN0EZx20Lznm1A14qL1sgP7GNKTwCgTNNu2PdbyjGMYT94HKuHZZ5DzFUfYnU358CvRvJlPw2-2oYQu2HCTNUtYVoiHWjK6RM76XFMdPZ3nrLHH1eP21_85u7n9fbyhvva6Mx3qvZoGur8DsnUjVYSoel2WLdgtNICCWwthbQtIoKVpKWRTYewI1tbdcq-rGfnGH4vlLI7DMnTOOJEYUlOWFsLqRU0Bf38H_oUljiVcE60EkBbAFGoi5Xa40humPqQI_ryOjoMPkzUD-X_UmsBClqtivD1lVCYTH_yHpeU3PXD_WtWrKyPIaVIvZvjcMD47AS4Y19u7cuVvtyxL3eMLVcnFXbaU_wn9pvSC1hUlY0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1920058001</pqid></control><display><type>article</type><title>Metrological Support for Opto-Electronic Coordinate Measurements</title><source>Springer Nature - Complete Springer Journals</source><creator>Golygin, N. Kh ; Lysenko, V. G. ; Khizhnyakov, V. A.</creator><creatorcontrib>Golygin, N. Kh ; Lysenko, V. G. ; Khizhnyakov, V. A.</creatorcontrib><description>Issues related to metrological support for coordinate measurements and wide-range laser measurement systems (trackers, ground scanners, interferometers, robotic electronic tacheometers) are discussed.</description><identifier>ISSN: 0543-1972</identifier><identifier>EISSN: 1573-8906</identifier><identifier>DOI: 10.1007/s11018-017-1094-6</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Aircraft industry ; Analytical Chemistry ; Characterization and Evaluation of Materials ; Electronics ; Gas pipeline construction ; Grounds ; Hydroelectric construction ; Hydroelectric power ; Hydroelectric power plants ; Interferometers ; Lasers ; Measurement ; Measurement Science and Instrumentation ; Measurement techniques ; Metrology ; Optoelectronics ; Optoelectronics industry ; Optophysical Measurements ; Physical Chemistry ; Physics ; Physics and Astronomy ; Robotics ; Scanners</subject><ispartof>Measurement techniques, 2017, Vol.59 (10), p.1073-1077</ispartof><rights>Springer Science+Business Media New York 2017</rights><rights>COPYRIGHT 2017 Springer</rights><rights>Measurement Techniques is a copyright of Springer, 2017.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c475t-b34ca76edcbae746532a06dba49075351ae08421289aaa082e52726da0be8483</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11018-017-1094-6$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11018-017-1094-6$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Golygin, N. Kh</creatorcontrib><creatorcontrib>Lysenko, V. G.</creatorcontrib><creatorcontrib>Khizhnyakov, V. A.</creatorcontrib><title>Metrological Support for Opto-Electronic Coordinate Measurements</title><title>Measurement techniques</title><addtitle>Meas Tech</addtitle><description>Issues related to metrological support for coordinate measurements and wide-range laser measurement systems (trackers, ground scanners, interferometers, robotic electronic tacheometers) are discussed.</description><subject>Aircraft industry</subject><subject>Analytical Chemistry</subject><subject>Characterization and Evaluation of Materials</subject><subject>Electronics</subject><subject>Gas pipeline construction</subject><subject>Grounds</subject><subject>Hydroelectric construction</subject><subject>Hydroelectric power</subject><subject>Hydroelectric power plants</subject><subject>Interferometers</subject><subject>Lasers</subject><subject>Measurement</subject><subject>Measurement Science and Instrumentation</subject><subject>Measurement techniques</subject><subject>Metrology</subject><subject>Optoelectronics</subject><subject>Optoelectronics industry</subject><subject>Optophysical Measurements</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Robotics</subject><subject>Scanners</subject><issn>0543-1972</issn><issn>1573-8906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp1kcFq3DAQhkVpoNs0D5CboZf2oHQkWZZ8a1jSNpAQSHIXs_J4cfBariRD8_bR4h6aQtBhQPN9ww8_Y-cCLgSA-ZaEAGE5CMMFtDVv3rGN0EZx20Lznm1A14qL1sgP7GNKTwCgTNNu2PdbyjGMYT94HKuHZZ5DzFUfYnU358CvRvJlPw2-2oYQu2HCTNUtYVoiHWjK6RM76XFMdPZ3nrLHH1eP21_85u7n9fbyhvva6Mx3qvZoGur8DsnUjVYSoel2WLdgtNICCWwthbQtIoKVpKWRTYewI1tbdcq-rGfnGH4vlLI7DMnTOOJEYUlOWFsLqRU0Bf38H_oUljiVcE60EkBbAFGoi5Xa40humPqQI_ryOjoMPkzUD-X_UmsBClqtivD1lVCYTH_yHpeU3PXD_WtWrKyPIaVIvZvjcMD47AS4Y19u7cuVvtyxL3eMLVcnFXbaU_wn9pvSC1hUlY0</recordid><startdate>2017</startdate><enddate>2017</enddate><creator>Golygin, N. Kh</creator><creator>Lysenko, V. G.