Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram

We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement...

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Veröffentlicht in:Measurement techniques 2016-02, Vol.58 (11), p.1228-1233
Hauptverfasser: Vishnyakov, G. N., Levin, G. G., Minaev, V. L.
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container_title Measurement techniques
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creator Vishnyakov, G. N.
Levin, G. G.
Minaev, V. L.
description We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement error.
doi_str_mv 10.1007/s11018-016-0875-7
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fullrecord <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_1884124168</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A445783928</galeid><sourcerecordid>A445783928</sourcerecordid><originalsourceid>FETCH-LOGICAL-c475t-b40a97716338cf0a35661a0934d621a7794f6397e1eab20039ec17255ac26fc03</originalsourceid><addsrcrecordid>eNp1kU2LFDEQhoMoOK7-AG8BL3roNdX56hyHxY-BXVYcPYdspjLTS3dnTNKw--9N0x5cQepQRfG8RVW9hLwFdgmM6Y8ZgEHXMFAN67Rs9DOyAal50xmmnpMNk4I3YHT7krzK-Z4xxrUyG3K7P6MvyQ10O7nhMfeZxkDLCekNllM80BBTLV2eUz8d6beTy0j3pz4UGlIcqZvobiqYAqZ4TG58TV4EN2R88ydfkJ-fP_24-tpc337ZXW2vGy-0LM2dYM5oDYrzzgfmuFQKHDNcHFQLTmsjguJGI6C7a-uyBj3oVkrnWxU84xfk_Tr3nOKvGXOxY589DoObMM7ZQtcJaAWorqLv_kHv45zqtQulJGcahKjU5Uod3YC2n0KsX_E1Djj2Pk4Y-trfCiF1x027jP3wRFCZgg_l6Oac7W7__SkLK-tTzDlhsOfUjy49WmB28c-u_tnqn138s7pq2lWTz8vrMf219n9FvwHp_pna</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1865307144</pqid></control><display><type>article</type><title>Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram</title><source>SpringerLink Journals - AutoHoldings</source><creator>Vishnyakov, G. N. ; Levin, G. G. ; Minaev, V. L.</creator><creatorcontrib>Vishnyakov, G. N. ; Levin, G. G. ; Minaev, V. L.</creatorcontrib><description>We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement error.</description><identifier>ISSN: 0543-1972</identifier><identifier>EISSN: 1573-8906</identifier><identifier>DOI: 10.1007/s11018-016-0875-7</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Additives ; Analytical Chemistry ; Approximation ; Characterization and Evaluation of Materials ; Error analysis ; Errors ; Fourier transforms ; Interferometry ; Measurement errors ; Measurement Science and Instrumentation ; Measurement techniques ; Noise ; Noise measurement ; Phase shift ; Physical Chemistry ; Physics ; Physics and Astronomy ; Spectra ; Studies</subject><ispartof>Measurement techniques, 2016-02, Vol.58 (11), p.1228-1233</ispartof><rights>Springer Science+Business Media New York 2016</rights><rights>COPYRIGHT 2016 Springer</rights><rights>Measurement Techniques is a copyright of Springer, 2016.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c475t-b40a97716338cf0a35661a0934d621a7794f6397e1eab20039ec17255ac26fc03</citedby><cites>FETCH-LOGICAL-c475t-b40a97716338cf0a35661a0934d621a7794f6397e1eab20039ec17255ac26fc03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11018-016-0875-7$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11018-016-0875-7$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Vishnyakov, G. N.</creatorcontrib><creatorcontrib>Levin, G. G.</creatorcontrib><creatorcontrib>Minaev, V. L.</creatorcontrib><title>Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram</title><title>Measurement techniques</title><addtitle>Meas Tech</addtitle><description>We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement error.