Quantitative STEM Imaging of Order-Disorder Phenomena in Double Perovskite Thin Films

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr_{2}CrReO_{6}. Experimental and simulated imaging and diffraction are used to identify antiphase domai...

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Veröffentlicht in:	Physical review letters 2016-10, Vol.117 (17), p.176101-176101, Article 176101
Hauptverfasser:	Esser, B D, Hauser, A J, Williams, R E A, Allen, L J, Woodward, P M, Yang, F Y, McComb, D W
Format:	Artikel
Sprache:	eng
Schlagworte:	Beams (radiation) Diffraction Imaging Order disorder Perovskites Scanning transmission electron microscopy Simulation Thin films
Online-Zugang:	Volltext
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