Simulating the oxygen K-edge spectrum from grain boundaries in ceramic oxides using the multiple scattering methodology

In this paper we demonstrate the use of the multiple scattering methodology to interpret oxygen K-edge spectra from both the bulk and grain boundaries in a variety of ceramic oxides. The experimental electron energy loss spectra (EELS) used in this study, were obtained from a dedicated scanning tran...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Micron (Oxford, England : 1993) England : 1993), 2000-08, Vol.31 (4), p.381-399
Hauptverfasser:	Moltaji, H.O., Buban, J.P., Zaborac, J.A., Browning, N.D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Ceramic oxides Experimental electron energy loss spectra Grain boundaries Multiple scattering Scanning transmission electron microscope
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!