</description><subject>Additives</subject><subject>Analytical Chemistry</subject><subject>Approximation</subject><subject>Characterization and Evaluation of Materials</subject><subject>Error analysis</subject><subject>Errors</subject><subject>Fourier transforms</subject><subject>Interferometry</subject><subject>Measurement errors</subject><subject>Measurement Science and Instrumentation</subject><subject>Measurement techniques</subject><subject>Noise</subject><subject>Noise measurement</subject><subject>Phase shift</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Spectra</subject><subject>Studies</subject><issn>0543-1972</issn><issn>1573-8906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kU2LFDEQhoMoOK7-AG8BL3roNdX56hyHxY-BXVYcPYdspjLTS3dnTNKw--9N0x5cQepQRfG8RVW9hLwFdgmM6Y8ZgEHXMFAN67Rs9DOyAal50xmmnpMNk4I3YHT7krzK-Z4xxrUyG3K7P6MvyQ10O7nhMfeZxkDLCekNllM80BBTLV2eUz8d6beTy0j3pz4UGlIcqZvobiqYAqZ4TG58TV4EN2R88ydfkJ-fP_24-tpc337ZXW2vGy-0LM2dYM5oDYrzzgfmuFQKHDNcHFQLTmsjguJGI6C7a-uyBj3oVkrnWxU84xfk_Tr3nOKvGXOxY589DoObMM7ZQtcJaAWorqLv_kHv45zqtQulJGcahKjU5Uod3YC2n0KsX_E1Djj2Pk4Y-trfCiF1x027jP3wRFCZgg_l6Oac7W7__SkLK-tTzDlhsOfUjy49WmB28c-u_tnqn138s7pq2lWTz8vrMf219n9FvwHp_pna</recordid><startdate>20160201</startdate><enddate>20160201</enddate><creator>Vishnyakov, G. N.</creator><creator>Levin, G. G.</creator><creator>Minaev, V. L.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>7U5</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88I</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>20160201</creationdate><title>Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram</title><author>Vishnyakov, G. N. ; Levin, G. G. ; Minaev, V. L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c475t-b40a97716338cf0a35661a0934d621a7794f6397e1eab20039ec17255ac26fc03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Additives</topic><topic>Analytical Chemistry</topic><topic>Approximation</topic><topic>Characterization and Evaluation of Materials</topic><topic>Error analysis</topic><topic>Errors</topic><topic>Fourier transforms</topic><topic>Interferometry</topic><topic>Measurement errors</topic><topic>Measurement Science and Instrumentation</topic><topic>Measurement techniques</topic><topic>Noise</topic><topic>Noise measurement</topic><topic>Phase shift</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Spectra</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vishnyakov, G. N.</creatorcontrib><creatorcontrib>Levin, G. G.</creatorcontrib><creatorcontrib>Minaev, V. L.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Measurement techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vishnyakov, G. N.</au><au>Levin, G. G.</au><au>Minaev, V. L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram</atitle><jtitle>Measurement techniques</jtitle><stitle>Meas Tech</stitle><date>2016-02-01</date><risdate>2016</risdate><volume>58</volume><issue>11</issue><spage>1228</spage><epage>1233</epage><pages>1228-1233</pages><issn>0543-1972</issn><eissn>1573-8906</eissn><abstract>We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement error.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11018-016-0875-7</doi><tpages>6</tpages></addata></record>
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1573-8906
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subjects Additives
Analytical Chemistry
Approximation
Characterization and Evaluation of Materials
Error analysis
Errors
Fourier transforms
Interferometry
Measurement errors
Measurement Science and Instrumentation
Measurement techniques
Noise
Noise measurement
Phase shift
Physical Chemistry
Physics
Physics and Astronomy
Spectra
Studies
title Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T07%3A42%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Spectral%20Analysis%20of%20the%20Method%20for%20Measuring%20Phase%20Shift%20from%20an%20Interferogram&rft.jtitle=Measurement%20techniques&rft.au=Vishnyakov,%20G.%20N.&rft.date=2016-02-01&rft.volume=58&rft.issue=11&rft.spage=1228&rft.epage=1233&rft.pages=1228-1233&rft.issn=0543-1972&rft.eissn=1573-8906&rft_id=info:doi/10.1007/s11018-016-0875-7&rft_dat=%3Cgale_proqu%3EA445783928%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1865307144&rft_id=info:pmid/&rft_galeid=A445783928&rfr_iscdi=true