Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing
Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited...
Gespeichert in:
Veröffentlicht in: | Quality and reliability engineering international 2016-04, Vol.32 (3), p.1007-1020 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1020 |
---|---|
container_issue | 3 |
container_start_page | 1007 |
container_title | Quality and reliability engineering international |
container_volume | 32 |
creator | Lee Ho, Linda Vivacqua, Carla A. Santos de Pinho, André Luís |
description | Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited resources and system constraints to obtain useful information. It is common that prototypes are composed of several parts, with some parts more difficult to assemble than others. And, usually, there is only one piece available of each part type and a large number of different setups. Under these conditions, designs with randomization restrictions become attractive approaches. Considering this scenario, a new and additional criterion, minimum setup, to construct split‐plot type designs is presented. Designs with the minimum number of setups of the more difficult parts, which are especially useful for screening purposes in physical prototype testing, are discussed. The use of the proposed criterion combined with minimum aberration for selecting a regular design is shown through a real application in testing car prototypes. As a tool to practitioners, catalogs of selected 32‐run minimum setup minimum aberration split‐split‐plot and split‐split‐split‐plot designs are presented. More complete catalogs are available as Supporting information. Copyright © 2015 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/qre.1810 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1877807513</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1800503056</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4450-f55a7435955356cb4fad00649727a21c5d589a8d64502a43a40e6f16490071033</originalsourceid><addsrcrecordid>eNqN0UtLxDAQB_AgCq4P8CMEvHipTpqkSY-y6iqs75X1FmI31Wi26Satut_eLr5QEDwNw_yYYfgjtEVglwCke7NgdokksIR6BPI8IRmVy6gHgslEAhGraC3GR4AO57KH9Kmt7LSd4mvTtDX-7PbvTAi6sb7CoxefOPNsHL6unW2S2vkGj-a1wQcm2vsq4tIHfPEwj7bQDl8E3_hmMR6Z2NjqfgOtlNpFs_lR19HN0eGof5wMzwcn_f1hUjDGISk514JRnnNOeVbcsVJPADKWi1TolBR8wmWu5STrcKoZ1QxMVpIOAAgClK6jnfe9dfCztrutpjYWxjldGd9GRaQQEgQn_6EAHCjwrKPbv-ijb0PVPaKIEIylMgf5vbAIPsZgSlUHO9VhrgioRSyqi0UtYulo8k5frDPzP526vDr86W1szOuX1-FJZYIKrsZnA9UfD9mwPx6oW_oGRsibIg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1774428908</pqid></control><display><type>article</type><title>Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Lee Ho, Linda ; Vivacqua, Carla A. ; Santos de Pinho, André Luís</creator><creatorcontrib>Lee Ho, Linda ; Vivacqua, Carla A. ; Santos de Pinho, André Luís</creatorcontrib><description>Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited resources and system constraints to obtain useful information. It is common that prototypes are composed of several parts, with some parts more difficult to assemble than others. And, usually, there is only one piece available of each part type and a large number of different setups. Under these conditions, designs with randomization restrictions become attractive approaches. Considering this scenario, a new and additional criterion, minimum setup, to construct split‐plot type designs is presented. Designs with the minimum number of setups of the more difficult parts, which are especially useful for screening purposes in physical prototype testing, are discussed. The use of the proposed criterion combined with minimum aberration for selecting a regular design is shown through a real application in testing car prototypes. As a tool to practitioners, catalogs of selected 32‐run minimum setup minimum aberration split‐split‐plot and split‐split‐split‐plot designs are presented. More complete catalogs are available as Supporting information. Copyright © 2015 John Wiley & Sons, Ltd.</description><identifier>ISSN: 0748-8017</identifier><identifier>EISSN: 1099-1638</identifier><identifier>DOI: 10.1002/qre.1810</identifier><identifier>CODEN: QREIE5</identifier><language>eng</language><publisher>Bognor Regis: Blackwell Publishing Ltd</publisher><subject>Aberration ; Criteria ; Design criteria ; Design engineering ; fractional factorial design ; hard-to-change factor ; Prototypes ; Prototyping ; Randomization ; regular design ; restricted randomization ; screening design</subject><ispartof>Quality and reliability engineering international, 2016-04, Vol.32 (3), p.1007-1020</ispartof><rights>Copyright © 2015 John Wiley & Sons, Ltd.</rights><rights>Copyright © 2016 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4450-f55a7435955356cb4fad00649727a21c5d589a8d64502a43a40e6f16490071033</citedby><cites>FETCH-LOGICAL-c4450-f55a7435955356cb4fad00649727a21c5d589a8d64502a43a40e6f16490071033</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fqre.1810$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fqre.1810$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Lee Ho, Linda</creatorcontrib><creatorcontrib>Vivacqua, Carla A.</creatorcontrib><creatorcontrib>Santos de Pinho, André Luís</creatorcontrib><title>Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing</title><title>Quality and reliability engineering international</title><addtitle>Qual. Reliab. Engng. Int</addtitle><description>Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited resources and system constraints to obtain useful information. It is common that prototypes are composed of several parts, with some parts more difficult to assemble than others. And, usually, there is only one piece available of each part type and a large number of different setups. Under these conditions, designs with randomization restrictions become attractive approaches. Considering this scenario, a new and additional criterion, minimum setup, to construct split‐plot type designs is presented. Designs with the minimum number of setups of the more difficult parts, which are especially useful for screening purposes in physical prototype testing, are discussed. The use of the proposed criterion combined with minimum aberration for selecting a regular design is shown through a real application in testing car prototypes. As a tool to practitioners, catalogs of selected 32‐run minimum setup minimum aberration split‐split‐plot and split‐split‐split‐plot designs are presented. More complete catalogs are available as Supporting information. Copyright © 2015 John Wiley & Sons, Ltd.