Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron Microscope

Transmission electron microscopy using low-energy electrons would be very useful for atomic resolution imaging of specimens that would be damaged at higher energies. However, the resolution at low voltages is degraded because of geometrical and chromatic aberrations. In the present study, we diminis...

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Veröffentlicht in:	Physical review letters 2016-10, Vol.117 (15), p.153004-153004, Article 153004
Hauptverfasser:	Morishita, Shigeyuki, Mukai, Masaki, Suenaga, Kazu, Sawada, Hidetaka
Format:	Artikel
Sprache:	eng
Schlagworte:	Aberration Atomic force microscopy Electric potential Energy use Graphene Imaging Transmission electron microscopy Voltage
Online-Zugang:	Volltext
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