Gate-Variable Mid-Infrared Optical Transitions in a (Bi1–x Sb x )2Te3 Topological Insulator

We report mid-infrared spectroscopy measurements of ultrathin, electrostatically gated (Bi1–x Sb x )2Te3 topological insulator films in which we observe several percent modulation of transmittance and reflectance as gating shifts the Fermi level. Infrared transmittance measurements of gated films we...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Nano letters 2017-01, Vol.17 (1), p.255-260
Hauptverfasser: Whitney, William S, Brar, Victor W, Ou, Yunbo, Shao, Yinming, Davoyan, Artur R, Basov, D. N, He, Ke, Xue, Qi-Kun, Atwater, Harry A
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!