A whole spectroscopic mapping approach for studying the spatial distribution of pigments in paintings

We propose a non-invasive approach for the identification and mapping of pigments in paintings. The method is based on three highly complementary imaging spectroscopy techniques, visible multispectral imaging, X-Ray fluorescence mapping and Raman mapping, combined with multivariate data analysis of...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2016-09, Vol.122 (9), p.1-10, Article 815
Hauptverfasser:	Mosca, S., Alberti, R., Frizzi, T., Nevin, A., Valentini, G., Comelli, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Characterization and Evaluation of Materials Condensed Matter Physics Confidence intervals Data analysis Devices Imaging Innovation in Art Research and Technology Machines Manufacturing Mapping Materials science Multivariate analysis Nanotechnology Optical and Electronic Materials Physics Physics and Astronomy Pigments Processes Spatial distribution Spectroscopic analysis Surfaces and Interfaces Thin Films X ray fluorescence analysis
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!