Detection of magnetic resonance on photoluminescence from a Si/Si1-xGex strained-layer superlattice

Detection of magnetic resonance on photoluminescence from a Si/Si1-xGex strained-layer superlattice

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Veröffentlicht in:Physical review letters 1990-09, Vol.65 (10), p.1247-1250
Hauptverfasser: GLASER, E, TROMBETTA, J. M, KENNEDY, T. A, PROKES, S. M, GLEMBOCKI, O. J, WANG, K. L, CHERN, C. H
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Sprache:eng
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Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
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container_end_page 1250
container_issue 10
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container_title Physical review letters
container_volume 65
creator GLASER, E
TROMBETTA, J. M
KENNEDY, T. A
PROKES, S. M
GLEMBOCKI, O. J
WANG, K. L
CHERN, C. H
description
doi_str_mv 10.1103/PhysRevLett.65.1247
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1079-7114
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source American Physical Society Journals
subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
title Detection of magnetic resonance on photoluminescence from a Si/Si1-xGex strained-layer superlattice
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