A pnCCD-based, fast direct single electron imaging camera for TEM and STEM

We report on a new camera that is based on a pnCCD sensor for applications in scanning transmission electron microscopy. Emerging new microscopy techniques demand improved detectors with regards to readout rate, sensitivity and radiation hardness, especially in scanning mode. The pnCCD is a 2D imagi...

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Veröffentlicht in:	Journal of instrumentation 2016-04, Vol.11 (4), p.P04006-P04006
Hauptverfasser:	Ryll, H., Simson, M., Hartmann, R., Holl, P., Huth, M., Ihle, S., Kondo, Y., Kotula, P., Liebel, A., Müller-Caspary, K., Rosenauer, A., Sagawa, R., Schmidt, J., Soltau, H., Strüder, L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cameras Detectors Imaging Pixels Scanning transmission electron microscopy Semiconductors Single electrons
Online-Zugang:	Volltext
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