1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100)
We present a realistic simulation of the reaction of fluorine with Si(100). Isothermal molecular dynamics simulations, using an analytic many-body potential fit to first-principles quantum mechanical adsorbate-surface and experimental gas phase data, show the initial buildup of the fluorosilyl layer...
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Veröffentlicht in: | Physical review letters 1992-07, Vol.69 (1), p.200-203 |
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description | We present a realistic simulation of the reaction of fluorine with Si(100). Isothermal molecular dynamics simulations, using an analytic many-body potential fit to first-principles quantum mechanical adsorbate-surface and experimental gas phase data, show the initial buildup of the fluorosilyl layer necessary for etching. Several aspects of the microscopic mechanism are revealed. These simulations represent the first time that first-principles-derived surface reaction dynamics have been carried out; we show that this approach is critical to obtaining physically correct results. |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1859289441</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1859289441</sourcerecordid><originalsourceid>FETCH-LOGICAL-c330t-9f58b3da68241ba284e89475326f758271547d9c12a919fc8c2d24972bf2b1ae3</originalsourceid><addsrcrecordid>eNqN0EFr2zAYBmBRNtqs7R_YYfiwQ8dQpk-SLeloHKdz8ZJgJ4OdjKzIzCOxW8vZ6L-fQkLpsafv8rwvHy9CH4FMAQj7tvr97Ar7N7fjOI3UlBJygSZAhMICgL9DE0IYYEWIuEIfnPtDCAEayUt0BYTwiFI-QSWUa7wqskWSrfK0xLO0yH6ms2D2axH_yJIyWM6DOCg3xTxOUlykcbLOlosAB_N8s_SxNEjXyfdscX-EZXbnm7_coPeN3jl7e77XaDM_Kpwv77MkzrFhjIxYNaGs2VZHknKoNZXcSsVFyGjUiFBSASEXW2WAagWqMdLQLeVK0LqhNWjLrtHdqfdx6J8O1o3VvnXG7na6s_3BVSBDRX0lB0_piZqhd26wTfU4tHs9PFdAquOY1asxq0hVfkwf-nTuP9R7u30VOa3nwecz0M7oXTPozrTuxYUskqFQnn09sX-27htnWtsZ-6JiUIo-JJT6WhIeX5Vv10k76rHtu6Q_dCP7DyQQlts</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1859289441</pqid></control><display><type>article</type><title>1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100)</title><source>American Physical Society Journals</source><creator>WEAKLIEM, PC ; WU, CJ ; CARTER, EA</creator><creatorcontrib>WEAKLIEM, PC ; WU, CJ ; CARTER, EA</creatorcontrib><description>We present a realistic simulation of the reaction of fluorine with Si(100). Isothermal molecular dynamics simulations, using an analytic many-body potential fit to first-principles quantum mechanical adsorbate-surface and experimental gas phase data, show the initial buildup of the fluorosilyl layer necessary for etching. Several aspects of the microscopic mechanism are revealed. These simulations represent the first time that first-principles-derived surface reaction dynamics have been carried out; we show that this approach is critical to obtaining physically correct results.</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevLett.69.200</identifier><identifier>PMID: 10046224</identifier><identifier>CODEN: PRLTAO</identifier><language>eng</language><publisher>COLLEGE PK: AMERICAN PHYSICAL SOC</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Mechanical and acoustical properties; adhesion ; Physical Sciences ; Physics ; Physics, Multidisciplinary ; Science & Technology ; Solid surfaces and solid-solid interfaces ; Solid-fluid interfaces ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Physical review letters, 1992-07, Vol.69 (1), p.200-203</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>true</woscitedreferencessubscribed><woscitedreferencescount>98</woscitedreferencescount><woscitedreferencesoriginalsourcerecordid>wosA1992JC22100051</woscitedreferencesoriginalsourcerecordid><citedby>FETCH-LOGICAL-c330t-9f58b3da68241ba284e89475326f758271547d9c12a919fc8c2d24972bf2b1ae3</citedby><cites>FETCH-LOGICAL-c330t-9f58b3da68241ba284e89475326f758271547d9c12a919fc8c2d24972bf2b1ae3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2876,2877,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5368579$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/10046224$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>WEAKLIEM, PC</creatorcontrib><creatorcontrib>WU, CJ</creatorcontrib><creatorcontrib>CARTER, EA</creatorcontrib><title>1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100)</title><title>Physical review letters</title><addtitle>PHYS REV LETT</addtitle><addtitle>Phys Rev Lett</addtitle><description>We present a realistic simulation of the reaction of fluorine with Si(100). Isothermal molecular dynamics simulations, using an analytic many-body potential fit to first-principles quantum mechanical adsorbate-surface and experimental gas phase data, show the initial buildup of the fluorosilyl layer necessary for etching. Several aspects of the microscopic mechanism are revealed. These simulations represent the first time that first-principles-derived surface reaction dynamics have been carried out; we show that this approach is critical to obtaining physically correct results.