</creator><creator>Khizhnyakov, V. A.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>7U5</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88I</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>2017</creationdate><title>Metrological Support for Opto-Electronic Coordinate Measurements</title><author>Golygin, N. Kh ; Lysenko, V. G. ; Khizhnyakov, V. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c475t-b34ca76edcbae746532a06dba49075351ae08421289aaa082e52726da0be8483</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Aircraft industry</topic><topic>Analytical Chemistry</topic><topic>Characterization and Evaluation of Materials</topic><topic>Electronics</topic><topic>Gas pipeline construction</topic><topic>Grounds</topic><topic>Hydroelectric construction</topic><topic>Hydroelectric power</topic><topic>Hydroelectric power plants</topic><topic>Interferometers</topic><topic>Lasers</topic><topic>Measurement</topic><topic>Measurement Science and Instrumentation</topic><topic>Measurement techniques</topic><topic>Metrology</topic><topic>Optoelectronics</topic><topic>Optoelectronics industry</topic><topic>Optophysical Measurements</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Robotics</topic><topic>Scanners</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Golygin, N. Kh</creatorcontrib><creatorcontrib>Lysenko, V. G.</creatorcontrib><creatorcontrib>Khizhnyakov, V. A.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>One Business (ProQuest)</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Measurement techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Golygin, N. Kh</au><au>Lysenko, V. G.</au><au>Khizhnyakov, V. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Metrological Support for Opto-Electronic Coordinate Measurements</atitle><jtitle>Measurement techniques</jtitle><stitle>Meas Tech</stitle><date>2017</date><risdate>2017</risdate><volume>59</volume><issue>10</issue><spage>1073</spage><epage>1077</epage><pages>1073-1077</pages><issn>0543-1972</issn><eissn>1573-8906</eissn><abstract>Issues related to metrological support for coordinate measurements and wide-range laser measurement systems (trackers, ground scanners, interferometers, robotic electronic tacheometers) are discussed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11018-017-1094-6</doi><tpages>5</tpages></addata></record> |
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| source | Springer Nature - Complete Springer Journals |
| subjects | Aircraft industry Analytical Chemistry Characterization and Evaluation of Materials Electronics Gas pipeline construction Grounds Hydroelectric construction Hydroelectric power Hydroelectric power plants Interferometers Lasers Measurement Measurement Science and Instrumentation Measurement techniques Metrology Optoelectronics Optoelectronics industry Optophysical Measurements Physical Chemistry Physics Physics and Astronomy Robotics Scanners |
| title | Metrological Support for Opto-Electronic Coordinate Measurements |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T06%3A02%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Metrological%20Support%20for%20Opto-Electronic%20Coordinate%20Measurements&rft.jtitle=Measurement%20techniques&rft.au=Golygin,%20N.%20Kh&rft.date=2017&rft.volume=59&rft.issue=10&rft.spage=1073&rft.epage=1077&rft.pages=1073-1077&rft.issn=0543-1972&rft.eissn=1573-8906&rft_id=info:doi/10.1007/s11018-017-1094-6&rft_dat=%3Cgale_proqu%3EA551030953%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1920058001&rft_id=info:pmid/&rft_galeid=A551030953&rfr_iscdi=true |