Transmission Kikuchi diffraction in a scanning electron microscope: A review

Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detect...

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Veröffentlicht in:Materials science & engineering. R, Reports : a review journal Reports : a review journal, 2016-12, Vol.110, p.1-12
Hauptverfasser: Sneddon, Glenn C., Trimby, Patrick W., Cairney, Julie M.
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description Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses and their complementarity with TKD. Finally, potential applications of the technique and possible future developments are discussed.
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subjects Corrosion
Deformation
Diffraction
Electron back scatter diffraction
Electron backscatter diffraction
Highly deformed materials
Imaging
Nanocrystalline
Nanocrystals
Nanomaterials
Nanostructure
Optimization
Parameters
Scanning electron microscopy
Studies
t-EBSD
TKD
title Transmission Kikuchi diffraction in a scanning electron microscope: A review
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