Transmission Kikuchi diffraction in a scanning electron microscope: A review
Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detect...
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Veröffentlicht in: | Materials science & engineering. R, Reports : a review journal Reports : a review journal, 2016-12, Vol.110, p.1-12 |
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creator | Sneddon, Glenn C. Trimby, Patrick W. Cairney, Julie M. |
description | Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses and their complementarity with TKD. Finally, potential applications of the technique and possible future developments are discussed. |
doi_str_mv | 10.1016/j.mser.2016.10.001 |
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R, Reports : a review journal</title><description>Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses and their complementarity with TKD. Finally, potential applications of the technique and possible future developments are discussed.</description><subject>Corrosion</subject><subject>Deformation</subject><subject>Diffraction</subject><subject>Electron back scatter diffraction</subject><subject>Electron backscatter diffraction</subject><subject>Highly deformed materials</subject><subject>Imaging</subject><subject>Nanocrystalline</subject><subject>Nanocrystals</subject><subject>Nanomaterials</subject><subject>Nanostructure</subject><subject>Optimization</subject><subject>Parameters</subject><subject>Scanning electron microscopy</subject><subject>Studies</subject><subject>t-EBSD</subject><subject>TKD</subject><issn>0927-796X</issn><issn>1879-212X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp9kD9PwzAQxS0EEqXwBZgisbCknJ04bhBLVfFPVGIpUjfLtc_gkjjFbkB8exyViYHpTk_vne79CDmnMKFAq6vNpI0YJiztSZgA0AMyolNR54yy1SEZQc1ELupqdUxOYtwAACs5H5HFMigfWxej63z25N57_eYy46wNSu8GzflMZVEr751_zbBBvQtJbp0OXdTdFq-zWRbw0-HXKTmyqol49jvH5OXudjl_yBfP94_z2SLXRUV3-bq0XBmjSi6AUajWtDSIRhRG09qatRUU7NTSdQ0svc1BVVoYwSmghQLKYkwu93e3ofvoMe5kKqCxaZTHro-STquSs2nNB-vFH-um64NP30lalwXjvKqK5GJ719ApBrRyG1yrwrekIAfAciMHwHIAPGgJcArd7EOYqqb6QUbt0Gs0LiRI0nTuv_gPq-GEAg</recordid><startdate>201612</startdate><enddate>201612</enddate><creator>Sneddon, Glenn C.</creator><creator>Trimby, Patrick W.</creator><creator>Cairney, Julie M.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>201612</creationdate><title>Transmission Kikuchi diffraction in a scanning electron microscope: A review</title><author>Sneddon, Glenn C. ; Trimby, Patrick W. ; Cairney, Julie M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-b4f5adda45702106b14deed73dc19fdbf710f8f1b90292750a6c7d7510ef03043</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Corrosion</topic><topic>Deformation</topic><topic>Diffraction</topic><topic>Electron back scatter diffraction</topic><topic>Electron backscatter diffraction</topic><topic>Highly deformed materials</topic><topic>Imaging</topic><topic>Nanocrystalline</topic><topic>Nanocrystals</topic><topic>Nanomaterials</topic><topic>Nanostructure</topic><topic>Optimization</topic><topic>Parameters</topic><topic>Scanning electron microscopy</topic><topic>Studies</topic><topic>t-EBSD</topic><topic>TKD</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sneddon, Glenn C.</creatorcontrib><creatorcontrib>Trimby, Patrick W.</creatorcontrib><creatorcontrib>Cairney, Julie M.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Materials science & engineering. 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subjects | Corrosion Deformation Diffraction Electron back scatter diffraction Electron backscatter diffraction Highly deformed materials Imaging Nanocrystalline Nanocrystals Nanomaterials Nanostructure Optimization Parameters Scanning electron microscopy Studies t-EBSD TKD |
title | Transmission Kikuchi diffraction in a scanning electron microscope: A review |
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