Improvement of the Standards Base for Optophysical Measurements
The standards base of the All-Russia Research Institute of Optophysical Measurements (VNIIOFI), the status and calibration capabilities of national primary standards, and further prospects for their development in various areas are discussed.
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Veröffentlicht in: | Measurement techniques 2016-02, Vol.58 (11), p.1189-1194 |
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creator | Golubev, S. S. Krutikov, V. N. Ivanov, V. S. Zolotarevskii, Yu. M. Muravskaya, N. P. Negoda, S. N. |
description | The standards base of the All-Russia Research Institute of Optophysical Measurements (VNIIOFI), the status and calibration capabilities of national primary standards, and further prospects for their development in various areas are discussed. |
doi_str_mv | 10.1007/s11018-016-0867-7 |
format | Article |
fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_1884110474</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A445783925</galeid><sourcerecordid>A445783925</sourcerecordid><originalsourceid>FETCH-LOGICAL-c427t-c49b9cc4a4b4392b069c632a94af5689ce4b450524f66a59f711fd983fa990dd3</originalsourceid><addsrcrecordid>eNp1kV1LHDEUhkOp4Fb9Ad4NeFMvxp7M5GNyJSq2XbAIflyHbCZZR2Ym25yMuP_erNOLWiiBBJLnObzkJeSYwhkFkN-QUqBNCVSU0AhZyk9kQbmsy0aB-EwWwFldUiWrffIF8RkAainUgpwvh00ML25wYyqCL9KTK-6TGVsTWywuDbrCh1jcblLYPG2xs6YvfjmDU3xX8JDsedOjO_pzHpDH79cPVz_Lm9sfy6uLm9KySqa8q5Wylhm2YrWqViCUFXVlFDOei0ZZlx848Ip5IQxXXlLqW9XU3igFbVsfkK_z3Jz29-Qw6aFD6_rejC5MqGnTsPwFTLKMnvyDPocpjjldpgSvQcI7dTZTa9M73Y0-pGhsXq0bOhtG57t8f8EYl01OzLNw-kHITHKvaW0mRL28v_vI0pm1MSBG5_UmdoOJW01B7_rSc18696V3fWmZnWp2MLPj2sW_Yv9XegPiIZWA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1865307074</pqid></control><display><type>article</type><title>Improvement of the Standards Base for Optophysical Measurements</title><source>Springer Nature - Complete Springer Journals</source><creator>Golubev, S. S. ; Krutikov, V. N. ; Ivanov, V. S. ; Zolotarevskii, Yu. M. ; Muravskaya, N. P. ; Negoda, S. N.</creator><creatorcontrib>Golubev, S. S. ; Krutikov, V. N. ; Ivanov, V. S. ; Zolotarevskii, Yu. M. ; Muravskaya, N. P. ; Negoda, S. N.</creatorcontrib><description>The standards base of the All-Russia Research Institute of Optophysical Measurements (VNIIOFI), the status and calibration capabilities of national primary standards, and further prospects for their development in various areas are discussed.</description><identifier>ISSN: 0543-1972</identifier><identifier>EISSN: 1573-8906</identifier><identifier>DOI: 10.1007/s11018-016-0867-7</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Analytical Chemistry ; Calibration ; Characterization and Evaluation of Materials ; Lasers ; Measurement Science and Instrumentation ; Measurement techniques ; On the Jubilee of Vniiofi ; Physical Chemistry ; Physics ; Physics and Astronomy ; Propagation ; R&D ; Radiation ; Research & development ; Research facilities ; Studies</subject><ispartof>Measurement techniques, 2016-02, Vol.58 (11), p.1189-1194</ispartof><rights>Springer Science+Business Media New York 2015</rights><rights>COPYRIGHT 2016 Springer</rights><rights>Measurement Techniques is a copyright of Springer, 2016.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11018-016-0867-7$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11018-016-0867-7$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Golubev, S. S.</creatorcontrib><creatorcontrib>Krutikov, V. N.</creatorcontrib><creatorcontrib>Ivanov, V. S.</creatorcontrib><creatorcontrib>Zolotarevskii, Yu. M.</creatorcontrib><creatorcontrib>Muravskaya, N. P.</creatorcontrib><creatorcontrib>Negoda, S. N.</creatorcontrib><title>Improvement of the Standards Base for Optophysical Measurements</title><title>Measurement techniques</title><addtitle>Meas Tech</addtitle><description>The standards base of the All-Russia Research Institute of Optophysical Measurements (VNIIOFI), the status and calibration capabilities of national primary standards, and further prospects for their development in various areas are discussed.