Transmission electron microscopy as a realistic data source for the micromagnetic simulation of polycrystalline nickel nanowires
[Display omitted] Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested forma...
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| Veröffentlicht in: | Computational materials science 2017-02, Vol.128, p.42-44 |
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| container_title | Computational materials science |
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| creator | França, C.A. Guerra, Y. Valadão, D.R.B. Holanda, J. Padrón-Hernández, E. |
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Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested format was used for the generation of the finite elements network in the numerical model using NMAG. The resolved equations generated the coercivity field dependence with the angle of application of the external magnetic field. The same analysis was carried out for the magnetic remanence data and compared with the experimental results. Our results show the significant importance of electron microscopy analysis in the magnetic studies using realistic models. The problem of the reversion for the magnetic moments in magnetic nanowires is an unresolved question and our proposal is that reversion studies need start in the previous microscopy analyses of the real microstructure of nanowires. |
| doi_str_mv | 10.1016/j.commatsci.2016.11.007 |
| format | Article |
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Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested format was used for the generation of the finite elements network in the numerical model using NMAG. The resolved equations generated the coercivity field dependence with the angle of application of the external magnetic field. The same analysis was carried out for the magnetic remanence data and compared with the experimental results. Our results show the significant importance of electron microscopy analysis in the magnetic studies using realistic models. The problem of the reversion for the magnetic moments in magnetic nanowires is an unresolved question and our proposal is that reversion studies need start in the previous microscopy analyses of the real microstructure of nanowires.</description><identifier>ISSN: 0927-0256</identifier><identifier>EISSN: 1879-0801</identifier><identifier>DOI: 10.1016/j.commatsci.2016.11.007</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Coercivity ; Computer simulation ; Format ; Magnetic nanowires ; Magnetic remanence ; Mathematical analysis ; Mathematical models ; Micromagnetic simulation ; Nanowires ; Nickel ; Reversion ; Transmission electron microscopy</subject><ispartof>Computational materials science, 2017-02, Vol.128, p.42-44</ispartof><rights>2016 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c348t-98fe4cb7323459c5501fef37db4e04c61ae1fd62f4bf1efd72dcacd795ab0a263</citedby><cites>FETCH-LOGICAL-c348t-98fe4cb7323459c5501fef37db4e04c61ae1fd62f4bf1efd72dcacd795ab0a263</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.commatsci.2016.11.007$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>França, C.A.</creatorcontrib><creatorcontrib>Guerra, Y.</creatorcontrib><creatorcontrib>Valadão, D.R.B.</creatorcontrib><creatorcontrib>Holanda, J.</creatorcontrib><creatorcontrib>Padrón-Hernández, E.</creatorcontrib><title>Transmission electron microscopy as a realistic data source for the micromagnetic simulation of polycrystalline nickel nanowires</title><title>Computational materials science</title><description>[Display omitted]
Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested format was used for the generation of the finite elements network in the numerical model using NMAG. The resolved equations generated the coercivity field dependence with the angle of application of the external magnetic field. The same analysis was carried out for the magnetic remanence data and compared with the experimental results. Our results show the significant importance of electron microscopy analysis in the magnetic studies using realistic models. 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Transmission electron microscopy data was used as a starting point for the proposed model in micromagnetic simulation for electrodeposited nickel nanowires. We used the dark field image analysis and proposed the real crystal format for the deposited nanowire and the suggested format was used for the generation of the finite elements network in the numerical model using NMAG. The resolved equations generated the coercivity field dependence with the angle of application of the external magnetic field. The same analysis was carried out for the magnetic remanence data and compared with the experimental results. Our results show the significant importance of electron microscopy analysis in the magnetic studies using realistic models. The problem of the reversion for the magnetic moments in magnetic nanowires is an unresolved question and our proposal is that reversion studies need start in the previous microscopy analyses of the real microstructure of nanowires.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.commatsci.2016.11.007</doi><tpages>3</tpages></addata></record> |
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| source | ScienceDirect Freedom Collection (Elsevier) |
| subjects | Coercivity Computer simulation Format Magnetic nanowires Magnetic remanence Mathematical analysis Mathematical models Micromagnetic simulation Nanowires Nickel Reversion Transmission electron microscopy |
| title | Transmission electron microscopy as a realistic data source for the micromagnetic simulation of polycrystalline nickel nanowires |
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