</description><subject>Aberration</subject><subject>Criteria</subject><subject>Design criteria</subject><subject>Design engineering</subject><subject>fractional factorial design</subject><subject>hard-to-change factor</subject><subject>Prototypes</subject><subject>Prototyping</subject><subject>Randomization</subject><subject>regular design</subject><subject>restricted randomization</subject><subject>screening design</subject><issn>0748-8017</issn><issn>1099-1638</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqN0UtLxDAQB_AgCq4P8CMEvHipTpqkSY-y6iqs75X1FmI31Wi26Satut_eLr5QEDwNw_yYYfgjtEVglwCke7NgdokksIR6BPI8IRmVy6gHgslEAhGraC3GR4AO57KH9Kmt7LSd4mvTtDX-7PbvTAi6sb7CoxefOPNsHL6unW2S2vkGj-a1wQcm2vsq4tIHfPEwj7bQDl8E3_hmMR6Z2NjqfgOtlNpFs_lR19HN0eGof5wMzwcn_f1hUjDGISk514JRnnNOeVbcsVJPADKWi1TolBR8wmWu5STrcKoZ1QxMVpIOAAgClK6jnfe9dfCztrutpjYWxjldGd9GRaQQEgQn_6EAHCjwrKPbv-ijb0PVPaKIEIylMgf5vbAIPsZgSlUHO9VhrgioRSyqi0UtYulo8k5frDPzP526vDr86W1szOuX1-FJZYIKrsZnA9UfD9mwPx6oW_oGRsibIg</recordid><startdate>201604</startdate><enddate>201604</enddate><creator>Lee Ho, Linda</creator><creator>Vivacqua, Carla A.</creator><creator>Santos de Pinho, André Luís</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>7SU</scope><scope>C1K</scope><scope>7ST</scope><scope>SOI</scope></search><sort><creationdate>201604</creationdate><title>Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing</title><author>Lee Ho, Linda ; Vivacqua, Carla A. ; Santos de Pinho, André Luís</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4450-f55a7435955356cb4fad00649727a21c5d589a8d64502a43a40e6f16490071033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Aberration</topic><topic>Criteria</topic><topic>Design criteria</topic><topic>Design engineering</topic><topic>fractional factorial design</topic><topic>hard-to-change factor</topic><topic>Prototypes</topic><topic>Prototyping</topic><topic>Randomization</topic><topic>regular design</topic><topic>restricted randomization</topic><topic>screening design</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee Ho, Linda</creatorcontrib><creatorcontrib>Vivacqua, Carla A.</creatorcontrib><creatorcontrib>Santos de Pinho, André Luís</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Environmental Engineering Abstracts</collection><collection>Environmental Sciences and Pollution Management</collection><collection>Environment Abstracts</collection><collection>Environment Abstracts</collection><jtitle>Quality and reliability engineering international</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee Ho, Linda</au><au>Vivacqua, Carla A.</au><au>Santos de Pinho, André Luís</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing</atitle><jtitle>Quality and reliability engineering international</jtitle><addtitle>Qual. Reliab. Engng. Int</addtitle><date>2016-04</date><risdate>2016</risdate><volume>32</volume><issue>3</issue><spage>1007</spage><epage>1020</epage><pages>1007-1020</pages><issn>0748-8017</issn><eissn>1099-1638</eissn><coden>QREIE5</coden><abstract>Although new technologies allow for less effort in prototyping, physical testing still remains an important step in the product development cycle. Well‐planned experiments are useful to guide the decision‐making process. During the design of an experiment, one of the challenges is to balance limited resources and system constraints to obtain useful information. It is common that prototypes are composed of several parts, with some parts more difficult to assemble than others. And, usually, there is only one piece available of each part type and a large number of different setups. Under these conditions, designs with randomization restrictions become attractive approaches. Considering this scenario, a new and additional criterion, minimum setup, to construct split‐plot type designs is presented. Designs with the minimum number of setups of the more difficult parts, which are especially useful for screening purposes in physical prototype testing, are discussed. The use of the proposed criterion combined with minimum aberration for selecting a regular design is shown through a real application in testing car prototypes. As a tool to practitioners, catalogs of selected 32‐run minimum setup minimum aberration split‐split‐plot and split‐split‐split‐plot designs are presented. More complete catalogs are available as Supporting information. Copyright © 2015 John Wiley & Sons, Ltd.</abstract><cop>Bognor Regis</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1002/qre.1810</doi><tpages>14</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0748-8017 |
ispartof | Quality and reliability engineering international, 2016-04, Vol.32 (3), p.1007-1020 |
issn | 0748-8017 1099-1638 |
language | eng |
recordid | cdi_proquest_miscellaneous_1877807513 |
source | Wiley Online Library Journals Frontfile Complete |
subjects | Aberration Criteria Design criteria Design engineering fractional factorial design hard-to-change factor Prototypes Prototyping Randomization regular design restricted randomization screening design |
title | Minimum Setup Minimum Aberration Two-level Split-plot Type Designs for Physical Prototype Testing |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T00%3A46%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Minimum%20Setup%20Minimum%20Aberration%20Two-level%20Split-plot%20Type%20Designs%20for%20Physical%20Prototype%20Testing&rft.jtitle=Quality%20and%20reliability%20engineering%20international&rft.au=Lee%20Ho,%20Linda&rft.date=2016-04&rft.volume=32&rft.issue=3&rft.spage=1007&rft.epage=1020&rft.pages=1007-1020&rft.issn=0748-8017&rft.eissn=1099-1638&rft.coden=QREIE5&rft_id=info:doi/10.1002/qre.1810&rft_dat=%3Cproquest_cross%3E1800503056%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1774428908&rft_id=info:pmid/&rfr_iscdi=true |