</description><subject>Analytical Chemistry</subject><subject>Calibration</subject><subject>Characterization and Evaluation of Materials</subject><subject>Lasers</subject><subject>Measurement Science and Instrumentation</subject><subject>Measurement techniques</subject><subject>On the Jubilee of Vniiofi</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Propagation</subject><subject>R&D</subject><subject>Radiation</subject><subject>Research & development</subject><subject>Research facilities</subject><subject>Studies</subject><issn>0543-1972</issn><issn>1573-8906</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kV1LHDEUhkOp4Fb9Ad4NeFMvxp7M5GNyJSq2XbAIflyHbCZZR2Ym25yMuP_erNOLWiiBBJLnObzkJeSYwhkFkN-QUqBNCVSU0AhZyk9kQbmsy0aB-EwWwFldUiWrffIF8RkAainUgpwvh00ML25wYyqCL9KTK-6TGVsTWywuDbrCh1jcblLYPG2xs6YvfjmDU3xX8JDsedOjO_pzHpDH79cPVz_Lm9sfy6uLm9KySqa8q5Wylhm2YrWqViCUFXVlFDOei0ZZlx848Ip5IQxXXlLqW9XU3igFbVsfkK_z3Jz29-Qw6aFD6_rejC5MqGnTsPwFTLKMnvyDPocpjjldpgSvQcI7dTZTa9M73Y0-pGhsXq0bOhtG57t8f8EYl01OzLNw-kHITHKvaW0mRL28v_vI0pm1MSBG5_UmdoOJW01B7_rSc18696V3fWmZnWp2MLPj2sW_Yv9XegPiIZWA</recordid><startdate>20160201</startdate><enddate>20160201</enddate><creator>Golubev, S. S.</creator><creator>Krutikov, V. N.</creator><creator>Ivanov, V. S.</creator><creator>Zolotarevskii, Yu. M.</creator><creator>Muravskaya, N. P.</creator><creator>Negoda, S. N.</creator><general>Springer US</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>7U5</scope><scope>7WY</scope><scope>7WZ</scope><scope>7XB</scope><scope>87Z</scope><scope>88I</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>F~G</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0C</scope><scope>M0N</scope><scope>M2P</scope><scope>M7S</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>PYYUZ</scope><scope>Q9U</scope></search><sort><creationdate>20160201</creationdate><title>Improvement of the Standards Base for Optophysical Measurements</title><author>Golubev, S. S. ; Krutikov, V. N. ; Ivanov, V. S. ; Zolotarevskii, Yu. M. ; Muravskaya, N. P. ; Negoda, S. N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c427t-c49b9cc4a4b4392b069c632a94af5689ce4b450524f66a59f711fd983fa990dd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Analytical Chemistry</topic><topic>Calibration</topic><topic>Characterization and Evaluation of Materials</topic><topic>Lasers</topic><topic>Measurement Science and Instrumentation</topic><topic>Measurement techniques</topic><topic>On the Jubilee of Vniiofi</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Propagation</topic><topic>R&D</topic><topic>Radiation</topic><topic>Research & development</topic><topic>Research facilities</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Golubev, S. S.</creatorcontrib><creatorcontrib>Krutikov, V. N.</creatorcontrib><creatorcontrib>Ivanov, V. S.</creatorcontrib><creatorcontrib>Zolotarevskii, Yu. M.</creatorcontrib><creatorcontrib>Muravskaya, N. P.</creatorcontrib><creatorcontrib>Negoda, S. N.</creatorcontrib><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>One Business (ProQuest)</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><collection>ABI/INFORM Collection China</collection><collection>ProQuest Central Basic</collection><jtitle>Measurement techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Golubev, S. S.</au><au>Krutikov, V. N.</au><au>Ivanov, V. S.</au><au>Zolotarevskii, Yu. M.</au><au>Muravskaya, N. P.</au><au>Negoda, S. N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improvement of the Standards Base for Optophysical Measurements</atitle><jtitle>Measurement techniques</jtitle><stitle>Meas Tech</stitle><date>2016-02-01</date><risdate>2016</risdate><volume>58</volume><issue>11</issue><spage>1189</spage><epage>1194</epage><pages>1189-1194</pages><issn>0543-1972</issn><eissn>1573-8906</eissn><abstract>The standards base of the All-Russia Research Institute of Optophysical Measurements (VNIIOFI), the status and calibration capabilities of national primary standards, and further prospects for their development in various areas are discussed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11018-016-0867-7</doi><tpages>6</tpages></addata></record> |
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subjects | Analytical Chemistry Calibration Characterization and Evaluation of Materials Lasers Measurement Science and Instrumentation Measurement techniques On the Jubilee of Vniiofi Physical Chemistry Physics Physics and Astronomy Propagation R&D Radiation Research & development Research facilities Studies |
title | Improvement of the Standards Base for Optophysical Measurements |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T23%3A20%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improvement%20of%20the%20Standards%20Base%20for%20Optophysical%20Measurements&rft.jtitle=Measurement%20techniques&rft.au=Golubev,%20S.%20S.&rft.date=2016-02-01&rft.volume=58&rft.issue=11&rft.spage=1189&rft.epage=1194&rft.pages=1189-1194&rft.issn=0543-1972&rft.eissn=1573-8906&rft_id=info:doi/10.1007/s11018-016-0867-7&rft_dat=%3Cgale_proqu%3EA445783925%3C/gale_proqu%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1865307074&rft_id=info:pmid/&rft_galeid=A445783925&rfr_iscdi=true |