The phenomenon of polarization suppression of X-ray Umweg multiple waves in crystals
The phenomenon of the polarization suppression of X‐ray Umweg multiple waves in Renninger scans [Renninger (1937). Z. Kristallogr. 97, 107–121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participa...
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| Veröffentlicht in: | Acta crystallographica. Section A, Foundations of crystallography Foundations of crystallography, 2000-07, Vol.56 (4), p.394-400 |
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| container_title | Acta crystallographica. Section A, Foundations of crystallography |
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| creator | Stetsko, Yuri P. Juretschke, Hellmut J. Huang, Yi-Shan Chao, Chun-Hsiung Chen, Chun-Kuang Chang, Shih-Lin |
| description | The phenomenon of the polarization suppression of X‐ray Umweg multiple waves in Renninger scans [Renninger (1937). Z. Kristallogr. 97, 107–121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple‐wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple‐wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple‐wave intensity distribution reveals high sensitivity to X‐ray reflection phase. This multiple‐diffraction technique under partial polarization suppression provides an alternative way of enhancing the visibility of multiple‐wave interference in crystals for direct phase determination. |
| doi_str_mv | 10.1107/S010876730000667X |
| format | Article |
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Z. Kristallogr. 97, 107–121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple‐wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple‐wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple‐wave intensity distribution reveals high sensitivity to X‐ray reflection phase. 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Section A, Foundations of crystallography</title><addtitle>Acta Cryst. A</addtitle><description>The phenomenon of the polarization suppression of X‐ray Umweg multiple waves in Renninger scans [Renninger (1937). Z. Kristallogr. 97, 107–121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple‐wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple‐wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple‐wave intensity distribution reveals high sensitivity to X‐ray reflection phase. 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Kristallogr. 97, 107–121] of crystals, showing intensity decrease due to properly chosen wavelength and polarization of incident radiation, is observed. That is, one of the participating wave components in the multiple‐wave interference is reduced considerably so that the intensity of multiple diffraction is decreased. The condition for total suppression of the multiple‐wave interaction in crystals is derived theoretically from the Born approximation and verified with exact dynamical calculation and experiments. Partial suppression of the strong Umweg interfered component is demonstrated using elliptically or linearly polarized synchrotron radiation. The suppressed multiple‐wave intensity distribution reveals high sensitivity to X‐ray reflection phase. This multiple‐diffraction technique under partial polarization suppression provides an alternative way of enhancing the visibility of multiple‐wave interference in crystals for direct phase determination.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>Munksgaard International Publishers</pub><pmid>10916649</pmid><doi>10.1107/S010876730000667X</doi><tpages>7</tpages></addata></record> |
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| ispartof | Acta crystallographica. Section A, Foundations of crystallography, 2000-07, Vol.56 (4), p.394-400 |
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| source | Crystallography Journals Online; Access via Wiley Online Library |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics polarization Single-crystal and powder diffraction Structure of solids and liquids crystallography Umweg X-ray diffraction and scattering |
| title | The phenomenon of polarization suppression of X-ray Umweg multiple waves in crystals |
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