Quantitative STEM Imaging of Order-Disorder Phenomena in Double Perovskite Thin Films

Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr_{2}CrReO_{6}. Experimental and simulated imaging and diffraction are used to identify antiphase domai...

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Veröffentlicht in:	Physical review letters 2016-10, Vol.117 (17), p.176101-176101, Article 176101
Hauptverfasser:	Esser, B D, Hauser, A J, Williams, R E A, Allen, L J, Woodward, P M, Yang, F Y, McComb, D W
Format:	Artikel
Sprache:	eng
Schlagworte:	Beams (radiation) Diffraction Imaging Order disorder Perovskites Scanning transmission electron microscopy Simulation Thin films
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container_title	Physical review letters
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creator	Esser, B D Hauser, A J Williams, R E A Allen, L J Woodward, P M Yang, F Y McComb, D W
description	Using aberration-corrected high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM), we investigate ordering phenomena in epitaxial thin films of the double perovskite Sr_{2}CrReO_{6}. Experimental and simulated imaging and diffraction are used to identify antiphase domains in the films. Image simulation provides insight into the effects of atomic-scale ordering along the beam direction on HAADF-STEM intensity. We show that probe channeling results in ±20% variation in intensity for a given composition, allowing 3D ordering information to be probed using quantitative STEM.
doi_str_mv	10.1103/PhysRevLett.117.176101
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subjects	Beams (radiation) Diffraction Imaging Order disorder Perovskites Scanning transmission electron microscopy Simulation Thin films
title	Quantitative STEM Imaging of Order-Disorder Phenomena in Double Perovskite Thin Films
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