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Mechanical and acoustical properties; adhesion</subject><subject>Physical Sciences</subject><subject>Physics</subject><subject>Physics, Multidisciplinary</subject><subject>Science & Technology</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Solid-fluid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><sourceid>EZCTM</sourceid><recordid>eNqN0EFr2zAYBmBRNtqs7R_YYfiwQ8dQpk-SLeloHKdz8ZJgJ4OdjKzIzCOxW8vZ6L-fQkLpsafv8rwvHy9CH4FMAQj7tvr97Ar7N7fjOI3UlBJygSZAhMICgL9DE0IYYEWIuEIfnPtDCAEayUt0BYTwiFI-QSWUa7wqskWSrfK0xLO0yH6ms2D2axH_yJIyWM6DOCg3xTxOUlykcbLOlosAB_N8s_SxNEjXyfdscX-EZXbnm7_coPeN3jl7e77XaDM_Kpwv77MkzrFhjIxYNaGs2VZHknKoNZXcSsVFyGjUiFBSASEXW2WAagWqMdLQLeVK0LqhNWjLrtHdqfdx6J8O1o3VvnXG7na6s_3BVSBDRX0lB0_piZqhd26wTfU4tHs9PFdAquOY1asxq0hVfkwf-nTuP9R7u30VOa3nwecz0M7oXTPozrTuxYUskqFQnn09sX-27htnWtsZ-6JiUIo-JJT6WhIeX5Vv10k76rHtu6Q_dCP7DyQQlts</recordid><startdate>19920706</startdate><enddate>19920706</enddate><creator>WEAKLIEM, PC</creator><creator>WU, CJ</creator><creator>CARTER, EA</creator><general>AMERICAN PHYSICAL SOC</general><general>American Physical Society</general><scope>BLEPL</scope><scope>DTL</scope><scope>EZCTM</scope><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>19920706</creationdate><title>1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100)</title><author>WEAKLIEM, PC ; WU, CJ ; CARTER, EA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c330t-9f58b3da68241ba284e89475326f758271547d9c12a919fc8c2d24972bf2b1ae3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Mechanical and acoustical properties; adhesion</topic><topic>Physical Sciences</topic><topic>Physics</topic><topic>Physics, Multidisciplinary</topic><topic>Science & Technology</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Solid-fluid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>WEAKLIEM, PC</creatorcontrib><creatorcontrib>WU, CJ</creatorcontrib><creatorcontrib>CARTER, EA</creatorcontrib><collection>Web of Science Core Collection</collection><collection>Science Citation Index Expanded</collection><collection>Web of Science - Science Citation Index Expanded - 1992</collection><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>WEAKLIEM, PC</au><au>WU, CJ</au><au>CARTER, EA</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100)</atitle><jtitle>Physical review letters</jtitle><stitle>PHYS REV LETT</stitle><addtitle>Phys Rev Lett</addtitle><date>1992-07-06</date><risdate>1992</risdate><volume>69</volume><issue>1</issue><spage>200</spage><epage>203</epage><pages>200-203</pages><issn>0031-9007</issn><eissn>1079-7114</eissn><coden>PRLTAO</coden><abstract>We present a realistic simulation of the reaction of fluorine with Si(100). Isothermal molecular dynamics simulations, using an analytic many-body potential fit to first-principles quantum mechanical adsorbate-surface and experimental gas phase data, show the initial buildup of the fluorosilyl layer necessary for etching. Several aspects of the microscopic mechanism are revealed. These simulations represent the first time that first-principles-derived surface reaction dynamics have been carried out; we show that this approach is critical to obtaining physically correct results.</abstract><cop>COLLEGE PK</cop><pub>AMERICAN PHYSICAL SOC</pub><pmid>10046224</pmid><doi>10.1103/PhysRevLett.69.200</doi><tpages>4</tpages></addata></record> |
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subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Mechanical and acoustical properties adhesion Physical Sciences Physics Physics, Multidisciplinary Science & Technology Solid surfaces and solid-solid interfaces Solid-fluid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
title | 1ST-PRINCIPLES-DERIVED DYNAMICS OF A SURFACE-REACTION - FLUORINE ETCHING OF SI(100) |
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