Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications
This paper describes the use of spectroscopic ellipsometry to investigate the adsorption process of model polyelectrolytes (PDDAC and PSS) to thin‐films of PDMS. A description of the information collected by ellipsometry as well as complementary information obtained by atomic force microscopy and co...
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| Veröffentlicht in: | Electrophoresis 2016-10, Vol.37 (19), p.2509-2516 |
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| container_title | Electrophoresis |
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| creator | Benavidez, Tomás E. Garcia, Carlos D. |
| description | This paper describes the use of spectroscopic ellipsometry to investigate the adsorption process of model polyelectrolytes (PDDAC and PSS) to thin‐films of PDMS. A description of the information collected by ellipsometry as well as complementary information obtained by atomic force microscopy and contact angle measurements is discussed. Upon identification of the driving forces and optimum experimental conditions required for the adsorption, multilayer constructs were fabricated (ranging from 1 to 20 nm in thickness) and used to evaluate their effect on the separation of phenolic compounds by capillary electrophoresis. According to the presented results, polyelectrolyte layers of approximately 10 nm thick provided the best conditions for the separation of the selected phenolic compounds. |
| doi_str_mv | 10.1002/elps.201600143 |
| format | Article |
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According to the presented results, polyelectrolyte layers of approximately 10 nm thick provided the best conditions for the separation of the selected phenolic compounds.</description><identifier>ISSN: 0173-0835</identifier><identifier>EISSN: 1522-2683</identifier><identifier>DOI: 10.1002/elps.201600143</identifier><identifier>PMID: 27240815</identifier><language>eng</language><publisher>Germany: Blackwell Publishing Ltd</publisher><subject>Adsorption ; Capillary electrophoresis ; Dimethylpolysiloxanes - chemistry ; Electrophoresis ; Electrophoresis, Capillary - methods ; Ellipsometry ; Mathematical models ; Nylons - chemistry ; PDMS ; Phenolic compounds ; Phenols ; Polyelectrolytes ; Separation ; Silicone resins ; Spectroscopy ; Spectrum Analysis - methods ; Surface Properties</subject><ispartof>Electrophoresis, 2016-10, Vol.37 (19), p.2509-2516</ispartof><rights>2016 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2016 WILEY-VCH Verlag GmbH & Co. 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According to the presented results, polyelectrolyte layers of approximately 10 nm thick provided the best conditions for the separation of the selected phenolic compounds.</description><subject>Adsorption</subject><subject>Capillary electrophoresis</subject><subject>Dimethylpolysiloxanes - chemistry</subject><subject>Electrophoresis</subject><subject>Electrophoresis, Capillary - methods</subject><subject>Ellipsometry</subject><subject>Mathematical models</subject><subject>Nylons - chemistry</subject><subject>PDMS</subject><subject>Phenolic compounds</subject><subject>Phenols</subject><subject>Polyelectrolytes</subject><subject>Separation</subject><subject>Silicone resins</subject><subject>Spectroscopy</subject><subject>Spectrum Analysis - methods</subject><subject>Surface Properties</subject><issn>0173-0835</issn><issn>1522-2683</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqNkc1vEzEUxC0EomnhyhH5yGWDnz_WzhGFpEWkEClU5WZ5vd5i2F0beyNa_nocpeQKPtjS829GejMIvQIyB0LoW9fHPKcEakKAsydoBoLSitaKPUUzApJVRDFxhs5z_k4I4QvOn6MzKiknCsQM3e2is1MK2YboLXZ972MOg5vSAzYZG2zDEHs3uHEyZTSF0JcL228mGTu55H-7gpjJj3cZhxFv31_vcBcSXq6wibH3tvyFMb9AzzrTZ_fy8b1AN-vVl-VVtfl8-WH5blNZroBVANy0BlrrSNc0jeBWKdsyaaxiIKSihNma29qUQ7tONIwwYLVsqXEAzLAL9OboG1P4uXd50oPPtqxlRhf2WYPiQi7K_vAfKK3rBZeLAzo_orYklZPrdEx-KIFoIPrQgz70oE89FMHrR-99M7j2hP8NvgD8CPzyvXv4h51ebbY7odTBtzrKfJ7c_Ulm0g9dSyaFvv10qeHq-uNXuV3rNfsDvWSj5w</recordid><startdate>201610</startdate><enddate>201610</enddate><creator>Benavidez, Tomás E.</creator><creator>Garcia, Carlos D.</creator><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201610</creationdate><title>Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications</title><author>Benavidez, Tomás E. ; Garcia, Carlos D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4813-114ada1dce0fbbb54c88cd37ac831578203c64c6aaaa2ff5b3031367d2ae113a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Adsorption</topic><topic>Capillary electrophoresis</topic><topic>Dimethylpolysiloxanes - chemistry</topic><topic>Electrophoresis</topic><topic>Electrophoresis, Capillary - methods</topic><topic>Ellipsometry</topic><topic>Mathematical models</topic><topic>Nylons - chemistry</topic><topic>PDMS</topic><topic>Phenolic compounds</topic><topic>Phenols</topic><topic>Polyelectrolytes</topic><topic>Separation</topic><topic>Silicone resins</topic><topic>Spectroscopy</topic><topic>Spectrum Analysis - methods</topic><topic>Surface Properties</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Benavidez, Tomás E.</creatorcontrib><creatorcontrib>Garcia, Carlos D.</creatorcontrib><collection>Istex</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrophoresis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Benavidez, Tomás E.</au><au>Garcia, Carlos D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications</atitle><jtitle>Electrophoresis</jtitle><addtitle>ELECTROPHORESIS</addtitle><date>2016-10</date><risdate>2016</risdate><volume>37</volume><issue>19</issue><spage>2509</spage><epage>2516</epage><pages>2509-2516</pages><issn>0173-0835</issn><eissn>1522-2683</eissn><abstract>This paper describes the use of spectroscopic ellipsometry to investigate the adsorption process of model polyelectrolytes (PDDAC and PSS) to thin‐films of PDMS. 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| ispartof | Electrophoresis, 2016-10, Vol.37 (19), p.2509-2516 |
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| source | MEDLINE; Wiley Online Library |
| subjects | Adsorption Capillary electrophoresis Dimethylpolysiloxanes - chemistry Electrophoresis Electrophoresis, Capillary - methods Ellipsometry Mathematical models Nylons - chemistry PDMS Phenolic compounds Phenols Polyelectrolytes Separation Silicone resins Spectroscopy Spectrum Analysis - methods Surface Properties |
| title | Spectroscopic ellipsometry as a complementary tool to characterize coatings on PDMS for CE applications |
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